Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
521 | 3 | SILICON CARBIDE//4H SIC//SIC | 21253 |
695 | 2 | SILICON CARBIDE//4H SIC//SIC | 13432 |
16964 | 1 | POROUS INP//POROUS SIC//LOW DIMENS SEMICOND STRUCT | 651 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | POROUS INP | authKW | 726174 | 2% | 100% | 15 |
2 | POROUS SIC | authKW | 630336 | 4% | 52% | 25 |
3 | LOW DIMENS SEMICOND STRUCT | address | 474261 | 4% | 38% | 26 |
4 | POROUS GAN | authKW | 466351 | 3% | 57% | 17 |
5 | POROUS GAAS | authKW | 327250 | 2% | 52% | 13 |
6 | MAT STUDY TESTING | address | 313281 | 4% | 27% | 24 |
7 | POROUS INGAN | authKW | 290470 | 1% | 100% | 6 |
8 | POROUS SILICON CARBIDE | authKW | 186186 | 2% | 38% | 10 |
9 | ELECTROCHEMICAL ETCHING | authKW | 158927 | 5% | 10% | 34 |
10 | PA MBE | authKW | 145229 | 1% | 50% | 6 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 2458 | 40% | 0% | 262 |
2 | Physics, Condensed Matter | 2352 | 32% | 0% | 210 |
3 | Materials Science, Multidisciplinary | 1746 | 38% | 0% | 245 |
4 | Materials Science, Coatings & Films | 1361 | 11% | 0% | 70 |
5 | Electrochemistry | 799 | 10% | 0% | 65 |
6 | Nanoscience & Nanotechnology | 353 | 9% | 0% | 58 |
7 | Materials Science, Characterization, Testing | 141 | 2% | 0% | 13 |
8 | Engineering, Electrical & Electronic | 103 | 10% | 0% | 65 |
9 | Optics | 48 | 5% | 0% | 33 |
10 | Chemistry, Physical | 33 | 8% | 0% | 53 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | LOW DIMENS SEMICOND STRUCT | 474261 | 4% | 38% | 26 |
2 | MAT STUDY TESTING | 313281 | 4% | 27% | 24 |
3 | LC DMX | 108925 | 0% | 75% | 3 |
4 | CECYT | 96823 | 0% | 100% | 2 |
5 | NANOOPTELECT TECHNOL | 96823 | 0% | 100% | 2 |
6 | ELECT ENGN NANOTECHNOL | 71418 | 2% | 13% | 11 |
7 | SEMICOND TECHNOL ENERGET | 64548 | 0% | 67% | 2 |
8 | NANOOPTOELECT TECHNOL | 50401 | 3% | 6% | 18 |
9 | AKAD GLUSHKOV PROSPECT | 48412 | 0% | 100% | 1 |
10 | BP 95 | 48412 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SEMICONDUCTORS | 6235 | 5% | 0% | 30 |
2 | ELECTROCHEMICAL AND SOLID STATE LETTERS | 3249 | 3% | 0% | 17 |
3 | MATERIALS SCIENCE FORUM | 2991 | 5% | 0% | 33 |
4 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 2345 | 3% | 0% | 20 |
5 | TECHNICAL PHYSICS LETTERS | 2073 | 3% | 0% | 17 |
6 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1669 | 4% | 0% | 27 |
7 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1567 | 5% | 0% | 32 |
8 | APPLIED PHYSICS LETTERS | 935 | 7% | 0% | 48 |
9 | PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 598 | 2% | 0% | 16 |
10 | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | 518 | 1% | 0% | 4 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | POROUS INP | 726174 | 2% | 100% | 15 | Search POROUS+INP | Search POROUS+INP |
2 | POROUS SIC | 630336 | 4% | 52% | 25 | Search POROUS+SIC | Search POROUS+SIC |
3 | POROUS GAN | 466351 | 3% | 57% | 17 | Search POROUS+GAN | Search POROUS+GAN |
4 | POROUS GAAS | 327250 | 2% | 52% | 13 | Search POROUS+GAAS | Search POROUS+GAAS |
5 | POROUS INGAN | 290470 | 1% | 100% | 6 | Search POROUS+INGAN | Search POROUS+INGAN |
6 | POROUS SILICON CARBIDE | 186186 | 2% | 38% | 10 | Search POROUS+SILICON+CARBIDE | Search POROUS+SILICON+CARBIDE |
7 | ELECTROCHEMICAL ETCHING | 158927 | 5% | 10% | 34 | Search ELECTROCHEMICAL+ETCHING | Search ELECTROCHEMICAL+ETCHING |
8 | PA MBE | 145229 | 1% | 50% | 6 | Search PA+MBE | Search PA+MBE |
9 | ANODIC ETCHING | 142373 | 2% | 29% | 10 | Search ANODIC+ETCHING | Search ANODIC+ETCHING |
10 | PHOTO ELECTROCHEMICAL ETCHING | 121024 | 1% | 50% | 5 | Search PHOTO+ELECTROCHEMICAL+ETCHING | Search PHOTO+ELECTROCHEMICAL+ETCHING |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |