Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 521 | 3 | SILICON CARBIDE//4H SIC//SIC | 21253 |
| 3941 | 2 | NONEQUILIBRIUM CHARGE CARRIERS//REVERSELY SWITCHED DYNISTOR RSD//NONEQUILIBRIUM CARRIERS | 879 |
| 19557 | 1 | REVERSELY SWITCHED DYNISTOR RSD//POWER SEMICONDUCTOR DIODE SWITCHES//POWER SEMICOND DEVICES | 524 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | REVERSELY SWITCHED DYNISTOR RSD | authKW | 368389 | 1% | 88% | 7 |
| 2 | POWER SEMICONDUCTOR DIODE SWITCHES | authKW | 250604 | 1% | 83% | 5 |
| 3 | POWER SEMICOND DEVICES | address | 240582 | 1% | 100% | 4 |
| 4 | CHAIR ELECT DR | address | 180436 | 1% | 100% | 3 |
| 5 | DRIFT STEP RECOVERY DIODE DSRD | authKW | 180436 | 1% | 100% | 3 |
| 6 | GATE TURN OFF THYRISTOR | authKW | 140330 | 1% | 33% | 7 |
| 7 | DI DT | authKW | 125297 | 1% | 42% | 5 |
| 8 | DELAYED BREAKDOWN DIODE | authKW | 120291 | 0% | 100% | 2 |
| 9 | DRIFT STEP RECOVERY DIODE | authKW | 120291 | 0% | 100% | 2 |
| 10 | DYNISTOR | authKW | 120291 | 0% | 100% | 2 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 1917 | 32% | 0% | 170 |
| 2 | Physics, Applied | 1608 | 37% | 0% | 192 |
| 3 | Engineering, Electrical & Electronic | 1355 | 31% | 0% | 163 |
| 4 | Engineering, General | 1297 | 12% | 0% | 65 |
| 5 | Instruments & Instrumentation | 1051 | 15% | 0% | 77 |
| 6 | Physics, Fluids & Plasmas | 379 | 7% | 0% | 37 |
| 7 | Telecommunications | 49 | 3% | 0% | 17 |
| 8 | Materials Science, Multidisciplinary | 34 | 9% | 0% | 49 |
| 9 | Materials Science, Characterization, Testing | 33 | 1% | 0% | 6 |
| 10 | Materials Science, Coatings & Films | 15 | 2% | 0% | 9 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | POWER SEMICOND DEVICES | 240582 | 1% | 100% | 4 |
| 2 | CHAIR ELECT DR | 180436 | 1% | 100% | 3 |
| 3 | PHYS TECH HIGH | 120291 | 0% | 100% | 2 |
| 4 | STATE INTENSE PULSED RADIAT FIELD SIMULAT | 120291 | 0% | 100% | 2 |
| 5 | AMSRL SE RL | 96228 | 1% | 40% | 4 |
| 6 | CHAIR ELECT DRIVES | 80193 | 0% | 67% | 2 |
| 7 | AFRLDE | 60145 | 0% | 100% | 1 |
| 8 | AMSRDARLSEDP | 60145 | 0% | 100% | 1 |
| 9 | BERKELEY ASSOCIATES | 60145 | 0% | 100% | 1 |
| 10 | CII 6017 | 60145 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 54506 | 12% | 1% | 61 |
| 2 | SEMICONDUCTORS | 30130 | 11% | 1% | 59 |
| 3 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 11713 | 6% | 1% | 33 |
| 4 | SOLID-STATE ELECTRONICS | 11635 | 8% | 0% | 44 |
| 5 | TECHNICAL PHYSICS LETTERS | 6549 | 5% | 0% | 27 |
| 6 | IEEE TRANSACTIONS ON PLASMA SCIENCE | 6518 | 6% | 0% | 33 |
| 7 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 5751 | 5% | 0% | 28 |
| 8 | TECHNICAL PHYSICS | 4542 | 4% | 0% | 21 |
| 9 | RADIOTEKHNIKA I ELEKTRONIKA | 3079 | 3% | 0% | 15 |
| 10 | ZHURNAL TEKHNICHESKOI FIZIKI | 1917 | 3% | 0% | 14 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |