Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 396 | 3 | LEAD FREE SOLDER//SOLDER//ELECTROMIGRATION | 32184 |
| 1011 | 2 | ATOMIC LAYER DEPOSITION//DIFFUSION BARRIER//CU METALLIZATION | 10645 |
| 18983 | 1 | SELF FORMING BARRIER//CUMG ALLOY//CUTI ALLOY FILM | 550 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | SELF FORMING BARRIER | authKW | 520927 | 2% | 91% | 10 |
| 2 | CUMG ALLOY | authKW | 343813 | 1% | 100% | 6 |
| 3 | CUTI ALLOY FILM | authKW | 343813 | 1% | 100% | 6 |
| 4 | AGGLOMERATION SUPPRESSION | authKW | 294695 | 1% | 86% | 6 |
| 5 | BARRIERLESS METALLIZATION | authKW | 286511 | 1% | 100% | 5 |
| 6 | SILVER METALLIZATION | authKW | 282097 | 1% | 62% | 8 |
| 7 | SELF FORMING | authKW | 257857 | 1% | 75% | 6 |
| 8 | NSF LOW POWER ELECT | address | 229205 | 1% | 67% | 6 |
| 9 | ACT MATRIX LIQUID CRYSTAL DISPLAY | address | 179065 | 1% | 63% | 5 |
| 10 | CU3GE | authKW | 171906 | 1% | 100% | 3 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 5772 | 65% | 0% | 356 |
| 2 | Materials Science, Coatings & Films | 3782 | 19% | 0% | 105 |
| 3 | Materials Science, Multidisciplinary | 1590 | 39% | 0% | 214 |
| 4 | Nanoscience & Nanotechnology | 622 | 12% | 0% | 68 |
| 5 | Physics, Condensed Matter | 579 | 19% | 0% | 102 |
| 6 | Engineering, Electrical & Electronic | 542 | 20% | 0% | 112 |
| 7 | Metallurgy & Metallurgical Engineering | 382 | 10% | 0% | 53 |
| 8 | Electrochemistry | 116 | 5% | 0% | 25 |
| 9 | Optics | 60 | 6% | 0% | 32 |
| 10 | Chemistry, Physical | 26 | 8% | 0% | 44 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | NSF LOW POWER ELECT | 229205 | 1% | 67% | 6 |
| 2 | ACT MATRIX LIQUID CRYSTAL DISPLAY | 179065 | 1% | 63% | 5 |
| 3 | LOW POWER ELECT | 135816 | 1% | 30% | 8 |
| 4 | PROTECT INFORMAT | 114604 | 0% | 100% | 2 |
| 5 | CHEM BIO MAT ENGN | 71731 | 2% | 10% | 12 |
| 6 | ACT MATRIX LIGUID CRYSTAL DISPLAY | 57302 | 0% | 100% | 1 |
| 7 | ACT MATRIX LIGUID DISPLAY | 57302 | 0% | 100% | 1 |
| 8 | CCDS FUSE SOLUT | 57302 | 0% | 100% | 1 |
| 9 | CEA G LETI | 57302 | 0% | 100% | 1 |
| 10 | HITACHI HIGH TECHNOL | 57302 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | JOURNAL OF ELECTRONIC MATERIALS | 5323 | 6% | 0% | 31 |
| 2 | MICROELECTRONIC ENGINEERING | 5283 | 6% | 0% | 31 |
| 3 | JAPANESE JOURNAL OF APPLIED PHYSICS | 3525 | 6% | 0% | 32 |
| 4 | THIN SOLID FILMS | 3261 | 8% | 0% | 46 |
| 5 | JOURNAL OF APPLIED PHYSICS | 1553 | 10% | 0% | 55 |
| 6 | APPLIED PHYSICS LETTERS | 808 | 7% | 0% | 41 |
| 7 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 790 | 4% | 0% | 21 |
| 8 | IEEE ELECTRON DEVICE LETTERS | 600 | 2% | 0% | 10 |
| 9 | APPLIED SURFACE SCIENCE | 536 | 3% | 0% | 19 |
| 10 | VACUUM | 461 | 2% | 0% | 9 |
Author Key Words |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | SELF FORMING BARRIER | 520927 | 2% | 91% | 10 | Search SELF+FORMING+BARRIER | Search SELF+FORMING+BARRIER |
| 2 | CUMG ALLOY | 343813 | 1% | 100% | 6 | Search CUMG+ALLOY | Search CUMG+ALLOY |
| 3 | CUTI ALLOY FILM | 343813 | 1% | 100% | 6 | Search CUTI+ALLOY+FILM | Search CUTI+ALLOY+FILM |
| 4 | AGGLOMERATION SUPPRESSION | 294695 | 1% | 86% | 6 | Search AGGLOMERATION+SUPPRESSION | Search AGGLOMERATION+SUPPRESSION |
| 5 | BARRIERLESS METALLIZATION | 286511 | 1% | 100% | 5 | Search BARRIERLESS+METALLIZATION | Search BARRIERLESS+METALLIZATION |
| 6 | SILVER METALLIZATION | 282097 | 1% | 62% | 8 | Search SILVER+METALLIZATION | Search SILVER+METALLIZATION |
| 7 | SELF FORMING | 257857 | 1% | 75% | 6 | Search SELF+FORMING | Search SELF+FORMING |
| 8 | CU3GE | 171906 | 1% | 100% | 3 | Search CU3GE | Search CU3GE |
| 9 | CUB ALLOY | 171906 | 1% | 100% | 3 | Search CUB+ALLOY | Search CUB+ALLOY |
| 10 | SILICON100 WAFER | 171906 | 1% | 100% | 3 | Search SILICON100+WAFER | Search SILICON100+WAFER |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |