Class information for:
Level 1: DE EMBEDDING//VECTOR NETWORK ANALYZER VNA//ON WAFER MEASUREMENT

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
26 4 ENGINEERING, ELECTRICAL & ELECTRONIC//ELECT ENGN//IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION 322555
291 3       IEEE JOURNAL OF SOLID-STATE CIRCUITS//ENGINEERING, ELECTRICAL & ELECTRONIC//ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING 42551
184 2             IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES//POWER AMPLIFIER//IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS 21143
15940 1                   DE EMBEDDING//VECTOR NETWORK ANALYZER VNA//ON WAFER MEASUREMENT 710

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 DE EMBEDDING authKW 1559264 9% 53% 66
2 VECTOR NETWORK ANALYZER VNA authKW 599981 4% 48% 28
3 ON WAFER MEASUREMENT authKW 369881 3% 42% 20
4 SCATTERING PARAMETER MEASUREMENT authKW 334608 2% 54% 14
5 SCATTERING PARAMETERS authKW 280380 7% 13% 49
6 TEST FIXTURE authKW 269912 2% 41% 15
7 MICROWAVE MEASUREMENTS authKW 251289 9% 9% 61
8 MICROWAVE NETWORK ANALYZER authKW 241668 1% 78% 7
9 MULTIPORT NETWORK authKW 239691 1% 60% 9
10 SCATTERING MATRIX MEASUREMENT authKW 221943 1% 100% 5

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 17229 89% 0% 632
2 Telecommunications 3218 18% 0% 131
3 Instruments & Instrumentation 1689 16% 0% 113
4 Optics 241 9% 0% 64
5 Physics, Applied 90 10% 0% 73
6 Engineering, Manufacturing 46 2% 0% 12
7 Engineering, General 42 2% 0% 17
8 Computer Science, Hardware & Architecture 10 1% 0% 7
9 Computer Science, Interdisciplinary Applications 2 1% 0% 8
10 Imaging Science & Photographic Technology 2 0% 0% 3

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 CIRCUIT THEORY GRP 133166 0% 100% 3
2 ELE OMAGNET MEASUREMENT GRP 88777 0% 100% 2
3 RF INTEGRATED SYST CIRCUITS GRP 79897 0% 60% 3
4 CHARLES L BROWN ELECT ENGN 59183 0% 67% 2
5 ARBEITSGRP HOCHFREQUENZMESSTECHN 44389 0% 100% 1
6 BUR HT RD PLANNING BUDGET MANAGEMENT 44389 0% 100% 1
7 CAMPO TECNOL SARTENEJAS 44389 0% 100% 1
8 CONVERGENCE DEVICE SYST GRP 44389 0% 100% 1
9 COORDINAC POST INGN ELECT 44389 0% 100% 1
10 DC LF ELECT SECT 44389 0% 100% 1

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 108868 25% 1% 178
2 MICROWAVES & RF 42878 4% 4% 26
3 MICROWAVE JOURNAL 35875 5% 2% 38
4 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 26668 10% 1% 74
5 IEEE MICROWAVE MAGAZINE 19733 2% 3% 17
6 IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS 12758 5% 1% 34
7 IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY 10903 2% 2% 12
8 IEEE TRANSACTIONS ON ADVANCED PACKAGING 5286 2% 1% 11
9 IEEE MICROWAVE AND GUIDED WAVE LETTERS 5265 1% 1% 10
10 MICROWAVE AND OPTICAL TECHNOLOGY LETTERS 4863 6% 0% 41

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 DE EMBEDDING 1559264 9% 53% 66 Search DE+EMBEDDING Search DE+EMBEDDING
2 VECTOR NETWORK ANALYZER VNA 599981 4% 48% 28 Search VECTOR+NETWORK+ANALYZER+VNA Search VECTOR+NETWORK+ANALYZER+VNA
3 ON WAFER MEASUREMENT 369881 3% 42% 20 Search ON+WAFER+MEASUREMENT Search ON+WAFER+MEASUREMENT
4 SCATTERING PARAMETER MEASUREMENT 334608 2% 54% 14 Search SCATTERING+PARAMETER+MEASUREMENT Search SCATTERING+PARAMETER+MEASUREMENT
5 SCATTERING PARAMETERS 280380 7% 13% 49 Search SCATTERING+PARAMETERS Search SCATTERING+PARAMETERS
6 TEST FIXTURE 269912 2% 41% 15 Search TEST+FIXTURE Search TEST+FIXTURE
7 MICROWAVE MEASUREMENTS 251289 9% 9% 61 Search MICROWAVE+MEASUREMENTS Search MICROWAVE+MEASUREMENTS
8 MICROWAVE NETWORK ANALYZER 241668 1% 78% 7 Search MICROWAVE+NETWORK+ANALYZER Search MICROWAVE+NETWORK+ANALYZER
9 MULTIPORT NETWORK 239691 1% 60% 9 Search MULTIPORT+NETWORK Search MULTIPORT+NETWORK
10 SCATTERING MATRIX MEASUREMENT 221943 1% 100% 5 Search SCATTERING+MATRIX+MEASUREMENT Search SCATTERING+MATRIX+MEASUREMENT

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 31229 11494//HIGH PINCOUNT BOARD CONNECTORS//PACKAGE AND PRINTED CIRCUIT BOARD PCB EFFECTS
2 25161 LOSSY SILICON SUBSTRATE//HNA ETCHING//DISTRIBUTED INDUCTANCE AND RESISTANCE
3 16884 RF MOSFET//INDUCED GATE NOISE//CHANNEL THERMAL NOISE
4 32316 BOLOMETER MOUNT//MICROWAVE STANDARDS//POWER STANDARDS
5 9831 SPIRAL INDUCTOR//INDUCTORS//INDUCTOR MODEL
6 19651 NOISE PARAMETERS//NOISE TEMPERATURE//NOISE MEASUREMENT
7 18788 SIX PORT//SIX PORT REFLECTOMETER//SIX PORT RECEIVER
8 14800 THZ COMMUNICATIONS//FREQUENCY DOUBLER//SUB MILLIMETER WAVE
9 5711 PERMITTIVITY MEASUREMENT//COMPLEX PERMITTIVITY//PL MICROWAVE NONDESTRUCT TESTING
10 24980 NOVITASNANOELECT//3 D PRINTING//EXCESS CONDUCTION LOSS

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