Class information for:
Level 2: SOFT ERROR//SINGLE EVENT UPSET//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
12 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, INFORMATION SYSTEMS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE 1181119
295 3       COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 41956
1155 2             SOFT ERROR//SINGLE EVENT UPSET//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 9839
1076 1                   SOFT ERROR//SINGLE EVENT TRANSIENT//SINGLE EVENT UPSET 2897
2216 1                   TEST DATA COMPRESSION//TRANSITION FAULTS//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2356
12579 1                   FAULT INJECTION//CONTROL FLOW CHECKING//SRAM BASED FPGA 926
14051 1                   ORDERED BINARY DECISION DIAGRAMS//BINARY DECISION DIAGRAMS//BDDS 826
16893 1                   LOGIC SYNTHESIS//STATE ASSIGNMENT//LOGIC OPTIMIZATION 656
17536 1                   UNIDIRECTIONAL ERRORS//SELF CHECKING CIRCUITS//BALANCED CODES 622
17829 1                   BRIDGING FAULTS//FAULT SIMULATION//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 607
19223 1                   REED MULLER EXPANSION//REED MULLER TRANSFORM//AND EXOR 539
24438 1                   POST SILICON VALIDATION//FUNCTIONAL VERIFICATION//SILICON DEBUG 335
37831 1                   BOOLEAN EQUATIONS//PARAMETRIC GENERAL SOLUTION//SUBSUMPTIVE GENERAL SOLUTION 75

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 SOFT ERROR authKW 937868 4% 77% 382
2 SINGLE EVENT UPSET authKW 726928 3% 78% 293
3 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS journal 715006 11% 21% 1053
4 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS journal 681545 5% 44% 485
5 SINGLE EVENT TRANSIENT authKW 576034 2% 89% 203
6 IEEE TRANSACTIONS ON NUCLEAR SCIENCE journal 552460 17% 10% 1706
7 SINGLE EVENT EFFECTS authKW 534147 2% 69% 241
8 SINGLE EVENT UPSET SEU authKW 485487 2% 84% 181
9 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE WoSSC 445454 38% 4% 3728
10 FAULT INJECTION authKW 411106 2% 76% 170

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Computer Science, Hardware & Architecture 445454 38% 4% 3728
2 Engineering, Electrical & Electronic 138031 68% 1% 6731
3 Nuclear Science & Technology 44689 20% 1% 1971
4 Computer Science, Theory & Methods 19007 13% 1% 1237
5 Computer Science, Interdisciplinary Applications 17271 12% 1% 1164
6 Computer Science, Software Engineering 14389 9% 1% 908
7 Computer Science, Information Systems 6517 7% 0% 717
8 Instruments & Instrumentation 1176 4% 0% 423
9 COMPUTER APPLICATIONS & CYBERNETICS 1113 0% 1% 31
10 Logic 716 1% 0% 63

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 SPACE DEF ELECT 176496 1% 84% 66
2 RADIAT EFFECTS GRP 45721 0% 71% 20
3 DIPARTIMENTO AUTOMAT INFORMAT 43504 1% 14% 98
4 COMP AIDED DESIGN TEST GRP 41617 0% 100% 13
5 INFORMAT LS2 28812 0% 100% 9
6 COMP ARCHITECTURE COMP ENGN 24621 0% 77% 10
7 COMPONENT ENGN GRP 22409 0% 100% 7
8 RELIABLE INTEGRATED SYST GRP 22409 0% 100% 7
9 RELIABLE HIGH PERFORMANCE COMP 22381 0% 33% 21
10 FAULT TOLERANT COMP GRP 20485 0% 80% 8

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 715006 11% 21% 1053
2 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 681545 5% 44% 485
3 IEEE TRANSACTIONS ON NUCLEAR SCIENCE 552460 17% 10% 1706
4 IEEE DESIGN & TEST OF COMPUTERS 237810 3% 27% 271
5 IEEE TRANSACTIONS ON COMPUTERS 203711 6% 11% 581
6 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 103797 3% 9% 344
7 IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES 80460 1% 19% 131
8 IET COMPUTERS AND DIGITAL TECHNIQUES 65758 1% 21% 97
9 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS 56708 1% 15% 120
10 IEE PROCEEDINGS-E COMPUTERS AND DIGITAL TECHNIQUES 47787 1% 16% 91

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 SOFT ERROR 937868 4% 77% 382 Search SOFT+ERROR Search SOFT+ERROR
2 SINGLE EVENT UPSET 726928 3% 78% 293 Search SINGLE+EVENT+UPSET Search SINGLE+EVENT+UPSET
3 SINGLE EVENT TRANSIENT 576034 2% 89% 203 Search SINGLE+EVENT+TRANSIENT Search SINGLE+EVENT+TRANSIENT
4 SINGLE EVENT EFFECTS 534147 2% 69% 241 Search SINGLE+EVENT+EFFECTS Search SINGLE+EVENT+EFFECTS
5 SINGLE EVENT UPSET SEU 485487 2% 84% 181 Search SINGLE+EVENT+UPSET+SEU Search SINGLE+EVENT+UPSET+SEU
6 FAULT INJECTION 411106 2% 76% 170 Search FAULT+INJECTION Search FAULT+INJECTION
7 TEST DATA COMPRESSION 326650 1% 98% 104 Search TEST+DATA+COMPRESSION Search TEST+DATA+COMPRESSION
8 DESIGN FOR TESTABILITY 299917 2% 58% 162 Search DESIGN+FOR+TESTABILITY Search DESIGN+FOR+TESTABILITY
9 SINGLE EVENT TRANSIENT SET 293183 1% 86% 107 Search SINGLE+EVENT+TRANSIENT+SET Search SINGLE+EVENT+TRANSIENT+SET
10 SEU 284085 1% 83% 107 Search SEU Search SEU

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 2


rank cluster_id2 link
1 2801 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING//RUN TO RUN CONTROL//VIRTUAL METROLOGY
2 1108 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS//COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//PROCESS VARIATION
3 1557 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//HIGH LEVEL SYNTHESIS//COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
4 4271 AT&T TECHNICAL JOURNAL//OPTOCOUPLER//ACTIVATION ENERGY OF RECOVERY
5 2527 CONSTRAINTS//PROOF COMPLEXITY//BOUNDED ARITHMETIC
6 2718 SOFTWARE RELIABILITY//SOFTWARE RELIABILITY GROWTH MODEL//SOFTWARE REJUVENATION
7 197 IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY
8 3367 CHARGE COUPLED DEVICE//MESH EXPERIMENT//HXMT
9 3246 CELLULAR AUTOMATA//JOURNAL OF CELLULAR AUTOMATA//ELEMENTARY CELLULAR AUTOMATA
10 176 COMPUTER SCIENCE, THEORY & METHODS//LECTURE NOTES IN COMPUTER SCIENCE//COMPUTER SCIENCE, SOFTWARE ENGINEERING

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