Class information for:
Level 1: CRITICAL AREA//IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING//WAFER MAP

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
12 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, INFORMATION SYSTEMS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE 1181119
295 3       COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 41956
2801 2             IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING//RUN TO RUN CONTROL//VIRTUAL METROLOGY 3310
16417 1                   CRITICAL AREA//IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING//WAFER MAP 682

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 CRITICAL AREA authKW 863774 4% 69% 27
2 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING journal 582844 21% 9% 142
3 WAFER MAP authKW 399390 2% 79% 11
4 YIELD MODEL authKW 354254 3% 33% 23
5 KILL RATIO authKW 283041 1% 88% 7
6 CRITICAL AREA ANALYSIS authKW 192544 1% 83% 5
7 SEMICONDUCTOR YIELD authKW 192544 1% 83% 5
8 WAFER BIN MAP authKW 184844 1% 100% 4
9 DEFECT DENSITY DISTRIBUTION authKW 138633 0% 100% 3
10 DEFECT REDUCT TECHNOL address 138633 0% 100% 3

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Manufacturing 14839 26% 0% 176
2 Engineering, Electrical & Electronic 11011 73% 0% 499
3 Computer Science, Hardware & Architecture 7808 19% 0% 131
4 Physics, Applied 2151 37% 0% 253
5 Physics, Condensed Matter 1832 28% 0% 192
6 Operations Research & Management Science 907 9% 0% 59
7 Nanoscience & Nanotechnology 527 10% 0% 71
8 Engineering, Industrial 510 5% 0% 34
9 Computer Science, Interdisciplinary Applications 425 7% 0% 50
10 Computer Science, Software Engineering 336 6% 0% 38

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 DEFECT REDUCT TECHNOL 138633 0% 100% 3
2 ADV TEST CHIP 92422 0% 100% 2
3 YIELD ENGN 92422 0% 100% 2
4 INTEGRATED CIRCUITS DESIGN TEST 51984 0% 38% 3
5 ADM OPERAT STRATEG INITIAT 46211 0% 100% 1
6 ADV CHIP TESTING 46211 0% 100% 1
7 ADV DFT TEAM 46211 0% 100% 1
8 ADV TECHNOL INVESTMENT CO 46211 0% 100% 1
9 ALFRED P SLOAN MANAGEMENT MANAGEMENT SCI 46211 0% 100% 1
10 ATIC KHALIFA SEMICOND 46211 0% 100% 1

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING 582844 21% 9% 142
2 MICRO 21250 1% 5% 9
3 SOLID STATE TECHNOLOGY 20849 4% 2% 29
4 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 15602 6% 1% 41
5 IEEE DESIGN & TEST OF COMPUTERS 15134 3% 2% 18
6 MICROELECTRONICS RELIABILITY 7643 5% 0% 35
7 ELECTRONICSWEEK 6370 0% 7% 2
8 IEEE INTERNATIONAL SOLID STATE CIRCUITS CONFERENCE 3955 0% 3% 3
9 IBM JOURNAL OF RESEARCH AND DEVELOPMENT 3907 2% 1% 13
10 IEEE TRANSACTIONS ON COMPUTERS 3123 3% 0% 19

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 CRITICAL AREA 863774 4% 69% 27 Search CRITICAL+AREA Search CRITICAL+AREA
2 WAFER MAP 399390 2% 79% 11 Search WAFER+MAP Search WAFER+MAP
3 YIELD MODEL 354254 3% 33% 23 Search YIELD+MODEL Search YIELD+MODEL
4 KILL RATIO 283041 1% 88% 7 Search KILL+RATIO Search KILL+RATIO
5 CRITICAL AREA ANALYSIS 192544 1% 83% 5 Search CRITICAL+AREA+ANALYSIS Search CRITICAL+AREA+ANALYSIS
6 SEMICONDUCTOR YIELD 192544 1% 83% 5 Search SEMICONDUCTOR+YIELD Search SEMICONDUCTOR+YIELD
7 WAFER BIN MAP 184844 1% 100% 4 Search WAFER+BIN+MAP Search WAFER+BIN+MAP
8 DEFECT DENSITY DISTRIBUTION 138633 0% 100% 3 Search DEFECT+DENSITY+DISTRIBUTION Search DEFECT+DENSITY+DISTRIBUTION
9 SPATIAL DEFECTS 138633 0% 100% 3 Search SPATIAL+DEFECTS Search SPATIAL+DEFECTS
10 YIELD LEARNING 127962 1% 46% 6 Search YIELD+LEARNING Search YIELD+LEARNING

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 25320 CATASTROPHIC FAULT PATTERNS//DEGRADABLE VLSI ARRAY//RECONFIGURATION
2 22929 IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY//THERMAL ENGN TECHNOL//IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING
3 17829 BRIDGING FAULTS//FAULT SIMULATION//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
4 10278 MARCH TEST//MEMORY TESTING//IEEE JOURNAL OF SOLID-STATE CIRCUITS
5 30175 CINIS GRP//INVERTED BETA LOSS FUNCTION//ADVANCE PRODUCT QUALITY PLANNING
6 24386 BURN IN//OPTIMAL BURN IN//BATHTUB SHAPED FAILURE RATE
7 12768 WAFER FABRICATION//IND ENGN SYST MANAGEMENT//SEMICONDUCTOR MANUFACTURING
8 14047 RUN TO RUN CONTROL//VIRTUAL METROLOGY//IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
9 32746 BYTE ERROR CORRECTING DETECTING CODES//CHOICE OF OVERALL TRANSFER FUNCTION//COMPUTER MEMORY SYSTEMS
10 13095 CIRCUIT SIZING//ANALOG PLACEMENT//ANALOG CIRCUIT SYNTHESIS

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