Class information for:
Level 1: FINFET//SHORT CHANNEL EFFECTS//DOUBLE GATE MOSFET

Basic class information

Last years might be incomplete

Hierarchy of classes

The table includes all classes above and classes immediately below the current class.

Cluster id	Level	Cluster label	#P
1	4	PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY	2188495
13	3	PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON	136516
197	2	IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY	20765
432	1	FINFET//SHORT CHANNEL EFFECTS//DOUBLE GATE MOSFET	3487

Terms with highest relevance score

rank	Category	termType	chi_square	shrOfCwithTerm	shrOfTermInClass	termInClass
1	FINFET	authKW	877285	8%	35%	281
2	SHORT CHANNEL EFFECTS	authKW	826239	6%	46%	199
3	DOUBLE GATE MOSFET	authKW	771074	4%	66%	129
4	SHORT CHANNEL EFFECTS SCES	authKW	491957	2%	78%	70
5	COMPACT MODEL	authKW	420260	5%	28%	164
6	MOSFET	authKW	395581	11%	11%	388
7	IEEE TRANSACTIONS ON ELECTRON DEVICES	journal	385777	23%	5%	818
8	JUNCTIONLESS	authKW	349483	2%	68%	57
9	DIBL	authKW	345630	2%	65%	59
10	DOUBLE GATE	authKW	326346	2%	43%	85

Web of Science journal categories

chi_square_rank	Category	chi_square	shrOfCwithTerm	shrOfTermInClass	termInClass
1	Engineering, Electrical & Electronic	61700	76%	0%	2666
2	Physics, Applied	34366	63%	0%	2191
3	Physics, Condensed Matter	6004	23%	0%	803
4	Nanoscience & Nanotechnology	4567	13%	0%	461
5	Computer Science, Hardware & Architecture	402	2%	0%	77
6	Materials Science, Multidisciplinary	202	9%	0%	317
7	Optics	70	3%	0%	119
8	Physics, Multidisciplinary	38	3%	0%	117
9	Mathematics, Interdisciplinary Applications	12	1%	0%	32
10	Materials Science, Coatings & Films	1	1%	0%	22

Address terms

chi_square_rank	term	chi_square	shrOfCwithTerm	shrOfTermInClass	termInClass
1	NANO DEVICE SIMULAT	172778	1%	68%	28
2	MOTILAL NEHRU	136045	1%	47%	32
3	DEEN DAYAL UPADHYAYA	122562	1%	32%	42
4	NISRC	82148	0%	91%	10
5	LOW POWER NANOELECT GRP	81317	0%	60%	15
6	ELECT ENGN DISCIPLINE	76537	0%	71%	12
7	SEMICOND DEVICE	76495	2%	15%	56
8	SEMICOND DEVICES	70921	1%	22%	36
9	EECS ENGN	68332	0%	69%	11
10	SITD	68332	0%	69%	11

Journals

chi_square_rank	term	chi_square	shrOfCwithTerm	shrOfTermInClass	termInClass
1	IEEE TRANSACTIONS ON ELECTRON DEVICES	385777	23%	5%	818
2	SOLID-STATE ELECTRONICS	203496	14%	5%	474
3	IEEE ELECTRON DEVICE LETTERS	100692	9%	3%	322
4	JOURNAL OF COMPUTATIONAL ELECTRONICS	40707	2%	6%	72
5	IEEE TRANSACTIONS ON NANOTECHNOLOGY	17459	2%	3%	60
6	MICROELECTRONICS JOURNAL	17283	2%	2%	87
7	JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE	16203	1%	5%	33
8	SEMICONDUCTOR SCIENCE AND TECHNOLOGY	10711	3%	1%	99
9	JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS	9998	1%	3%	34
10	SUPERLATTICES AND MICROSTRUCTURES	9982	2%	1%	86

Author Key Words

chi_square_rank	term	chi_square	shrOfCwithTerm	shrOfTermInClass	termInClass	LCSH search	Wikipedia search
1	FINFET	877285	8%	35%	281	Search FINFET	Search FINFET
2	SHORT CHANNEL EFFECTS	826239	6%	46%	199	Search SHORT+CHANNEL+EFFECTS	Search SHORT+CHANNEL+EFFECTS
3	DOUBLE GATE MOSFET	771074	4%	66%	129	Search DOUBLE+GATE+MOSFET	Search DOUBLE+GATE+MOSFET
4	SHORT CHANNEL EFFECTS SCES	491957	2%	78%	70	Search SHORT+CHANNEL+EFFECTS+SCES	Search SHORT+CHANNEL+EFFECTS+SCES
5	COMPACT MODEL	420260	5%	28%	164	Search COMPACT+MODEL	Search COMPACT+MODEL
6	MOSFET	395581	11%	11%	388	Search MOSFET	Search MOSFET
7	JUNCTIONLESS	349483	2%	68%	57	Search JUNCTIONLESS	Search JUNCTIONLESS
8	DIBL	345630	2%	65%	59	Search DIBL	Search DIBL
9	DOUBLE GATE	326346	2%	43%	85	Search DOUBLE+GATE	Search DOUBLE+GATE
10	DRAIN INDUCED BARRIER LOWERING DIBL	320185	2%	58%	61	Search DRAIN+INDUCED+BARRIER+LOWERING+DIBL	Search DRAIN+INDUCED+BARRIER+LOWERING+DIBL

Core articles

The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1

rank	cluster_id2	link
1	16884	RF MOSFET//INDUCED GATE NOISE//CHANNEL THERMAL NOISE
2	7073	NETWORK COMPUTAT NANOTECHNOL//BALLISTIC TRANSPORT//QUASI BALLISTIC TRANSPORT
3	38433	VERTICAL MOSFET//BACK BIAS EFFECT//1R READ 1W WRITE 8T TRANSISTOR STATIC RANDOM
4	20817	1T DRAM//CAPACITORLESS DRAM//CAPACITORLESS 1T DRAM
5	9421	EFFECTIVE CHANNEL LENGTH//LOW TEMPERATURE ELECTRONICS//CRYOGENIC CMOS
6	20907	SCHOTTKY BARRIER SB//DOPANT SEGREGATION DS//SCHOTTKY BARRIER MOSFET
7	25310	DEVICE TECHNOL MODELING//NARROW CHANNEL TRANSISTOR//NOISE ADAPTABILITY
8	10114	TUNNEL FIELD EFFECT TRANSISTOR TFET//BAND TO BAND TUNNELING BTBT//TUNNEL FET
9	12310	DIRECT TUNNELING//QUANTUM MECHANICAL EFFECTS//ULTRATHIN GATE OXIDE
10	4663	HOT CARRIERS//HOT CARRIER DEGRADATION//HOT CARRIER EFFECT

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Class information for: Level 1: FINFET//SHORT CHANNEL EFFECTS//DOUBLE GATE MOSFET