Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | WoSSC | 1343846 | 32% | 14% | 13392 |
| 2 | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | journal | 1254835 | 7% | 58% | 2883 |
| 3 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | journal | 655424 | 4% | 49% | 1784 |
| 4 | ENGINEERING, ELECTRICAL & ELECTRONIC | WoSSC | 603339 | 69% | 3% | 29044 |
| 5 | IEEE TRANSACTIONS ON COMPUTERS | journal | 297582 | 3% | 28% | 1453 |
| 6 | SOFT ERROR | authKW | 265248 | 1% | 84% | 420 |
| 7 | SRAM | authKW | 249520 | 1% | 73% | 455 |
| 8 | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | journal | 248669 | 1% | 55% | 606 |
| 9 | IEEE DESIGN & TEST OF COMPUTERS | journal | 236710 | 1% | 57% | 559 |
| 10 | INTEGRATION-THE VLSI JOURNAL | journal | 221915 | 1% | 53% | 561 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Computer Science, Hardware & Architecture | 1343846 | 32% | 14% | 13392 |
| 2 | Engineering, Electrical & Electronic | 603339 | 69% | 3% | 29044 |
| 3 | Computer Science, Theory & Methods | 70526 | 12% | 2% | 4941 |
| 4 | Computer Science, Software Engineering | 62780 | 9% | 2% | 3914 |
| 5 | Computer Science, Interdisciplinary Applications | 36613 | 9% | 2% | 3587 |
| 6 | Computer Science, Information Systems | 25149 | 7% | 1% | 2922 |
| 7 | Nuclear Science & Technology | 8280 | 5% | 1% | 2022 |
| 8 | Automation & Control Systems | 4936 | 3% | 1% | 1119 |
| 9 | Engineering, Manufacturing | 2952 | 2% | 1% | 734 |
| 10 | Computer Science, Artificial Intelligence | 2520 | 3% | 1% | 1120 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | ELECT COMP ENGN | 82772 | 10% | 3% | 4358 |
| 2 | SPACE DEF ELECT | 43833 | 0% | 86% | 68 |
| 3 | ELECT ENGN | 40760 | 9% | 2% | 3872 |
| 4 | COMP ENGN | 24190 | 2% | 4% | 826 |
| 5 | DIPARTIMENTO AUTOMAT INFORMAT | 23392 | 0% | 21% | 149 |
| 6 | HIGH PERFORMANCE EMBEDDED SYST | 19059 | 0% | 55% | 46 |
| 7 | VLSI DESIGN | 18298 | 0% | 30% | 81 |
| 8 | ELECT ENGN COMP SCI | 17597 | 2% | 3% | 967 |
| 9 | COMP SCI | 15185 | 5% | 1% | 1977 |
| 10 | DEVICE MODELLING GRP | 14992 | 0% | 43% | 47 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1254835 | 7% | 58% | 2883 |
| 2 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 655424 | 4% | 49% | 1784 |
| 3 | IEEE TRANSACTIONS ON COMPUTERS | 297582 | 3% | 28% | 1453 |
| 4 | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 248669 | 1% | 55% | 606 |
| 5 | IEEE DESIGN & TEST OF COMPUTERS | 236710 | 1% | 57% | 559 |
| 6 | INTEGRATION-THE VLSI JOURNAL | 221915 | 1% | 53% | 561 |
| 7 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | 219714 | 4% | 19% | 1579 |
| 8 | ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS | 189407 | 1% | 56% | 453 |
| 9 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 131530 | 4% | 10% | 1736 |
| 10 | IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES | 123862 | 1% | 49% | 336 |
Author Key Words |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | SOFT ERROR | 265248 | 1% | 84% | 420 | Search SOFT+ERROR | Search SOFT+ERROR |
| 2 | SRAM | 249520 | 1% | 73% | 455 | Search SRAM | Search SRAM |
| 3 | HIGH LEVEL SYNTHESIS | 188437 | 1% | 77% | 329 | Search HIGH+LEVEL+SYNTHESIS | Search HIGH+LEVEL+SYNTHESIS |
| 4 | SINGLE EVENT UPSET | 181846 | 1% | 80% | 303 | Search SINGLE+EVENT+UPSET | Search SINGLE+EVENT+UPSET |
| 5 | LOW POWER | 169844 | 2% | 27% | 845 | Search LOW+POWER | Search LOW+POWER |
| 6 | SINGLE EVENT TRANSIENT | 142871 | 0% | 91% | 209 | Search SINGLE+EVENT+TRANSIENT | Search SINGLE+EVENT+TRANSIENT |
| 7 | COMPUTER ARITHMETIC | 141363 | 1% | 74% | 256 | Search COMPUTER+ARITHMETIC | Search COMPUTER+ARITHMETIC |
| 8 | VLSI | 140417 | 1% | 38% | 500 | Search VLSI | Search VLSI |
| 9 | PROCESS VARIATION | 137903 | 1% | 55% | 336 | Search PROCESS+VARIATION | Search PROCESS+VARIATION |
| 10 | SINGLE EVENT EFFECTS | 126979 | 1% | 70% | 243 | Search SINGLE+EVENT+EFFECTS | Search SINGLE+EVENT+EFFECTS |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 3 |