Class information for:
Level 1: MIXED SIGNAL TEST//ANALOG TEST//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
26 4 ENGINEERING, ELECTRICAL & ELECTRONIC//ELECT ENGN//IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION 322555
291 3       IEEE JOURNAL OF SOLID-STATE CIRCUITS//ENGINEERING, ELECTRICAL & ELECTRONIC//ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING 42551
581 2             ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING//IEEE JOURNAL OF SOLID-STATE CIRCUITS//CURRENT MODE CIRCUITS 14766
9775 1                   MIXED SIGNAL TEST//ANALOG TEST//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 1155

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 MIXED SIGNAL TEST authKW 793044 4% 62% 47
2 ANALOG TEST authKW 752684 3% 69% 40
3 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS journal 705607 15% 15% 169
4 ANALOG CIRCUITS authKW 622062 10% 19% 121
5 I DDQ TESTING authKW 571401 3% 63% 33
6 ANALOG FAULT DIAGNOSIS authKW 545714 2% 100% 20
7 OSCILLATION BASED TEST authKW 492505 2% 95% 19
8 RF TEST authKW 352059 2% 65% 20
9 ALTERNATE TEST authKW 329375 1% 93% 13
10 LOOPBACK TEST authKW 327428 1% 100% 12

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 26080 86% 0% 993
2 Computer Science, Hardware & Architecture 18822 23% 0% 264
3 Instruments & Instrumentation 1778 13% 0% 150
4 Computer Science, Interdisciplinary Applications 652 7% 0% 81
5 Engineering, General 107 3% 0% 33
6 Computer Science, Artificial Intelligence 104 3% 0% 36
7 Nanoscience & Nanotechnology 101 4% 0% 49
8 Automation & Control Systems 74 2% 0% 24
9 Computer Science, Information Systems 49 2% 0% 27
10 Computer Science, Software Engineering 48 2% 0% 23

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 ELECT RUMENTAT DEV GRP 109143 0% 100% 4
2 ELECT ELECT COMP CONTROL ENGN 98094 1% 28% 13
3 DELET 62007 0% 45% 5
4 AUTOMAT TEST SYST 54571 0% 100% 2
5 FRENCH COUNCIL CNRS 54571 0% 100% 2
6 GRP INVEST SERV ELECT CONTROL 54571 0% 100% 2
7 HVAL GRP 54571 0% 100% 2
8 MICRO ELECT DESIGN IL 54571 0% 100% 2
9 KATEDRA OPTOELEKT SYST ELEKT 49112 0% 60% 3
10 METROL ELECT SYST 49112 0% 60% 3

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 705607 15% 15% 169
2 IEEE DESIGN & TEST OF COMPUTERS 71808 4% 5% 51
3 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 26856 6% 1% 70
4 ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING 25427 5% 2% 53
5 METROLOGY AND MEASUREMENT SYSTEMS 24901 2% 4% 24
6 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 21579 7% 1% 85
7 IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS 20174 2% 3% 26
8 INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS 14833 3% 2% 30
9 IEEE DESIGN & TEST 12330 1% 5% 9
10 IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS 9370 1% 2% 16

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 MIXED SIGNAL TEST 793044 4% 62% 47 Search MIXED+SIGNAL+TEST Search MIXED+SIGNAL+TEST
2 ANALOG TEST 752684 3% 69% 40 Search ANALOG+TEST Search ANALOG+TEST
3 ANALOG CIRCUITS 622062 10% 19% 121 Search ANALOG+CIRCUITS Search ANALOG+CIRCUITS
4 I DDQ TESTING 571401 3% 63% 33 Search I+DDQ+TESTING Search I+DDQ+TESTING
5 ANALOG FAULT DIAGNOSIS 545714 2% 100% 20 Search ANALOG+FAULT+DIAGNOSIS Search ANALOG+FAULT+DIAGNOSIS
6 OSCILLATION BASED TEST 492505 2% 95% 19 Search OSCILLATION+BASED+TEST Search OSCILLATION+BASED+TEST
7 RF TEST 352059 2% 65% 20 Search RF+TEST Search RF+TEST
8 ALTERNATE TEST 329375 1% 93% 13 Search ALTERNATE+TEST Search ALTERNATE+TEST
9 LOOPBACK TEST 327428 1% 100% 12 Search LOOPBACK+TEST Search LOOPBACK+TEST
10 FAULT DICTIONARY 317731 2% 61% 19 Search FAULT+DICTIONARY Search FAULT+DICTIONARY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 17829 BRIDGING FAULTS//FAULT SIMULATION//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
2 13095 CIRCUIT SIZING//ANALOG PLACEMENT//ANALOG CIRCUIT SYNTHESIS
3 9618 ADC TESTING//FREQUENCY ESTIMATION//NONCOHERENT SAMPLING
4 24737 SWITCHED CURRENT CIRCUITS//SWITCHED CURRENT//SWITCHED CURRENT FILTERS
5 31083 SEQUENTIAL FAULT DIAGNOSIS//TEST SEQUENCING PROBLEM//TEST SEQUENCING
6 17646 DIGITAL TO ANALOG CONVERTER DAC//CURRENT STEERING//DIRECT DIGITAL FREQUENCY SYNTHESIZER
7 16417 CRITICAL AREA//IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING//WAFER MAP
8 15899 TIME TO DIGITAL CONVERTER TDC//TIME TO DIGITAL CONVERTER//TIME INTERVAL MEASUREMENT
9 22929 IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY//THERMAL ENGN TECHNOL//IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING
10 2216 TEST DATA COMPRESSION//TRANSITION FAULTS//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

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