Class information for:
Level 1: SRAM//PROCESS VARIATION//STATIC RANDOM ACCESS MEMORY SRAM

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
12 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, INFORMATION SYSTEMS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE 1181119
295 3       COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 41956
1108 2             IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS//COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//PROCESS VARIATION 10046
1649 1                   SRAM//PROCESS VARIATION//STATIC RANDOM ACCESS MEMORY SRAM 2577

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 SRAM authKW 1478028 11% 44% 274
2 PROCESS VARIATION authKW 1208861 10% 40% 246
3 STATIC RANDOM ACCESS MEMORY SRAM authKW 481518 3% 55% 71
4 POWER GATING authKW 471367 3% 48% 80
5 LEAKAGE POWER authKW 361058 2% 48% 61
6 STATIC NOISE MARGIN authKW 354383 2% 71% 41
7 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS journal 348882 12% 9% 322
8 MTCMOS authKW 335745 1% 89% 31
9 LOW POWER authKW 253814 10% 8% 255
10 DEVICE MODELLING GRP address 235173 2% 42% 46

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Computer Science, Hardware & Architecture 93297 34% 1% 874
2 Engineering, Electrical & Electronic 58979 87% 0% 2230
3 Physics, Applied 2335 22% 0% 555
4 Computer Science, Software Engineering 932 5% 0% 125
5 Nanoscience & Nanotechnology 924 7% 0% 192
6 Computer Science, Interdisciplinary Applications 899 6% 0% 146
7 Computer Science, Information Systems 506 4% 0% 110
8 Engineering, Manufacturing 369 2% 0% 61
9 Computer Science, Theory & Methods 353 4% 0% 100
10 Physics, Condensed Matter 163 6% 0% 165

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 DEVICE MODELLING GRP 235173 2% 42% 46
2 PARALLEL SCI COMP 92980 1% 45% 17
3 DEVICE MODELING GRP 79876 1% 47% 14
4 ROBUST TRANSISTOR PROGRAM 61141 0% 100% 5
5 ADV DESIGN FRAMEWORK DEV 48913 0% 100% 4
6 NSI PROJECT 48913 0% 100% 4
7 CIRCUITS 45277 0% 37% 10
8 LOW POWER CIRCUITS SYST 36685 0% 100% 3
9 CIRCUIT 32590 0% 22% 12
10 COMMUN COMP ENGN 29903 1% 9% 26

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 348882 12% 9% 322
2 IEEE JOURNAL OF SOLID-STATE CIRCUITS 153065 13% 4% 325
3 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 47431 5% 3% 139
4 INTEGRATION-THE VLSI JOURNAL 32304 2% 5% 53
5 IEEE TRANSACTIONS ON ELECTRON DEVICES 28498 7% 1% 192
6 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING 24752 2% 4% 57
7 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS 24079 2% 5% 40
8 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS 23037 3% 2% 89
9 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS 19806 4% 2% 95
10 MICROELECTRONICS JOURNAL 15590 3% 2% 71

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 SRAM 1478028 11% 44% 274 Search SRAM Search SRAM
2 PROCESS VARIATION 1208861 10% 40% 246 Search PROCESS+VARIATION Search PROCESS+VARIATION
3 STATIC RANDOM ACCESS MEMORY SRAM 481518 3% 55% 71 Search STATIC+RANDOM+ACCESS+MEMORY+SRAM Search STATIC+RANDOM+ACCESS+MEMORY+SRAM
4 POWER GATING 471367 3% 48% 80 Search POWER+GATING Search POWER+GATING
5 LEAKAGE POWER 361058 2% 48% 61 Search LEAKAGE+POWER Search LEAKAGE+POWER
6 STATIC NOISE MARGIN 354383 2% 71% 41 Search STATIC+NOISE+MARGIN Search STATIC+NOISE+MARGIN
7 MTCMOS 335745 1% 89% 31 Search MTCMOS Search MTCMOS
8 LOW POWER 253814 10% 8% 255 Search LOW+POWER Search LOW+POWER
9 SUBTHRESHOLD LEAKAGE 224770 1% 74% 25 Search SUBTHRESHOLD+LEAKAGE Search SUBTHRESHOLD+LEAKAGE
10 RANDOM DOPANT FLUCTUATION 218785 1% 62% 29 Search RANDOM+DOPANT+FLUCTUATION Search RANDOM+DOPANT+FLUCTUATION

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 12845 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI//NEGATIVE BIAS TEMPERATURE INSTABILITY//NBTI
2 15910 CLOCK TREE//CLOCK SKEW//CLOCK DISTRIBUTION
3 6833 BUFFER INSERTION//INTERCONNECT//GATE SIZING
4 16759 SUBSTRATE NOISE//SUBSTRATE COUPLING//POWER SUPPLY NOISE
5 37504 SCHMITT TRIGGER//COUPLED METHOD CM//1D BJT
6 31805 ADIABATIC CIRCUIT//ADIABATIC LOGIC//ADIABATIC CHARGING
7 38433 VERTICAL MOSFET//BACK BIAS EFFECT//1R READ 1W WRITE 8T TRANSISTOR STATIC RANDOM
8 10278 MARCH TEST//MEMORY TESTING//IEEE JOURNAL OF SOLID-STATE CIRCUITS
9 14758 POWER ESTIMATION//SWITCHING ACTIVITY//LOW POWER DESIGN
10 432 FINFET//SHORT CHANNEL EFFECTS//DOUBLE GATE MOSFET

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