Class information for:
Level 1: EFFECTIVE CHANNEL LENGTH//LOW TEMPERATURE ELECTRONICS//CRYOGENIC CMOS

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
13 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 136516
197 2             IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY 20765
9421 1                   EFFECTIVE CHANNEL LENGTH//LOW TEMPERATURE ELECTRONICS//CRYOGENIC CMOS 1190

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 EFFECTIVE CHANNEL LENGTH authKW 265549 2% 53% 19
2 LOW TEMPERATURE ELECTRONICS authKW 161401 1% 38% 16
3 CRYOGENIC CMOS authKW 132416 0% 100% 5
4 SOLID-STATE ELECTRONICS journal 112739 17% 2% 206
5 RSCE authKW 110345 0% 83% 5
6 IEEE TRANSACTIONS ON ELECTRON DEVICES journal 108948 21% 2% 254
7 C R METHOD authKW 79449 0% 100% 3
8 CHANNEL LENGTH EXTRACTION authKW 79449 0% 100% 3
9 DOPANT PILE UP authKW 79449 0% 100% 3
10 DRAIN SOURCE RESISTANCE authKW 79449 0% 100% 3

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 20395 75% 0% 896
2 Physics, Applied 9705 57% 0% 684
3 Physics, Condensed Matter 1852 22% 0% 262
4 Computer Science, Hardware & Architecture 655 4% 0% 53
5 Thermodynamics 227 4% 0% 49
6 Nanoscience & Nanotechnology 164 5% 0% 60
7 Computer Science, Interdisciplinary Applications 143 4% 0% 43
8 Instruments & Instrumentation 102 4% 0% 45
9 Physics, Multidisciplinary 48 5% 0% 56
10 Engineering, General 13 1% 0% 16

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 ADV LOG SRAM ALS 26483 0% 100% 1
2 ARCHITECTURE IC DESIGN EMBEDDED SOFTWARE 26483 0% 100% 1
3 CENT INTEGRAT 26483 0% 100% 1
4 CNRSUMR 5130IMEP LAHC 26483 0% 100% 1
5 CORP DEV VLSI TECHNOL 26483 0% 100% 1
6 CUSTOMER INTEGRAT ENGN 26483 0% 100% 1
7 DMEL CEA TECHNOL AVANCES LETI 26483 0% 100% 1
8 DRAM TD TEAM 26483 0% 100% 1
9 ELE O ACOUST ELE ON DEVICE MODELLING 26483 0% 100% 1
10 ELE ON ESTADO SOLIDO 26483 0% 100% 1

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 SOLID-STATE ELECTRONICS 112739 17% 2% 206
2 IEEE TRANSACTIONS ON ELECTRON DEVICES 108948 21% 2% 254
3 IEEE ELECTRON DEVICE LETTERS 20522 7% 1% 85
4 CRYOGENICS 12322 4% 1% 48
5 IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION 10088 1% 2% 16
6 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 7646 3% 1% 38
7 ELECTRON DEVICE LETTERS 5615 1% 3% 8
8 IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS 3545 1% 1% 10
9 MICROELECTRONICS RELIABILITY 2577 2% 0% 27
10 ELECTRONICS LETTERS 2559 5% 0% 63

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 EFFECTIVE CHANNEL LENGTH 265549 2% 53% 19 Search EFFECTIVE+CHANNEL+LENGTH Search EFFECTIVE+CHANNEL+LENGTH
2 LOW TEMPERATURE ELECTRONICS 161401 1% 38% 16 Search LOW+TEMPERATURE+ELECTRONICS Search LOW+TEMPERATURE+ELECTRONICS
3 CRYOGENIC CMOS 132416 0% 100% 5 Search CRYOGENIC+CMOS Search CRYOGENIC+CMOS
4 RSCE 110345 0% 83% 5 Search RSCE Search RSCE
5 C R METHOD 79449 0% 100% 3 Search C+R+METHOD Search C+R+METHOD
6 CHANNEL LENGTH EXTRACTION 79449 0% 100% 3 Search CHANNEL+LENGTH+EXTRACTION Search CHANNEL+LENGTH+EXTRACTION
7 DOPANT PILE UP 79449 0% 100% 3 Search DOPANT+PILE+UP Search DOPANT+PILE+UP
8 DRAIN SOURCE RESISTANCE 79449 0% 100% 3 Search DRAIN+SOURCE+RESISTANCE Search DRAIN+SOURCE+RESISTANCE
9 EFFECTIVE CHANNEL LENGTH L EFF 79449 0% 100% 3 Search EFFECTIVE+CHANNEL+LENGTH+L+EFF Search EFFECTIVE+CHANNEL+LENGTH+L+EFF
10 HALO POCKET IMPLANT 79449 0% 100% 3 Search HALO+POCKET+IMPLANT Search HALO+POCKET+IMPLANT

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 25310 DEVICE TECHNOL MODELING//NARROW CHANNEL TRANSISTOR//NOISE ADAPTABILITY
2 16884 RF MOSFET//INDUCED GATE NOISE//CHANNEL THERMAL NOISE
3 4663 HOT CARRIERS//HOT CARRIER DEGRADATION//HOT CARRIER EFFECT
4 432 FINFET//SHORT CHANNEL EFFECTS//DOUBLE GATE MOSFET
5 7073 NETWORK COMPUTAT NANOTECHNOL//BALLISTIC TRANSPORT//QUASI BALLISTIC TRANSPORT
6 12310 DIRECT TUNNELING//QUANTUM MECHANICAL EFFECTS//ULTRATHIN GATE OXIDE
7 33387 2 D ELECTRON GAS CHARGE COUPLED DEVICES 2DEG CCDS//GAAS DIODE//GAAS IMAGE SENSOR
8 35135 MAHALANOBIS TAGUCHI SYSTEM//GOMPERTZ BINARY PARTICLE SWARM OPTIMIZATION//VARIABLE DETECTION
9 4410 ENERGY TRANSPORT MODEL//HYDRODYNAMICAL MODELS//BOLTZMANN POISSON SYSTEM
10 30846 CROSS KELVIN RESISTOR CKR//CROSS BRIDGE KELVIN RESISTOR CBKR//POLYMETAL GATE

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