Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | PERMITTIVITY MEASUREMENT | authKW | 1194633 | 7% | 53% | 115 |
2 | COMPLEX PERMITTIVITY | authKW | 598952 | 7% | 26% | 120 |
3 | PL MICROWAVE NONDESTRUCT TESTING | address | 412184 | 2% | 54% | 39 |
4 | MICROWAVE MEASUREMENTS | authKW | 285079 | 6% | 15% | 98 |
5 | COMPLEX PERMITTIVITY MEASUREMENT | authKW | 232560 | 1% | 57% | 21 |
6 | OPEN ENDED COAXIAL PROBE | authKW | 200104 | 1% | 49% | 21 |
7 | MICROWAVE NONDESTRUCTIVE TESTING | authKW | 175614 | 1% | 75% | 12 |
8 | CAVITY PERTURBATION METHOD | authKW | 168646 | 1% | 79% | 11 |
9 | CAVITY PERTURBATION | authKW | 147246 | 1% | 38% | 20 |
10 | COAXIAL PROBE | authKW | 141890 | 1% | 36% | 20 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 21939 | 67% | 0% | 1088 |
2 | Instruments & Instrumentation | 12474 | 28% | 0% | 451 |
3 | Telecommunications | 2782 | 12% | 0% | 188 |
4 | Materials Science, Characterization, Testing | 1547 | 4% | 0% | 65 |
5 | Engineering, General | 1069 | 7% | 0% | 108 |
6 | Physics, Applied | 1046 | 19% | 0% | 303 |
7 | Optics | 455 | 8% | 0% | 135 |
8 | Remote Sensing | 293 | 2% | 0% | 33 |
9 | Imaging Science & Photographic Technology | 109 | 1% | 0% | 22 |
10 | Materials Science, Composites | 62 | 1% | 0% | 18 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | PL MICROWAVE NONDESTRUCT TESTING | 412184 | 2% | 54% | 39 |
2 | IMAGING SENSING TEAM | 97567 | 0% | 100% | 5 |
3 | AMNTL | 95611 | 0% | 70% | 7 |
4 | MICROWAVE IMAGING NONDESTRUCT EVALUAT | 81304 | 0% | 83% | 5 |
5 | PLICAT NANOSCI NANOENGN | 78041 | 1% | 40% | 10 |
6 | CERMALLOY | 58540 | 0% | 100% | 3 |
7 | MINEL | 58540 | 0% | 100% | 3 |
8 | ASSOCIATED PLASMA | 40254 | 1% | 14% | 15 |
9 | COMMUN SYST NETWORKS | 39027 | 0% | 100% | 2 |
10 | MILLIMETER WAVE TERAHERTZ TECHNOL S MILT | 35122 | 0% | 60% | 3 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 103757 | 14% | 2% | 220 |
2 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 64525 | 13% | 2% | 207 |
3 | PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER | 14439 | 3% | 2% | 45 |
4 | JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY | 12483 | 1% | 3% | 23 |
5 | MEASUREMENT SCIENCE AND TECHNOLOGY | 11628 | 5% | 1% | 75 |
6 | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 9840 | 5% | 1% | 88 |
7 | MATERIALS EVALUATION | 9062 | 2% | 2% | 28 |
8 | JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS | 8841 | 3% | 1% | 43 |
9 | RESEARCH IN NONDESTRUCTIVE EVALUATION | 7645 | 1% | 4% | 11 |
10 | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 6967 | 2% | 1% | 38 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |