Class information for:
Level 1: RF MOSFET//INDUCED GATE NOISE//CHANNEL THERMAL NOISE

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
26 4 ENGINEERING, ELECTRICAL & ELECTRONIC//ELECT ENGN//IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION 322555
291 3       IEEE JOURNAL OF SOLID-STATE CIRCUITS//ENGINEERING, ELECTRICAL & ELECTRONIC//ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING 42551
184 2             IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES//POWER AMPLIFIER//IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS 21143
16884 1                   RF MOSFET//INDUCED GATE NOISE//CHANNEL THERMAL NOISE 656

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 RF MOSFET authKW 514221 3% 63% 17
2 INDUCED GATE NOISE authKW 491335 2% 68% 15
3 CHANNEL THERMAL NOISE authKW 477594 2% 76% 13
4 RF NOISE authKW 450388 2% 63% 15
5 SUBSTRATE RESISTANCE authKW 439233 2% 57% 16
6 NON QUASI STATIC authKW 343156 2% 71% 10
7 KINK PHENOMENON authKW 336298 1% 100% 7
8 GATE RESISTANCE authKW 256214 2% 44% 12
9 ANOMALOUS DIP authKW 240213 1% 100% 5
10 NONQUASI STATIC NQS EFFECT authKW 216189 1% 75% 6

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 15252 87% 0% 572
2 Computer Science, Hardware & Architecture 2601 11% 0% 75
3 Physics, Applied 2456 40% 0% 263
4 Computer Science, Interdisciplinary Applications 527 8% 0% 54
5 Physics, Condensed Matter 245 12% 0% 79
6 Nanoscience & Nanotechnology 53 4% 0% 27
7 Telecommunications 46 3% 0% 19
8 Mathematics, Interdisciplinary Applications 14 2% 0% 10
9 Physics, Multidisciplinary 10 4% 0% 24
10 Optics 10 3% 0% 21

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 ELECT ELECT INFORMAT TELECOMMUN ENGN 96085 0% 100% 2
2 A AMA MICROELE ON SCI TECHNOL 48043 0% 100% 1
3 ADV LARGE SCALE INTEGRAT DEV 48043 0% 100% 1
4 ADV STUDIES MATTER 48043 0% 100% 1
5 ANALOG RF DEVICE DEV 48043 0% 100% 1
6 BECKMAN 3041 48043 0% 100% 1
7 BELL SWITCHING SYST 48043 0% 100% 1
8 BP 60069 48043 0% 100% 1
9 DEVICE DESIGN 90 NM 48043 0% 100% 1
10 ELECTCOMP ENERGY ENGN 48043 0% 100% 1

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON ELECTRON DEVICES 48609 19% 1% 126
2 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 22253 7% 1% 48
3 SOLID-STATE ELECTRONICS 20306 10% 1% 65
4 IEEE ELECTRON DEVICE LETTERS 11382 7% 1% 47
5 ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING 5740 3% 1% 19
6 IEEE CIRCUITS & DEVICES 4958 1% 2% 6
7 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 3877 1% 1% 7
8 IEEE JOURNAL OF SOLID-STATE CIRCUITS 3813 4% 0% 26
9 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 3524 5% 0% 31
10 IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS 3356 1% 1% 8

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 RF MOSFET 514221 3% 63% 17 Search RF+MOSFET Search RF+MOSFET
2 INDUCED GATE NOISE 491335 2% 68% 15 Search INDUCED+GATE+NOISE Search INDUCED+GATE+NOISE
3 CHANNEL THERMAL NOISE 477594 2% 76% 13 Search CHANNEL+THERMAL+NOISE Search CHANNEL+THERMAL+NOISE
4 RF NOISE 450388 2% 63% 15 Search RF+NOISE Search RF+NOISE
5 SUBSTRATE RESISTANCE 439233 2% 57% 16 Search SUBSTRATE+RESISTANCE Search SUBSTRATE+RESISTANCE
6 NON QUASI STATIC 343156 2% 71% 10 Search NON+QUASI+STATIC Search NON+QUASI+STATIC
7 KINK PHENOMENON 336298 1% 100% 7 Search KINK+PHENOMENON Search KINK+PHENOMENON
8 GATE RESISTANCE 256214 2% 44% 12 Search GATE+RESISTANCE Search GATE+RESISTANCE
9 ANOMALOUS DIP 240213 1% 100% 5 Search ANOMALOUS+DIP Search ANOMALOUS+DIP
10 NONQUASI STATIC NQS EFFECT 216189 1% 75% 6 Search NONQUASI+STATIC+NQS+EFFECT Search NONQUASI+STATIC+NQS+EFFECT

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 9421 EFFECTIVE CHANNEL LENGTH//LOW TEMPERATURE ELECTRONICS//CRYOGENIC CMOS
2 19651 NOISE PARAMETERS//NOISE TEMPERATURE//NOISE MEASUREMENT
3 432 FINFET//SHORT CHANNEL EFFECTS//DOUBLE GATE MOSFET
4 15940 DE EMBEDDING//VECTOR NETWORK ANALYZER VNA//ON WAFER MEASUREMENT
5 5173 LARGE SIGNAL MODEL//IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES//NONLINEAR MEASUREMENTS
6 1428 LOW NOISE AMPLIFIER LNA//LOW NOISE AMPLIFIER//MIXER
7 4663 HOT CARRIERS//HOT CARRIER DEGRADATION//HOT CARRIER EFFECT
8 25310 DEVICE TECHNOL MODELING//NARROW CHANNEL TRANSISTOR//NOISE ADAPTABILITY
9 9831 SPIRAL INDUCTOR//INDUCTORS//INDUCTOR MODEL
10 5425 LDMOS//SPECIFIC ON RESISTANCE//BREAKDOWN VOLTAGE

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