Class information for:
Level 1: TEST DATA COMPRESSION//TRANSITION FAULTS//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
12 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, INFORMATION SYSTEMS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE 1181119
295 3       COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 41956
1155 2             SOFT ERROR//SINGLE EVENT UPSET//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 9839
2216 1                   TEST DATA COMPRESSION//TRANSITION FAULTS//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2356

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 TEST DATA COMPRESSION authKW 1338675 4% 97% 103
2 TRANSITION FAULTS authKW 902239 3% 92% 73
3 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS journal 863293 11% 24% 267
4 DELAY TESTING authKW 797770 3% 76% 78
5 TEST GENERATION authKW 741100 5% 45% 123
6 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS journal 740549 22% 11% 524
7 DESIGN FOR TESTABILITY authKW 734365 5% 44% 124
8 LOW POWER TESTING authKW 597108 2% 89% 50
9 BUILT IN SELF TEST authKW 524657 4% 39% 101
10 SCAN TESTING authKW 513598 2% 80% 48

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Computer Science, Hardware & Architecture 273879 61% 1% 1426
2 Engineering, Electrical & Electronic 41481 76% 0% 1797
3 Computer Science, Interdisciplinary Applications 16997 23% 0% 548
4 Computer Science, Software Engineering 4704 11% 0% 252
5 Computer Science, Theory & Methods 2063 9% 0% 205
6 Computer Science, Information Systems 2039 8% 0% 194
7 COMPUTER APPLICATIONS & CYBERNETICS 491 0% 0% 10
8 Automation & Control Systems 238 3% 0% 59
9 Instruments & Instrumentation 140 3% 0% 78
10 Computer Science, Artificial Intelligence 32 2% 0% 38

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 COMP AIDED DESIGN TEST GRP 173881 1% 100% 13
2 ELECT SYST DESIGN GRP 49370 1% 31% 12
3 RELIABLE HIGH PERFORMANCE COMP 41591 1% 22% 14
4 ELECT DESIGN COMMUN COMP 40126 0% 100% 3
5 COMP ARCHITECTURE COMP ENGN 37033 0% 46% 6
6 FAULT TOLERANT COMP GRP 33434 0% 50% 5
7 IC DESIGN DIGITAL DESIGN TEST 30569 0% 57% 4
8 COMP DESIGN TEST 30093 0% 75% 3
9 DIPARTIMENTO INFORMAT AUTOMAT 26751 0% 100% 2
10 DST INFORMAT 26751 0% 100% 2

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 863293 11% 24% 267
2 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 740549 22% 11% 524
3 IEEE DESIGN & TEST OF COMPUTERS 269178 6% 14% 141
4 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 107478 7% 5% 171
5 IEEE TRANSACTIONS ON COMPUTERS 103017 9% 4% 202
6 IET COMPUTERS AND DIGITAL TECHNIQUES 88439 2% 12% 55
7 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS 65424 3% 8% 63
8 IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES 28290 2% 6% 38
9 INTEGRATION-THE VLSI JOURNAL 21133 2% 4% 41
10 IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS 19845 4% 2% 96

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 TEST DATA COMPRESSION 1338675 4% 97% 103 Search TEST+DATA+COMPRESSION Search TEST+DATA+COMPRESSION
2 TRANSITION FAULTS 902239 3% 92% 73 Search TRANSITION+FAULTS Search TRANSITION+FAULTS
3 DELAY TESTING 797770 3% 76% 78 Search DELAY+TESTING Search DELAY+TESTING
4 TEST GENERATION 741100 5% 45% 123 Search TEST+GENERATION Search TEST+GENERATION
5 DESIGN FOR TESTABILITY 734365 5% 44% 124 Search DESIGN+FOR+TESTABILITY Search DESIGN+FOR+TESTABILITY
6 LOW POWER TESTING 597108 2% 89% 50 Search LOW+POWER+TESTING Search LOW+POWER+TESTING
7 BUILT IN SELF TEST 524657 4% 39% 101 Search BUILT+IN+SELF+TEST Search BUILT+IN+SELF+TEST
8 SCAN TESTING 513598 2% 80% 48 Search SCAN+TESTING Search SCAN+TESTING
9 PATH DELAY FAULTS 496193 2% 95% 39 Search PATH+DELAY+FAULTS Search PATH+DELAY+FAULTS
10 TEST COMPRESSION 488777 2% 89% 41 Search TEST+COMPRESSION Search TEST+COMPRESSION

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 17829 BRIDGING FAULTS//FAULT SIMULATION//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
2 17536 UNIDIRECTIONAL ERRORS//SELF CHECKING CIRCUITS//BALANCED CODES
3 24438 POST SILICON VALIDATION//FUNCTIONAL VERIFICATION//SILICON DEBUG
4 16893 LOGIC SYNTHESIS//STATE ASSIGNMENT//LOGIC OPTIMIZATION
5 13768 HIGH LEVEL SYNTHESIS//BEHAVIORAL SYNTHESIS//DATAPATH SYNTHESIS
6 14051 ORDERED BINARY DECISION DIAGRAMS//BINARY DECISION DIAGRAMS//BDDS
7 22929 IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY//THERMAL ENGN TECHNOL//IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING
8 12579 FAULT INJECTION//CONTROL FLOW CHECKING//SRAM BASED FPGA
9 10278 MARCH TEST//MEMORY TESTING//IEEE JOURNAL OF SOLID-STATE CIRCUITS
10 9775 MIXED SIGNAL TEST//ANALOG TEST//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

Go to start page