Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | SCANNING MICROWAVE MICROSCOPY | authKW | 446084 | 2% | 67% | 10 |
2 | MICROWAVE MICROPROBE | authKW | 401482 | 1% | 100% | 6 |
3 | MICROWAVE MICROSCOPE | authKW | 389311 | 2% | 73% | 8 |
4 | NEAR FIELD MICROWAVE MICROSCOPY | authKW | 361327 | 2% | 60% | 9 |
5 | NEAR FIELD SCANNING MICROWAVE MICROSCOPE | authKW | 334568 | 1% | 100% | 5 |
6 | NEAR FIELD SCANNING MICROWAVE MICROSCOPY | authKW | 334568 | 1% | 100% | 5 |
7 | MICROWAVE MICROSCOPY | authKW | 298065 | 1% | 64% | 7 |
8 | KEYSIGHT S | address | 273225 | 1% | 58% | 7 |
9 | MICROWAVE CIRCUIT TESTING | authKW | 267655 | 1% | 100% | 4 |
10 | SCANNING MICROWAVE MICROSCOPY SMM | authKW | 267655 | 1% | 100% | 4 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 3640 | 56% | 0% | 264 |
2 | Instruments & Instrumentation | 1535 | 18% | 0% | 87 |
3 | Engineering, Electrical & Electronic | 965 | 28% | 0% | 132 |
4 | Microscopy | 387 | 3% | 0% | 15 |
5 | Nanoscience & Nanotechnology | 256 | 9% | 0% | 42 |
6 | Telecommunications | 85 | 4% | 0% | 20 |
7 | Materials Science, Multidisciplinary | 71 | 12% | 0% | 57 |
8 | Materials Science, Ceramics | 69 | 3% | 0% | 13 |
9 | Physics, Condensed Matter | 65 | 8% | 0% | 39 |
10 | Materials Science, Characterization, Testing | 53 | 1% | 0% | 7 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | KEYSIGHT S | 273225 | 1% | 58% | 7 |
2 | CHRISTIAN DOPPLER NANOSCOP METHODS BIOPHYS | 152934 | 2% | 29% | 8 |
3 | KEYSIGHT | 133827 | 0% | 100% | 2 |
4 | PROGRAM INTERDISCIPLINARY INTEGRATED BIOTECHNOL | 133827 | 0% | 100% | 2 |
5 | CELL DAMAGE CONTROL | 89213 | 1% | 33% | 4 |
6 | CHRISTIAN DOPPLER NANOSCALE METHODS BIOPHYS | 66914 | 0% | 100% | 1 |
7 | DHS ELECT MICROELECT NANOTECHNOL | 66914 | 0% | 100% | 1 |
8 | ELECT MICROELECT NANOTECHNOL DHS | 66914 | 0% | 100% | 1 |
9 | INTERDISCIPLINARY BIOMINERAL CRYSTALLOG | 66914 | 0% | 100% | 1 |
10 | INTERDISCIPLINARY MAT SCI TECHNOL | 66914 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | REVIEW OF SCIENTIFIC INSTRUMENTS | 6314 | 11% | 0% | 54 |
2 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 4018 | 6% | 0% | 28 |
3 | APPLIED PHYSICS LETTERS | 2637 | 14% | 0% | 67 |
4 | ULTRAMICROSCOPY | 2281 | 3% | 0% | 14 |
5 | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 1337 | 2% | 0% | 9 |
6 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 871 | 2% | 0% | 11 |
7 | COMPUTATIONAL MATHEMATICS AND MATHEMATICAL PHYSICS | 855 | 1% | 0% | 5 |
8 | JOURNAL OF APPLIED PHYSICS | 805 | 8% | 0% | 37 |
9 | RADIOPHYSICS AND QUANTUM ELECTRONICS | 734 | 1% | 0% | 3 |
10 | MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 635 | 1% | 0% | 6 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |