Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
215 | 3 | JOURNAL OF CRYSTAL GROWTH//HGCDTE//SOVIET PHYSICS SEMICONDUCTORS-USSR | 51359 |
3805 | 2 | SOVIET PHYSICS SEMICONDUCTORS-USSR//SELECTIVE REMOVAL OF ATOMS//SOLAR PHYS PROD CORP | 1045 |
36430 | 1 | RIMAPS TECHNIQUE//TECNOL PROF J SABATO//LASER INTERFERENCE MICROPATTERNING | 98 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | RIMAPS TECHNIQUE | authKW | 643206 | 2% | 100% | 2 |
2 | TECNOL PROF J SABATO | address | 361799 | 3% | 38% | 3 |
3 | LASER INTERFERENCE MICROPATTERNING | authKW | 321603 | 1% | 100% | 1 |
4 | LASER METALLOGRAPHY | authKW | 321603 | 1% | 100% | 1 |
5 | LIGHT INTENSITY CURVES | authKW | 321603 | 1% | 100% | 1 |
6 | MILSTEIN | address | 321603 | 1% | 100% | 1 |
7 | NANOCHEM DEF ADV TECHNOL DIAT DU | address | 321603 | 1% | 100% | 1 |
8 | OPTICAL MICROSCOPY OF METALS | authKW | 321603 | 1% | 100% | 1 |
9 | PARTIAL DARK FIELD ILLUMINATION | authKW | 321603 | 1% | 100% | 1 |
10 | PATTERNS OF ROOT DEVELOPMENT | authKW | 321603 | 1% | 100% | 1 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Condensed Matter | 863 | 49% | 0% | 48 |
2 | Microscopy | 309 | 6% | 0% | 6 |
3 | Physics, Applied | 145 | 27% | 0% | 26 |
4 | Materials Science, Characterization, Testing | 53 | 3% | 0% | 3 |
5 | Anatomy & Morphology | 18 | 2% | 0% | 2 |
6 | Metallurgy & Metallurgical Engineering | 15 | 5% | 0% | 5 |
7 | Materials Science, Multidisciplinary | 12 | 11% | 0% | 11 |
8 | Physics, Multidisciplinary | 9 | 6% | 0% | 6 |
9 | Materials Science, Ceramics | 7 | 2% | 0% | 2 |
10 | Materials Science, Coatings & Films | 5 | 2% | 0% | 2 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | TECNOL PROF J SABATO | 361799 | 3% | 38% | 3 |
2 | MILSTEIN | 321603 | 1% | 100% | 1 |
3 | NANOCHEM DEF ADV TECHNOL DIAT DU | 321603 | 1% | 100% | 1 |
4 | PHYSIOTECH SCI | 321603 | 1% | 100% | 1 |
5 | SCI SEMICOND DEVICES | 321603 | 1% | 100% | 1 |
6 | UA MAT CAC | 321603 | 1% | 100% | 1 |
7 | UA MAT | 321595 | 5% | 20% | 5 |
8 | TECNOL PROF JORGE A SABATO | 222644 | 3% | 23% | 3 |
9 | TECNOL PROF JORGE SABATO | 160800 | 1% | 50% | 1 |
10 | UNIDAD ACTIVIDAD MAT | 115772 | 3% | 12% | 3 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SEMICONDUCTORS | 31356 | 27% | 0% | 26 |
2 | TECHNICAL PHYSICS LETTERS | 9464 | 14% | 0% | 14 |
3 | JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES | 4080 | 2% | 1% | 2 |
4 | JOURNAL OF SURFACE INVESTIGATION | 3911 | 4% | 0% | 4 |
5 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 2820 | 7% | 0% | 7 |
6 | PRAKTISCHE METALLOGRAPHIE-PRACTICAL METALLOGRAPHY | 1987 | 2% | 0% | 2 |
7 | MATERIALS CHARACTERIZATION | 747 | 3% | 0% | 3 |
8 | CONTEMPORARY PHYSICS | 447 | 1% | 0% | 1 |
9 | MICROSCOPY RESEARCH AND TECHNIQUE | 324 | 2% | 0% | 2 |
10 | THEORETICAL AND APPLIED FRACTURE MECHANICS | 187 | 1% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |