Class information for:
Level 1: MARCH TEST//MEMORY TESTING//IEEE JOURNAL OF SOLID-STATE CIRCUITS

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
12 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, INFORMATION SYSTEMS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE 1181119
295 3       COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 41956
2801 2             IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING//RUN TO RUN CONTROL//VIRTUAL METROLOGY 3310
10278 1                   MARCH TEST//MEMORY TESTING//IEEE JOURNAL OF SOLID-STATE CIRCUITS 1107

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 MARCH TEST authKW 688930 3% 73% 33
2 MEMORY TESTING authKW 622190 5% 43% 51
3 IEEE JOURNAL OF SOLID-STATE CIRCUITS journal 498781 35% 5% 384
4 BUILT IN SELF REPAIR BISR authKW 411082 2% 76% 19
5 BUILT IN REDUNDANCY ANALYSIS BIRA authKW 370096 1% 100% 13
6 MEMORY REPAIR authKW 229643 1% 73% 11
7 PATTERN SENSITIVE FAULTS authKW 218987 1% 77% 10
8 EMBEDDED DRAM authKW 186835 2% 35% 19
9 COUPLING FAULTS authKW 182198 1% 80% 8
10 DYNAMIC FAULTS authKW 177378 1% 69% 9

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 25504 87% 0% 961
2 Computer Science, Hardware & Architecture 15394 21% 0% 234
3 Computer Science, Software Engineering 181 3% 0% 38
4 Computer Science, Interdisciplinary Applications 177 4% 0% 45
5 COMPUTER APPLICATIONS & CYBERNETICS 166 0% 0% 4
6 Computer Science, Theory & Methods 127 4% 0% 40
7 Physics, Applied 109 9% 0% 105
8 Computer Science, Information Systems 64 3% 0% 29
9 Engineering, Manufacturing 49 1% 0% 16
10 Telecommunications 27 2% 0% 22

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 PROBE TEST ENGN TEAM 113876 0% 100% 4
2 SECT COMP ENGN 91099 0% 80% 4
3 ADV RELIABLE SYST 75914 0% 67% 4
4 ALGORITHM LANGUAGES 56938 0% 100% 2
5 EMBEDDED TEST REPAIR PROGRAM 56938 0% 100% 2
6 VERY LARGE SCALE INTEGRAT COMP AIDED DESIGN 51242 0% 60% 3
7 ADV LSI TECHNOL DEV 45545 0% 40% 4
8 ADV RELIABLE SYST A 45545 0% 40% 4
9 MEMORY PROD TECHNOL 42700 0% 50% 3
10 ADV RELAIBLE SYST 28469 0% 100% 1

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE JOURNAL OF SOLID-STATE CIRCUITS 498781 35% 5% 384
2 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 43269 4% 4% 41
3 IEEE DESIGN & TEST OF COMPUTERS 35266 3% 4% 35
4 IEICE TRANSACTIONS ON ELECTRONICS 23612 6% 1% 71
5 ISSCC DIGEST OF TECHNICAL PAPERS 16167 0% 11% 5
6 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 13759 4% 1% 42
7 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 9117 4% 1% 40
8 IEEE TRANSACTIONS ON COMPUTERS 7713 3% 1% 38
9 NEC RESEARCH & DEVELOPMENT 6510 1% 2% 10
10 IEICE TRANSACTIONS ON COMMUNICATIONS ELECTRONICS INFORMATION AND SYSTEMS 2907 0% 2% 5

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 MARCH TEST 688930 3% 73% 33 Search MARCH+TEST Search MARCH+TEST
2 MEMORY TESTING 622190 5% 43% 51 Search MEMORY+TESTING Search MEMORY+TESTING
3 BUILT IN SELF REPAIR BISR 411082 2% 76% 19 Search BUILT+IN+SELF+REPAIR+BISR Search BUILT+IN+SELF+REPAIR+BISR
4 BUILT IN REDUNDANCY ANALYSIS BIRA 370096 1% 100% 13 Search BUILT+IN+REDUNDANCY+ANALYSIS+BIRA Search BUILT+IN+REDUNDANCY+ANALYSIS+BIRA
5 MEMORY REPAIR 229643 1% 73% 11 Search MEMORY+REPAIR Search MEMORY+REPAIR
6 PATTERN SENSITIVE FAULTS 218987 1% 77% 10 Search PATTERN+SENSITIVE+FAULTS Search PATTERN+SENSITIVE+FAULTS
7 EMBEDDED DRAM 186835 2% 35% 19 Search EMBEDDED+DRAM Search EMBEDDED+DRAM
8 COUPLING FAULTS 182198 1% 80% 8 Search COUPLING+FAULTS Search COUPLING+FAULTS
9 DYNAMIC FAULTS 177378 1% 69% 9 Search DYNAMIC+FAULTS Search DYNAMIC+FAULTS
10 DRAM 162656 5% 11% 52 Search DRAM Search DRAM

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 16417 CRITICAL AREA//IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING//WAFER MAP
2 20817 1T DRAM//CAPACITORLESS DRAM//CAPACITORLESS 1T DRAM
3 38433 VERTICAL MOSFET//BACK BIAS EFFECT//1R READ 1W WRITE 8T TRANSISTOR STATIC RANDOM
4 25320 CATASTROPHIC FAULT PATTERNS//DEGRADABLE VLSI ARRAY//RECONFIGURATION
5 32746 BYTE ERROR CORRECTING DETECTING CODES//CHOICE OF OVERALL TRANSFER FUNCTION//COMPUTER MEMORY SYSTEMS
6 1649 SRAM//PROCESS VARIATION//STATIC RANDOM ACCESS MEMORY SRAM
7 20903 HORIZONTAL CURRENT BIPOLAR TRANSISTOR HCBT//BINARY COMPARATOR//FULLY DEPLETED COLLECTOR
8 31010 ANTIFUSE//LOGIC NONVOLATILE MEMORY NVM//MULTITIME PROGRAMMABLE MTP
9 13210 CHARGE PUMP//SWITCHED CAPACITOR CONVERTER//CHARGE PUMP CIRCUIT
10 27502 BEAM CHANNEL TRANSISTOR//BIPOLAR MODE FIELD EFFECT TRANSISTORS BMFETS//BIPOLAR STATIC INDUCTION TRANSISTORS BSITS

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