Class information for:
Level 1: KELVIN PROBE FORCE MICROSCOPY//ELECTROSTATIC FORCE MICROSCOPY//SCI CRYSTAL PHYS

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
8 4 POLYMER SCIENCE//CHEMISTRY, PHYSICAL//MATERIALS SCIENCE, MULTIDISCIPLINARY 1554940
397 3       JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B//MICROELECTRONIC ENGINEERING//NANOSCIENCE & NANOTECHNOLOGY 32153
2006 2             DIP PEN NANOLITHOGRAPHY//MICROCONTACT PRINTING//SCANNING PROBE LITHOGRAPHY 5917
9885 1                   KELVIN PROBE FORCE MICROSCOPY//ELECTROSTATIC FORCE MICROSCOPY//SCI CRYSTAL PHYS 1143

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 KELVIN PROBE FORCE MICROSCOPY authKW 519952 6% 28% 67
2 ELECTROSTATIC FORCE MICROSCOPY authKW 499211 3% 46% 39
3 SCI CRYSTAL PHYS address 110289 0% 100% 4
4 KELVIN FORCE MICROSCOPY authKW 96822 1% 29% 12
5 CHARGE DISSIPATION authKW 92865 1% 42% 8
6 SCANNING MAXWELL STRESS MICROSCOPY SMM authKW 88229 0% 80% 4
7 NANOIMPEDANCE authKW 82717 0% 100% 3
8 SCANNING MAXWELL STRESS MICROSCOPY authKW 82711 1% 50% 6
9 CONTACT ELECTRIFICATION authKW 78866 1% 17% 17
10 KPFM authKW 76368 1% 21% 13

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Physics, Applied 11627 64% 0% 729
2 Nanoscience & Nanotechnology 6056 25% 0% 291
3 Microscopy 1664 4% 0% 48
4 Materials Science, Multidisciplinary 1577 28% 0% 322
5 Physics, Condensed Matter 1040 17% 0% 199
6 Chemistry, Physical 398 15% 0% 174
7 Materials Science, Coatings & Films 373 5% 0% 52
8 Engineering, Electrical & Electronic 266 11% 0% 131
9 Instruments & Instrumentation 198 5% 0% 57
10 Chemistry, Multidisciplinary 124 10% 0% 112

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 SCI CRYSTAL PHYS 110289 0% 100% 4
2 CNRS UA 17 55144 0% 100% 2
3 CONCEPT SCI RUMENTS 55144 0% 100% 2
4 NANOBIOELEC GRP 55140 0% 50% 4
5 UMR CNRS 5011 41355 0% 50% 3
6 BIOMAT PL CRYSTALLOG 36762 0% 67% 2
7 MECAN FLUIDES IMFT 36762 0% 67% 2
8 TECHNOL MONTPELLIER 31015 0% 38% 3
9 ADV FUNCT SINTERED MAT MAT CHARACTERIZAT COMP 27572 0% 100% 1
10 CHBEREICH ELEKTROTECH INFORMAT TECH MEDIENTECH 27572 0% 100% 1

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 NANOTECHNOLOGY 10375 6% 1% 73
2 APPLIED PHYSICS LETTERS 6193 14% 0% 160
3 ULTRAMICROSCOPY 5221 3% 1% 33
4 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 2071 3% 0% 36
5 BEILSTEIN JOURNAL OF NANOTECHNOLOGY 1482 1% 1% 8
6 JOURNAL OF APPLIED PHYSICS 1455 7% 0% 78
7 MICROELECTRONIC ENGINEERING 1370 2% 0% 23
8 MICROELECTRONICS RELIABILITY 1181 2% 0% 18
9 NANO LETTERS 1098 2% 0% 23
10 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 1091 3% 0% 36

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 KELVIN PROBE FORCE MICROSCOPY 519952 6% 28% 67 Search KELVIN+PROBE+FORCE+MICROSCOPY Search KELVIN+PROBE+FORCE+MICROSCOPY
2 ELECTROSTATIC FORCE MICROSCOPY 499211 3% 46% 39 Search ELECTROSTATIC+FORCE+MICROSCOPY Search ELECTROSTATIC+FORCE+MICROSCOPY
3 KELVIN FORCE MICROSCOPY 96822 1% 29% 12 Search KELVIN+FORCE+MICROSCOPY Search KELVIN+FORCE+MICROSCOPY
4 CHARGE DISSIPATION 92865 1% 42% 8 Search CHARGE+DISSIPATION Search CHARGE+DISSIPATION
5 SCANNING MAXWELL STRESS MICROSCOPY SMM 88229 0% 80% 4 Search SCANNING+MAXWELL+STRESS+MICROSCOPY+SMM Search SCANNING+MAXWELL+STRESS+MICROSCOPY+SMM
6 NANOIMPEDANCE 82717 0% 100% 3 Search NANOIMPEDANCE Search NANOIMPEDANCE
7 SCANNING MAXWELL STRESS MICROSCOPY 82711 1% 50% 6 Search SCANNING+MAXWELL+STRESS+MICROSCOPY Search SCANNING+MAXWELL+STRESS+MICROSCOPY
8 CONTACT ELECTRIFICATION 78866 1% 17% 17 Search CONTACT+ELECTRIFICATION Search CONTACT+ELECTRIFICATION
9 KPFM 76368 1% 21% 13 Search KPFM Search KPFM
10 ELECTRIC FORCE MICROSCOPY 74432 1% 30% 9 Search ELECTRIC+FORCE+MICROSCOPY Search ELECTRIC+FORCE+MICROSCOPY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 15212 SCANNING CAPACITANCE MICROSCOPY//SSRM//INSYS
2 34049 CHARGE WRITING//MASKLESS MICROFABRICATION//NANOPARTICLE PATTERNING
3 38389 MICRO WETTABILITY//LIPOPHILIC PROPERTY//AC NON CONTACT MODE
4 1280 NONCONTACT ATOMIC FORCE MICROSCOPY//NC AFM//DISSENY PROGRAMACIO SISTEMES ELECT
5 23725 ELECTRON WORK FUNCTION//AERONAUT TESTING EVALUAT//FOWLERS METHODS
6 6396 SCANNING NONLINEAR DIELECTRIC MICROSCOPY//PIEZORESPONSE FORCE MICROSCOPY//FERROELECTRIC DATA STORAGE
7 20743 SCANNING MICROWAVE MICROSCOPY//MICROWAVE MICROPROBE//MICROWAVE MICROSCOPE
8 21769 FB PHYS TECH//SMART TIPS//X RAY EXCITED CURRENT
9 29234 SCANNING GATE MICROSCOPY//ERASABLE ELECTROSTATIC LITHOGRAPHY//POLE N S
10 36430 RIMAPS TECHNIQUE//TECNOL PROF J SABATO//LASER INTERFERENCE MICROPATTERNING

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