Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
553 | 3 | BETA FESI2//SILICIDES//ERBIUM | 18376 |
685 | 2 | BETA FESI2//SILICIDES//SERIES RESISTANCE | 13508 |
19252 | 1 | PTSI//LASER MOL BEAM EPITAXY//INTERNAL PHOTOEMISSION EFFECT | 537 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | PTSI | authKW | 388046 | 3% | 37% | 18 |
2 | LASER MOL BEAM EPITAXY | address | 359471 | 1% | 88% | 7 |
3 | INTERNAL PHOTOEMISSION EFFECT | authKW | 234758 | 1% | 100% | 4 |
4 | IRIDIUM SILICIDES | authKW | 132050 | 1% | 75% | 3 |
5 | SCHOTTKY PHOTODETECTORS | authKW | 132050 | 1% | 75% | 3 |
6 | IRSI POLYCRYSTALLINE | authKW | 117379 | 0% | 100% | 2 |
7 | MOLECULAR BEAM EPITAXY SYSTEM | authKW | 117379 | 0% | 100% | 2 |
8 | PTSI SCHOTTKY BARRIER DETECTOR SBD | authKW | 117379 | 0% | 100% | 2 |
9 | SCHOTTKY BARRIER DETECTOR SBD | authKW | 117379 | 0% | 100% | 2 |
10 | PLATINUM SILICIDE | authKW | 106500 | 1% | 26% | 7 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 3890 | 54% | 0% | 292 |
2 | Optics | 1116 | 20% | 0% | 107 |
3 | Materials Science, Coatings & Films | 727 | 9% | 0% | 47 |
4 | Physics, Condensed Matter | 725 | 21% | 0% | 111 |
5 | Engineering, Electrical & Electronic | 491 | 20% | 0% | 106 |
6 | Materials Science, Multidisciplinary | 416 | 22% | 0% | 119 |
7 | Instruments & Instrumentation | 123 | 6% | 0% | 30 |
8 | Spectroscopy | 77 | 4% | 0% | 21 |
9 | Nanoscience & Nanotechnology | 48 | 4% | 0% | 23 |
10 | Microscopy | 31 | 1% | 0% | 5 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | LASER MOL BEAM EPITAXY | 359471 | 1% | 88% | 7 |
2 | PHYS TECHNOL LOW DIMENS STRUCT | 78251 | 0% | 67% | 2 |
3 | MICROELECT DEVICES | 66022 | 1% | 38% | 3 |
4 | GRP RECH MAT COMPOSANTS MICROSTRUCT | 58689 | 0% | 100% | 1 |
5 | IEMNASEN | 58689 | 0% | 100% | 1 |
6 | INTERETAB | 58689 | 0% | 100% | 1 |
7 | IST MICROELETTRON MICROSISTEMI SEZ | 58689 | 0% | 100% | 1 |
8 | LS ANGEW PHYS | 58689 | 0% | 100% | 1 |
9 | LS KRISTALLOG | 58689 | 0% | 100% | 1 |
10 | LS MIKROCHARAKTERISIERUNG | 58689 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 3125 | 3% | 0% | 17 |
2 | RCA REVIEW | 2745 | 1% | 2% | 3 |
3 | QIRT JOURNAL | 2094 | 0% | 4% | 1 |
4 | INFRARED PHYSICS | 2039 | 1% | 1% | 6 |
5 | JOURNAL OF APPLIED PHYSICS | 1906 | 11% | 0% | 60 |
6 | APPLIED PHYSICS LETTERS | 1361 | 10% | 0% | 52 |
7 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 1319 | 4% | 0% | 19 |
8 | THIN SOLID FILMS | 1307 | 5% | 0% | 29 |
9 | IEEE ELECTRON DEVICE LETTERS | 1047 | 2% | 0% | 13 |
10 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 837 | 2% | 0% | 9 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |