Class information for:
Level 1: LONGITUDINAL MICROSTRUCTURE//VERY NARROW COPPER WIRE//8 INCH WAFER

Basic class information

Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes

The table includes all classes above and classes immediately below the current class.



Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
396 3       LEAD FREE SOLDER//SOLDER//ELECTROMIGRATION 32184
2634 2             FIZIKA NIZKIKH TEMPERATUR//JOURNAL OF PHYSICS F-METAL PHYSICS//ULTRAHIGH PURITY ALUMINUM 3742
20311 1                   LONGITUDINAL MICROSTRUCTURE//VERY NARROW COPPER WIRE//8 INCH WAFER 488

Terms with highest relevance score



rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 LONGITUDINAL MICROSTRUCTURE authKW 206663 1% 80% 4
2 VERY NARROW COPPER WIRE authKW 193748 1% 100% 3
3 8 INCH WAFER authKW 129165 0% 100% 2
4 ADDITIVE FREE PLATING authKW 129165 0% 100% 2
5 BACK ETCH METHOD authKW 129165 0% 100% 2
6 CALLENDAR VAN DUSEN authKW 129165 0% 100% 2
7 ELECTRICAL RESISTIVITY OF METALLIC THIN FILMS authKW 129165 0% 100% 2
8 GDSII LEVEL LAYOUTS authKW 129165 0% 100% 2
9 HITACHI KYOWA ENGN LTD address 129165 0% 100% 2
10 ROUGHNESS ACCESSIBILITY authKW 129165 0% 100% 2

Web of Science journal categories



chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Physics, Condensed Matter 2612 39% 0% 189
2 Physics, Applied 2268 44% 0% 216
3 Materials Science, Coatings & Films 670 9% 0% 43
4 Nanoscience & Nanotechnology 468 11% 0% 56
5 Materials Science, Multidisciplinary 273 19% 0% 95
6 Physics, Multidisciplinary 177 10% 0% 50
7 Engineering, Electrical & Electronic 156 13% 0% 63
8 Microscopy 53 1% 0% 6
9 Metallurgy & Metallurgical Engineering 37 4% 0% 19
10 Optics 25 5% 0% 22

Address terms



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 HITACHI KYOWA ENGN LTD 129165 0% 100% 2
2 SUR ES INTER ES MAT SOLIDES 129165 0% 100% 2
3 CIENCIAS CONSTRUCC 114809 1% 44% 4
4 AMSOTROPY TEXTURE MAT 64583 0% 100% 1
5 CEFEX 64583 0% 100% 1
6 CIENCIAS ELE ON 64583 0% 100% 1
7 COL MIGUEL HUEYOTLIPAN 64583 0% 100% 1
8 DRFMC NM SP2M 64583 0% 100% 1
9 ENGN IL 3055 64583 0% 100% 1
10 FCCYOT 64583 0% 100% 1

Journals



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 MICROELECTRONIC ENGINEERING 2225 4% 0% 19
2 SURFACE REVIEW AND LETTERS 1504 2% 0% 8
3 PHYSICAL REVIEW B 1499 13% 0% 64
4 JOURNAL OF LOW TEMPERATURE PHYSICS 1250 2% 0% 12
5 MATERIALS SCIENCE-POLAND 1153 1% 0% 5
6 THIN SOLID FILMS 1067 5% 0% 25
7 JOURNAL OF APPLIED PHYSICS 1060 9% 0% 43
8 PHYSICAL REVIEW APPLIED 690 1% 0% 3
9 ECS ELECTROCHEMISTRY LETTERS 676 0% 1% 2
10 INTERNATIONAL JOURNAL OF CLOTHING SCIENCE AND TECHNOLOGY 561 0% 0% 2

Author Key Words



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 LONGITUDINAL MICROSTRUCTURE 206663 1% 80% 4 Search LONGITUDINAL+MICROSTRUCTURE Search LONGITUDINAL+MICROSTRUCTURE
2 VERY NARROW COPPER WIRE 193748 1% 100% 3 Search VERY+NARROW+COPPER+WIRE Search VERY+NARROW+COPPER+WIRE
3 8 INCH WAFER 129165 0% 100% 2 Search 8+INCH+WAFER Search 8+INCH+WAFER
4 ADDITIVE FREE PLATING 129165 0% 100% 2 Search ADDITIVE+FREE+PLATING Search ADDITIVE+FREE+PLATING
5 BACK ETCH METHOD 129165 0% 100% 2 Search BACK+ETCH+METHOD Search BACK+ETCH+METHOD
6 CALLENDAR VAN DUSEN 129165 0% 100% 2 Search CALLENDAR+VAN+DUSEN Search CALLENDAR+VAN+DUSEN
7 ELECTRICAL RESISTIVITY OF METALLIC THIN FILMS 129165 0% 100% 2 Search ELECTRICAL+RESISTIVITY+OF+METALLIC+THIN+FILMS Search ELECTRICAL+RESISTIVITY+OF+METALLIC+THIN+FILMS
8 GDSII LEVEL LAYOUTS 129165 0% 100% 2 Search GDSII+LEVEL+LAYOUTS Search GDSII+LEVEL+LAYOUTS
9 ROUGHNESS ACCESSIBILITY 129165 0% 100% 2 Search ROUGHNESS+ACCESSIBILITY Search ROUGHNESS+ACCESSIBILITY
10 ULTRA HIGH PURITY PLATING MATERIAL 129165 0% 100% 2 Search ULTRA+HIGH+PURITY+PLATING+MATERIAL Search ULTRA+HIGH+PURITY+PLATING+MATERIAL

Core articles

The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1



rank cluster_id2 link
1 16788 DIELECTRIC CONSTANTS FROM DC TO MICROWAVE FREQUENCIES//IN SITU RESISTIVITY//AG33SB31S36 FILMS
2 33150 AU NI50FE50//BIASED DC PLASMA SPUTTERING//HCL DOPED POLYANILINE
3 23923 DIRECT FORCE//ATOMIC MIGRATIONS//METALS AND DILUTE ALLOYS
4 18983 SELF FORMING BARRIER//CUMG ALLOY//CUTI ALLOY FILM
5 4876 COPPER ELECTRODEPOSITION//SELF ANNEALING//COPPER ELECTROPLATING
6 10223 QUANTUM WELL STATES//ELECTRONIC GROWTH//SN GE111
7 36826 THREE DIMENSIONAL IRREGULARITY//INVERSE WAVEGUIDE SCATTERING PROBLEM//STATISTICAL IRREGULARITIES
8 14290 NUCL PROBLEMS//NANOINTERCONNECT//MULTILAYER GRAPHENE NANORIBBON MLGNR
9 26132 THIN FILM THERMOCOUPLES//SENSORS SUR E TECHNOL PARTNERSHIP//SMART MAT MEMS
10 32314 MEMBRANE LASER//GAINASP INP//DISTRIBUTED REFLECTOR LASER

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