Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 396 | 3 | LEAD FREE SOLDER//SOLDER//ELECTROMIGRATION | 32184 |
| 2634 | 2 | FIZIKA NIZKIKH TEMPERATUR//JOURNAL OF PHYSICS F-METAL PHYSICS//ULTRAHIGH PURITY ALUMINUM | 3742 |
| 16788 | 1 | DIELECTRIC CONSTANTS FROM DC TO MICROWAVE FREQUENCIES//IN SITU RESISTIVITY//AG33SB31S36 FILMS | 660 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | DIELECTRIC CONSTANTS FROM DC TO MICROWAVE FREQUENCIES | authKW | 95503 | 0% | 100% | 2 |
| 2 | IN SITU RESISTIVITY | authKW | 71624 | 0% | 50% | 3 |
| 3 | AG33SB31S36 FILMS | authKW | 47751 | 0% | 100% | 1 |
| 4 | ANCHORING LIQUID CRYSTAL | authKW | 47751 | 0% | 100% | 1 |
| 5 | APPARENT SIZE EFFECTS | authKW | 47751 | 0% | 100% | 1 |
| 6 | AU SI111 SYSTEM | authKW | 47751 | 0% | 100% | 1 |
| 7 | BACK END OF LINE METALLIZATION | authKW | 47751 | 0% | 100% | 1 |
| 8 | BEREICH SONDERFOR 126 | address | 47751 | 0% | 100% | 1 |
| 9 | BISMUTH TELLURIUM SELENIUM SEMICONDUCTOR POLYCRYSTALLINE THIN FILM | authKW | 47751 | 0% | 100% | 1 |
| 10 | BULK POLYCRYSTALLINE GOLD | authKW | 47751 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 3724 | 40% | 0% | 262 |
| 2 | Materials Science, Coatings & Films | 3562 | 17% | 0% | 112 |
| 3 | Materials Science, Multidisciplinary | 3020 | 48% | 0% | 316 |
| 4 | Physics, Applied | 2973 | 44% | 0% | 288 |
| 5 | Physics, Multidisciplinary | 308 | 11% | 0% | 75 |
| 6 | Metallurgy & Metallurgical Engineering | 146 | 6% | 0% | 39 |
| 7 | Crystallography | 24 | 2% | 0% | 15 |
| 8 | Optics | 10 | 3% | 0% | 21 |
| 9 | Chemistry, Physical | 5 | 5% | 0% | 36 |
| 10 | Engineering, Electrical & Electronic | 5 | 5% | 0% | 30 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | BEREICH SONDERFOR 126 | 47751 | 0% | 100% | 1 |
| 2 | CHRONOMETRIE PIEZOELECT | 47751 | 0% | 100% | 1 |
| 3 | HENRYK NIEWODNICHANSKI NUCL PHYS | 47751 | 0% | 100% | 1 |
| 4 | MINIST PHOTOELECT TECHNOL SYST | 47751 | 0% | 100% | 1 |
| 5 | PHYS ABT FESTKORPERPHYS | 47751 | 0% | 100% | 1 |
| 6 | PHYS MECAN MATTELEPORT 2 SP2MI | 47751 | 0% | 100% | 1 |
| 7 | PHYS VIDE COMPOSANTS | 47751 | 0% | 100% | 1 |
| 8 | PHYS VIDE COMPOSANTS ELE | 47751 | 0% | 100% | 1 |
| 9 | SOLID STATE PHYS MAT SCI MAT TECHNOL | 47751 | 0% | 100% | 1 |
| 10 | FB PHYS CHEM | 23875 | 0% | 50% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | ELECTROCOMPONENT SCIENCE AND TECHNOLOGY | 37255 | 1% | 10% | 8 |
| 2 | VAKUUM-TECHNIK | 29285 | 1% | 7% | 9 |
| 3 | JOURNAL OF MATERIALS SCIENCE LETTERS | 14090 | 9% | 1% | 57 |
| 4 | THIN SOLID FILMS | 11727 | 14% | 0% | 95 |
| 5 | METALLOFIZIKA I NOVEISHIE TEKHNOLOGII | 6883 | 3% | 1% | 19 |
| 6 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 4841 | 7% | 0% | 46 |
| 7 | JOURNAL OF MATERIALS SCIENCE | 3742 | 7% | 0% | 49 |
| 8 | SPRINGER TRACTS IN MODERN PHYSICS | 3533 | 1% | 1% | 6 |
| 9 | JOURNAL OF PHYSICS F-METAL PHYSICS | 3397 | 2% | 1% | 12 |
| 10 | INDIAN JOURNAL OF PURE & APPLIED PHYSICS | 1876 | 2% | 0% | 14 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |