Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
521 | 3 | SILICON CARBIDE//4H SIC//SIC | 21253 |
1718 | 2 | IGBT//LDMOS//POWER MOSFET | 6942 |
5559 | 1 | IGBT//INSULATED GATE BIPOLAR TRANSISTOR IGBT//IEEE TRANSACTIONS ON POWER ELECTRONICS | 1637 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | IGBT | authKW | 754251 | 6% | 43% | 92 |
2 | INSULATED GATE BIPOLAR TRANSISTOR IGBT | authKW | 652195 | 4% | 47% | 72 |
3 | IEEE TRANSACTIONS ON POWER ELECTRONICS | journal | 378896 | 23% | 5% | 378 |
4 | INSULATED GATE BIPOLAR TRANSISTORS IGBTS | authKW | 353211 | 2% | 54% | 34 |
5 | POWER SEMICONDUCTOR DEVICES | authKW | 282667 | 4% | 25% | 59 |
6 | SIC MOSFET | authKW | 277196 | 1% | 60% | 24 |
7 | POWER MODULE | authKW | 270686 | 2% | 47% | 30 |
8 | INSULATED GATE BIPOLAR TRANSISTORS | authKW | 261671 | 3% | 32% | 43 |
9 | MICROELECTRONICS RELIABILITY | journal | 218501 | 18% | 4% | 289 |
10 | DYNAMIC AVALANCHE | authKW | 216892 | 1% | 87% | 13 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 39208 | 88% | 0% | 1448 |
2 | Nanoscience & Nanotechnology | 5410 | 20% | 0% | 333 |
3 | Physics, Applied | 4092 | 33% | 0% | 547 |
4 | Engineering, General | 1733 | 8% | 0% | 136 |
5 | Automation & Control Systems | 253 | 3% | 0% | 49 |
6 | Instruments & Instrumentation | 215 | 4% | 0% | 73 |
7 | Engineering, Manufacturing | 83 | 2% | 0% | 25 |
8 | Energy & Fuels | 39 | 3% | 0% | 42 |
9 | Physics, Condensed Matter | 34 | 5% | 0% | 77 |
10 | GREEN & SUSTAINABLE SCIENCE & TECHNOLOGY | 23 | 1% | 0% | 11 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | RELIABLE POWER ELECT | 112002 | 0% | 73% | 8 |
2 | POWER ELECT SYST | 75492 | 3% | 9% | 46 |
3 | ELECT ELECT INFORMAT ENG | 67372 | 0% | 50% | 7 |
4 | CHAIR POWER ELECT EMC | 57753 | 0% | 100% | 3 |
5 | ELECT VEHICLE POWER ELECT GRP VEEP | 57753 | 0% | 100% | 3 |
6 | UR03ES05 | 57753 | 0% | 100% | 3 |
7 | ELECT ENERGY CONVERS E2C | 57747 | 0% | 50% | 6 |
8 | ELEKTROPHYS | 51334 | 0% | 67% | 4 |
9 | RELIABLE POWER ELECT CORPE | 48123 | 0% | 50% | 5 |
10 | CHAIR POWER ELECT | 41057 | 0% | 27% | 8 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON POWER ELECTRONICS | 378896 | 23% | 5% | 378 |
2 | MICROELECTRONICS RELIABILITY | 218501 | 18% | 4% | 289 |
3 | IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS | 44534 | 2% | 7% | 34 |
4 | IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS | 37144 | 7% | 2% | 121 |
5 | IET POWER ELECTRONICS | 14301 | 2% | 2% | 36 |
6 | JOURNAL OF POWER ELECTRONICS | 10470 | 2% | 2% | 26 |
7 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 10032 | 6% | 1% | 91 |
8 | IEEE INDUSTRIAL ELECTRONICS MAGAZINE | 9609 | 1% | 6% | 9 |
9 | SOLID-STATE ELECTRONICS | 6184 | 3% | 1% | 57 |
10 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 6135 | 1% | 2% | 19 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |