Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
195 | 3 | GAN//GALLIUM NITRIDE//NITRIDES | 53830 |
22 | 2 | GAN//GALLIUM NITRIDE//INGAN | 36458 |
26023 | 1 | ALGAN GAN HBT//BULK GALLIUM NITRIDE GAN//BULK GAN SUBSTRATES | 287 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | ALGAN GAN HBT | authKW | 329443 | 1% | 100% | 3 |
2 | BULK GALLIUM NITRIDE GAN | authKW | 219629 | 1% | 100% | 2 |
3 | BULK GAN SUBSTRATES | authKW | 219629 | 1% | 100% | 2 |
4 | N SIC | authKW | 219629 | 1% | 100% | 2 |
5 | SERIAL PROTECTION DEVICE | authKW | 219629 | 1% | 100% | 2 |
6 | VERTICAL POWER SEMICONDUCTORS | authKW | 219629 | 1% | 100% | 2 |
7 | P INGAN | authKW | 219625 | 1% | 50% | 4 |
8 | CORP ADV TECHNOL GRP | address | 211175 | 2% | 38% | 5 |
9 | COMMON EMITTER | authKW | 141186 | 1% | 43% | 3 |
10 | 3C SIC SUBSTRATES | authKW | 109814 | 0% | 100% | 1 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 3266 | 67% | 0% | 193 |
2 | Engineering, Electrical & Electronic | 1710 | 46% | 0% | 131 |
3 | Physics, Condensed Matter | 444 | 22% | 0% | 63 |
4 | Materials Science, Multidisciplinary | 332 | 26% | 0% | 75 |
5 | Crystallography | 51 | 4% | 0% | 12 |
6 | Optics | 33 | 6% | 0% | 17 |
7 | Materials Science, Coatings & Films | 21 | 2% | 0% | 7 |
8 | Nanoscience & Nanotechnology | 10 | 3% | 0% | 9 |
9 | Materials Science, Characterization, Testing | 5 | 1% | 0% | 2 |
10 | Materials Science, Biomaterials | 0 | 0% | 0% | 1 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | CORP ADV TECHNOL GRP | 211175 | 2% | 38% | 5 |
2 | BLUE LOTUS MICRO DEVICES | 109814 | 0% | 100% | 1 |
3 | CMPD SEMICOND | 109814 | 0% | 100% | 1 |
4 | DET ELECT COMP ENGN | 109814 | 0% | 100% | 1 |
5 | HKUST JOCKEY CLUB ADV STUDY IAS | 109814 | 0% | 100% | 1 |
6 | INNOVAT MULTIBUSINESS NITRIDE SEMICONDUCTORS | 109814 | 0% | 100% | 1 |
7 | TECHNOL MET FAK | 109814 | 0% | 100% | 1 |
8 | UMR 5005 CNRS | 109814 | 0% | 100% | 1 |
9 | ECE MSE | 54906 | 0% | 50% | 1 |
10 | POWER SEMICOND DEVICE WORKS | 54906 | 0% | 50% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SOLID-STATE ELECTRONICS | 10563 | 11% | 0% | 31 |
2 | IEEE ELECTRON DEVICE LETTERS | 6792 | 8% | 0% | 24 |
3 | MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH | 3513 | 1% | 1% | 4 |
4 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 3060 | 7% | 0% | 21 |
5 | JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2054 | 3% | 0% | 10 |
6 | APPLIED PHYSICS LETTERS | 1961 | 16% | 0% | 45 |
7 | APPLIED PHYSICS EXPRESS | 1816 | 3% | 0% | 8 |
8 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1176 | 5% | 0% | 15 |
9 | JAPANESE JOURNAL OF APPLIED PHYSICS | 943 | 4% | 0% | 12 |
10 | ELECTRONICS LETTERS | 686 | 6% | 0% | 16 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ALGAN GAN HBT | 329443 | 1% | 100% | 3 | Search ALGAN+GAN+HBT | Search ALGAN+GAN+HBT |
2 | BULK GALLIUM NITRIDE GAN | 219629 | 1% | 100% | 2 | Search BULK+GALLIUM+NITRIDE+GAN | Search BULK+GALLIUM+NITRIDE+GAN |
3 | BULK GAN SUBSTRATES | 219629 | 1% | 100% | 2 | Search BULK+GAN+SUBSTRATES | Search BULK+GAN+SUBSTRATES |
4 | N SIC | 219629 | 1% | 100% | 2 | Search N+SIC | Search N+SIC |
5 | SERIAL PROTECTION DEVICE | 219629 | 1% | 100% | 2 | Search SERIAL+PROTECTION+DEVICE | Search SERIAL+PROTECTION+DEVICE |
6 | VERTICAL POWER SEMICONDUCTORS | 219629 | 1% | 100% | 2 | Search VERTICAL+POWER+SEMICONDUCTORS | Search VERTICAL+POWER+SEMICONDUCTORS |
7 | P INGAN | 219625 | 1% | 50% | 4 | Search P+INGAN | Search P+INGAN |
8 | COMMON EMITTER | 141186 | 1% | 43% | 3 | Search COMMON+EMITTER | Search COMMON+EMITTER |
9 | 3C SIC SUBSTRATES | 109814 | 0% | 100% | 1 | Search 3C+SIC+SUBSTRATES | Search 3C+SIC+SUBSTRATES |
10 | 4H SIC VDMOS | 109814 | 0% | 100% | 1 | Search 4H+SIC+VDMOS | Search 4H+SIC+VDMOS |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |