Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 8 | 4 | POLYMER SCIENCE//CHEMISTRY, PHYSICAL//MATERIALS SCIENCE, MULTIDISCIPLINARY | 1554940 |
| 397 | 3 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B//MICROELECTRONIC ENGINEERING//NANOSCIENCE & NANOTECHNOLOGY | 32153 |
| 2006 | 2 | DIP PEN NANOLITHOGRAPHY//MICROCONTACT PRINTING//SCANNING PROBE LITHOGRAPHY | 5917 |
| 15212 | 1 | SCANNING CAPACITANCE MICROSCOPY//SSRM//INSYS | 751 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | SCANNING CAPACITANCE MICROSCOPY | authKW | 724021 | 5% | 51% | 34 |
| 2 | SSRM | authKW | 634256 | 3% | 66% | 23 |
| 3 | INSYS | address | 293924 | 5% | 19% | 36 |
| 4 | SCANNING CAPACITANCE MICROSCOPE | authKW | 257034 | 1% | 88% | 7 |
| 5 | CARRIER PROFILING | authKW | 215819 | 1% | 86% | 6 |
| 6 | SCANNING SPREADING RESISTANCE MICROSCOPY SSRM | authKW | 215819 | 1% | 86% | 6 |
| 7 | SCANNING CAPACITANCE MICROSCOPY SCM | authKW | 212440 | 1% | 56% | 9 |
| 8 | DIAMOND TIPS | authKW | 167860 | 1% | 100% | 4 |
| 9 | CARRIER SPILLING | authKW | 125895 | 0% | 100% | 3 |
| 10 | DOPANT PROFILING TECHNIQUES | authKW | 125895 | 0% | 100% | 3 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 10189 | 73% | 0% | 549 |
| 2 | Nanoscience & Nanotechnology | 6332 | 32% | 0% | 239 |
| 3 | Engineering, Electrical & Electronic | 3808 | 42% | 0% | 318 |
| 4 | Microscopy | 1276 | 5% | 0% | 34 |
| 5 | Materials Science, Coatings & Films | 808 | 8% | 0% | 59 |
| 6 | Physics, Condensed Matter | 559 | 16% | 0% | 120 |
| 7 | Instruments & Instrumentation | 153 | 5% | 0% | 40 |
| 8 | Materials Science, Multidisciplinary | 138 | 13% | 0% | 97 |
| 9 | Materials Science, Characterization, Testing | 119 | 2% | 0% | 13 |
| 10 | Electrochemistry | 98 | 4% | 0% | 28 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | INSYS | 293924 | 5% | 19% | 36 |
| 2 | MAT COMPONENTS ANAL GRP | 125895 | 0% | 100% | 3 |
| 3 | CORP NANO DEVICES | 55952 | 0% | 67% | 2 |
| 4 | C A S | 41965 | 0% | 100% | 1 |
| 5 | COMPONENTS TECHNOL | 41965 | 0% | 100% | 1 |
| 6 | CORP NANODEVICES | 41965 | 0% | 100% | 1 |
| 7 | CREAT INITIAT SCI NANOMETER SCALE | 41965 | 0% | 100% | 1 |
| 8 | CREAT SCI NANOMETER SCALE | 41965 | 0% | 100% | 1 |
| 9 | CRISMAT LAMIPS COMMUN ENSICAENUMR CNRS 6508 | 41965 | 0% | 100% | 1 |
| 10 | CRISMAT NXP SEMICOND | 41965 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 63294 | 21% | 1% | 159 |
| 2 | MICROELECTRONICS RELIABILITY | 5433 | 4% | 0% | 31 |
| 3 | MICROELECTRONIC ENGINEERING | 3606 | 4% | 0% | 30 |
| 4 | APPLIED PHYSICS LETTERS | 3094 | 12% | 0% | 92 |
| 5 | SOLID-STATE ELECTRONICS | 2386 | 3% | 0% | 24 |
| 6 | SOLID STATE TECHNOLOGY | 1811 | 1% | 0% | 9 |
| 7 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 1689 | 3% | 0% | 20 |
| 8 | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | 1172 | 1% | 0% | 10 |
| 9 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1027 | 4% | 0% | 28 |
| 10 | GEC JOURNAL OF RESEARCH | 972 | 0% | 1% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |