Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
197 | 2 | IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY | 20765 |
38433 | 1 | VERTICAL MOSFET//BACK BIAS EFFECT//1R READ 1W WRITE 8T TRANSISTOR STATIC RANDOM | 62 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | VERTICAL MOSFET | authKW | 1211035 | 15% | 26% | 9 |
2 | BACK BIAS EFFECT | authKW | 677787 | 3% | 67% | 2 |
3 | 1R READ 1W WRITE 8T TRANSISTOR STATIC RANDOM | authKW | 508341 | 2% | 100% | 1 |
4 | ACCESS MEMORY SRAM | authKW | 508341 | 2% | 100% | 1 |
5 | ASSEMBLY TEST TECHNOL DEV GRP | address | 508341 | 2% | 100% | 1 |
6 | ASYMMETRIC SENSE AMPLIFIER ASA | authKW | 508341 | 2% | 100% | 1 |
7 | BALANCED VOLTAGE ISLANDS | authKW | 508341 | 2% | 100% | 1 |
8 | BALLISTIC PHENOMENA | authKW | 508341 | 2% | 100% | 1 |
9 | BATCH TYPE EQUIPMENT | authKW | 508341 | 2% | 100% | 1 |
10 | BLOCK TECHNOLOGY | authKW | 508341 | 2% | 100% | 1 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 616 | 58% | 0% | 36 |
2 | Physics, Applied | 235 | 40% | 0% | 25 |
3 | Physics, Condensed Matter | 37 | 15% | 0% | 9 |
4 | Engineering, Manufacturing | 18 | 3% | 0% | 2 |
5 | Thermodynamics | 7 | 3% | 0% | 2 |
6 | Computer Science, Theory & Methods | 5 | 3% | 0% | 2 |
7 | Computer Science, Hardware & Architecture | 3 | 2% | 0% | 1 |
8 | Engineering, Mechanical | 3 | 3% | 0% | 2 |
9 | Mathematical & Computational Biology | 3 | 2% | 0% | 1 |
10 | Energy & Fuels | 3 | 3% | 0% | 2 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | ASSEMBLY TEST TECHNOL DEV GRP | 508341 | 2% | 100% | 1 |
2 | MASUOKA | 254170 | 2% | 50% | 1 |
3 | JST C T | 232614 | 15% | 5% | 9 |
4 | INNOVAT INTEGRATED ELECT SYST | 156886 | 8% | 6% | 5 |
5 | ADV DESIGN GRP | 72618 | 2% | 14% | 1 |
6 | ULSI DEVICE ENGN | 72618 | 2% | 14% | 1 |
7 | COLUMBIA INTEGRATED SYST | 33888 | 2% | 7% | 1 |
8 | INTERDISCIPLINARY | 27369 | 21% | 0% | 13 |
9 | GEOSPATIAL INFORMAT SYST | 23105 | 2% | 5% | 1 |
10 | ACCEL | 11551 | 2% | 2% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEICE TRANSACTIONS ON ELECTRONICS | 21507 | 26% | 0% | 16 |
2 | JAPANESE JOURNAL OF APPLIED PHYSICS | 3089 | 16% | 0% | 10 |
3 | SOLID STATE TECHNOLOGY | 2455 | 5% | 0% | 3 |
4 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | 2166 | 10% | 0% | 6 |
5 | ACM TRANSACTIONS ON ARCHITECTURE AND CODE OPTIMIZATION | 1118 | 2% | 0% | 1 |
6 | INTERNATIONAL REVIEW OF LAW AND ECONOMICS | 693 | 2% | 0% | 1 |
7 | PROCEEDINGS OF THE COMBUSTION INSTITUTE | 572 | 3% | 0% | 2 |
8 | SOLID-STATE ELECTRONICS | 455 | 5% | 0% | 3 |
9 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 353 | 2% | 0% | 1 |
10 | IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | 316 | 2% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |