Class information for:
Level 1: NOISE PARAMETERS//NOISE TEMPERATURE//NOISE MEASUREMENT

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
26 4 ENGINEERING, ELECTRICAL & ELECTRONIC//ELECT ENGN//IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION 322555
291 3       IEEE JOURNAL OF SOLID-STATE CIRCUITS//ENGINEERING, ELECTRICAL & ELECTRONIC//ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING 42551
184 2             IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES//POWER AMPLIFIER//IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS 21143
19651 1                   NOISE PARAMETERS//NOISE TEMPERATURE//NOISE MEASUREMENT 519

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 NOISE PARAMETERS authKW 1763218 11% 52% 56
2 NOISE TEMPERATURE authKW 797172 6% 41% 32
3 NOISE MEASUREMENT authKW 305980 8% 12% 42
4 ACTIVE COLD LOAD ACL authKW 242900 1% 100% 4
5 FET NOISE MODELS authKW 242900 1% 100% 4
6 ON WAFER CHARACTERIZATION authKW 242896 1% 67% 6
7 NOISE TEMPERATURE MEASUREMENT authKW 194318 1% 80% 4
8 EXCESS NOISE RATIO authKW 182175 1% 100% 3
9 NOISE MODEL EXTRACTION authKW 182175 1% 100% 3
10 NOISE WAVE authKW 182175 1% 100% 3

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 12259 88% 0% 456
2 Instruments & Instrumentation 1587 18% 0% 93
3 Telecommunications 1575 15% 0% 79
4 Optics 152 8% 0% 44
5 Physics, Applied 47 9% 0% 48
6 Mathematics, Interdisciplinary Applications 27 2% 0% 11
7 Remote Sensing 16 1% 0% 5
8 Computer Science, Interdisciplinary Applications 5 2% 0% 8
9 Imaging Science & Photographic Technology 4 1% 0% 3
10 Computer Science, Hardware & Architecture 4 1% 0% 4

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 MMIC RD 121450 0% 100% 2
2 FG MIKROWELLENTECH 80965 0% 67% 2
3 ADV RF SYST 60725 0% 100% 1
4 CIRCUITS RUMENTAT ELECT MODELING ECIME 60725 0% 100% 1
5 DESARROLLOS TECNOL 60725 0% 100% 1
6 DIPARTIMENTO DIS MAT TECNOL FIS AVANZATE 60725 0% 100% 1
7 ECIMI 60725 0% 100% 1
8 ELE OMAGNET MATTER GRP 60725 0% 100% 1
9 ELE OMAGNET METEOROL GRP 60725 0% 100% 1
10 ELECT MICROWAVES ANTENNAS ELE OMAGNET COMPATI 60725 0% 100% 1

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 96150 28% 1% 143
2 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 35553 14% 1% 73
3 MICROWAVE JOURNAL 19570 5% 1% 24
4 MICROWAVES & RF 17000 3% 2% 14
5 INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES 9546 2% 1% 11
6 IEEE MICROWAVE AND GUIDED WAVE LETTERS 5838 2% 1% 9
7 MICROWAVES 5645 0% 5% 2
8 IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS 3854 3% 0% 16
9 MICROWAVE AND OPTICAL TECHNOLOGY LETTERS 3806 6% 0% 31
10 IEEE MICROWAVE MAGAZINE 3357 1% 1% 6

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 NOISE PARAMETERS 1763218 11% 52% 56 Search NOISE+PARAMETERS Search NOISE+PARAMETERS
2 NOISE TEMPERATURE 797172 6% 41% 32 Search NOISE+TEMPERATURE Search NOISE+TEMPERATURE
3 NOISE MEASUREMENT 305980 8% 12% 42 Search NOISE+MEASUREMENT Search NOISE+MEASUREMENT
4 ACTIVE COLD LOAD ACL 242900 1% 100% 4 Search ACTIVE+COLD+LOAD+ACL Search ACTIVE+COLD+LOAD+ACL
5 FET NOISE MODELS 242900 1% 100% 4 Search FET+NOISE+MODELS Search FET+NOISE+MODELS
6 ON WAFER CHARACTERIZATION 242896 1% 67% 6 Search ON+WAFER+CHARACTERIZATION Search ON+WAFER+CHARACTERIZATION
7 NOISE TEMPERATURE MEASUREMENT 194318 1% 80% 4 Search NOISE+TEMPERATURE+MEASUREMENT Search NOISE+TEMPERATURE+MEASUREMENT
8 EXCESS NOISE RATIO 182175 1% 100% 3 Search EXCESS+NOISE+RATIO Search EXCESS+NOISE+RATIO
9 NOISE MODEL EXTRACTION 182175 1% 100% 3 Search NOISE+MODEL+EXTRACTION Search NOISE+MODEL+EXTRACTION
10 NOISE WAVE 182175 1% 100% 3 Search NOISE+WAVE Search NOISE+WAVE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 16884 RF MOSFET//INDUCED GATE NOISE//CHANNEL THERMAL NOISE
2 18408 DISTRIBUTED AMPLIFIERS//EXTENDED RESONANCE//DUAL FED DISTRIBUTED AMPLIFIER
3 5173 LARGE SIGNAL MODEL//IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES//NONLINEAR MEASUREMENTS
4 15940 DE EMBEDDING//VECTOR NETWORK ANALYZER VNA//ON WAFER MEASUREMENT
5 15197 SIMULAT OPTIMIZAT SYST//ENGN OPTIMIZAT MODELING//SPACE MAPPING
6 36916 JOULE THOMSON CRYOCOOLER//MICROCRYOGENIC COOLER//JOULE THOMSON
7 26709 REAL FREQUENCY TECHNIQUE//BROADBAND MATCHING//LOSSLESS NETWORKS
8 4297 IEEE TRANSACTIONS ON ELECTRON DEVICES//DOUBLE GATE HIGH ELECTRON MOBILITY TRANSISTOR DG HEMT//PSEUDOMORPHIC MODFET
9 37941 CPW SLOT LINE//VERY HIGH DIELECTRIC CONSTANT SUBSTRATES//HYBRID WIRELESS FIBER SYSTEMS
10 25161 LOSSY SILICON SUBSTRATE//HNA ETCHING//DISTRIBUTED INDUCTANCE AND RESISTANCE

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