Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 8 | 4 | POLYMER SCIENCE//CHEMISTRY, PHYSICAL//MATERIALS SCIENCE, MULTIDISCIPLINARY | 1554940 |
| 397 | 3 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B//MICROELECTRONIC ENGINEERING//NANOSCIENCE & NANOTECHNOLOGY | 32153 |
| 2006 | 2 | DIP PEN NANOLITHOGRAPHY//MICROCONTACT PRINTING//SCANNING PROBE LITHOGRAPHY | 5917 |
| 34049 | 1 | CHARGE WRITING//MASKLESS MICROFABRICATION//NANOPARTICLE PATTERNING | 130 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | CHARGE WRITING | authKW | 1410547 | 6% | 73% | 8 |
| 2 | MASKLESS MICROFABRICATION | authKW | 484877 | 2% | 100% | 2 |
| 3 | NANOPARTICLE PATTERNING | authKW | 436387 | 2% | 60% | 3 |
| 4 | HGEBIET NANOTECHNOL | address | 432920 | 4% | 36% | 5 |
| 5 | GUIDED SELF ASSEMBLY | authKW | 323250 | 2% | 67% | 2 |
| 6 | NANOXEROGRAPHY | authKW | 323250 | 2% | 67% | 2 |
| 7 | TRAPPED SURFACE CHARGES | authKW | 323250 | 2% | 67% | 2 |
| 8 | CRI NANO PARTICLE CONTROL | address | 251747 | 7% | 12% | 9 |
| 9 | AFM NANOXEROGRAPHY | authKW | 242439 | 1% | 100% | 1 |
| 10 | ANTI COUNTERFEITING TAGS | authKW | 242439 | 1% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Nanoscience & Nanotechnology | 2955 | 52% | 0% | 67 |
| 2 | Physics, Applied | 979 | 55% | 0% | 72 |
| 3 | Materials Science, Multidisciplinary | 867 | 57% | 0% | 74 |
| 4 | Chemistry, Multidisciplinary | 334 | 34% | 0% | 44 |
| 5 | Chemistry, Physical | 312 | 34% | 0% | 44 |
| 6 | Physics, Condensed Matter | 225 | 23% | 0% | 30 |
| 7 | Multidisciplinary Sciences | 57 | 4% | 0% | 5 |
| 8 | Engineering, Electrical & Electronic | 43 | 13% | 0% | 17 |
| 9 | Optics | 23 | 7% | 0% | 9 |
| 10 | Engineering, Chemical | 23 | 7% | 0% | 9 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | HGEBIET NANOTECHNOL | 432920 | 4% | 36% | 5 |
| 2 | CRI NANO PARTICLE CONTROL | 251747 | 7% | 12% | 9 |
| 3 | CTIT ICT | 242439 | 1% | 100% | 1 |
| 4 | NANOTEHNOL GRP | 242439 | 1% | 100% | 1 |
| 5 | PROGRAMMABLE NANOSYST FORMAL METHODS TOOL | 242439 | 1% | 100% | 1 |
| 6 | PROJECT PLANNING DEV GRP | 242439 | 1% | 100% | 1 |
| 7 | HFA | 138533 | 2% | 29% | 2 |
| 8 | NANOTECHNOL GRP | 122904 | 9% | 4% | 12 |
| 9 | LPCNOINSA | 121218 | 1% | 50% | 1 |
| 10 | SUCURSALA ICPI | 121218 | 1% | 50% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | EPRI JOURNAL | 2991 | 1% | 1% | 1 |
| 2 | NANOTECHNOLOGY | 2476 | 9% | 0% | 12 |
| 3 | ADVANCED MATERIALS | 2024 | 8% | 0% | 11 |
| 4 | MICROELECTRONIC ENGINEERING | 1888 | 7% | 0% | 9 |
| 5 | R&D MAGAZINE | 1636 | 1% | 1% | 1 |
| 6 | SMALL | 1566 | 5% | 0% | 6 |
| 7 | KONA POWDER AND PARTICLE JOURNAL | 1316 | 1% | 1% | 1 |
| 8 | JOURNAL OF AEROSOL SCIENCE | 970 | 3% | 0% | 4 |
| 9 | NATURE NANOTECHNOLOGY | 689 | 2% | 0% | 2 |
| 10 | NANO LETTERS | 672 | 5% | 0% | 6 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |