Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
1628 | 2 | HFO2//HIGH K DIELECTRICS//HIGH K | 7266 |
116 | 1 | HFO2//HIGH K DIELECTRICS//HIGH K | 4377 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | HFO2 | authKW | 832447 | 7% | 40% | 287 |
2 | HIGH K DIELECTRICS | authKW | 555593 | 5% | 33% | 231 |
3 | HIGH K | authKW | 520062 | 5% | 31% | 233 |
4 | HIGH K GATE DIELECTRICS | authKW | 461074 | 3% | 52% | 124 |
5 | METAL GATE | authKW | 398482 | 3% | 39% | 141 |
6 | HAFNIUM OXIDE | authKW | 304460 | 3% | 36% | 116 |
7 | HAFNIUM COMPOUNDS | authKW | 245974 | 2% | 37% | 93 |
8 | HAFNIUM SILICATE | authKW | 185920 | 1% | 70% | 37 |
9 | GATE DIELECTRIC | authKW | 160666 | 2% | 24% | 95 |
10 | HAFNIUM DIOXIDE | authKW | 157117 | 1% | 53% | 41 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 51082 | 68% | 0% | 2979 |
2 | Materials Science, Coatings & Films | 20533 | 16% | 0% | 694 |
3 | Engineering, Electrical & Electronic | 6596 | 24% | 0% | 1071 |
4 | Nanoscience & Nanotechnology | 6048 | 14% | 0% | 593 |
5 | Physics, Condensed Matter | 5662 | 20% | 0% | 888 |
6 | Materials Science, Multidisciplinary | 3445 | 22% | 0% | 976 |
7 | Electrochemistry | 1216 | 5% | 0% | 224 |
8 | Optics | 719 | 7% | 0% | 296 |
9 | Materials Science, Ceramics | 374 | 2% | 0% | 96 |
10 | Chemistry, Physical | 96 | 7% | 0% | 291 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | EXPT PHYS TECHNOL | 91404 | 1% | 37% | 34 |
2 | SILICON NANO DEVICE | 83992 | 1% | 20% | 58 |
3 | ANHUI NANOMAT NANOSTRUCT | 83701 | 1% | 20% | 58 |
4 | RADIAT DETECT MAT DEVICES | 81277 | 1% | 47% | 24 |
5 | LONDON NANOTECHNOL ELECT ELECT ENGN | 64788 | 0% | 100% | 9 |
6 | MIRAI ASET | 51189 | 0% | 89% | 8 |
7 | ADV PROC DEV TEAM | 47108 | 0% | 55% | 12 |
8 | TEL TECHNOL | 45499 | 0% | 45% | 14 |
9 | MIRAI | 44954 | 1% | 25% | 25 |
10 | MDM | 38485 | 1% | 12% | 45 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MICROELECTRONIC ENGINEERING | 50406 | 6% | 3% | 270 |
2 | APPLIED PHYSICS LETTERS | 35086 | 17% | 1% | 742 |
3 | IEEE ELECTRON DEVICE LETTERS | 21382 | 4% | 2% | 167 |
4 | CHEMICAL VAPOR DEPOSITION | 18010 | 1% | 5% | 50 |
5 | ELECTROCHEMICAL AND SOLID STATE LETTERS | 14741 | 2% | 2% | 94 |
6 | JOURNAL OF APPLIED PHYSICS | 8768 | 8% | 0% | 371 |
7 | THIN SOLID FILMS | 7110 | 4% | 1% | 194 |
8 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 7038 | 3% | 1% | 130 |
9 | MICROELECTRONICS RELIABILITY | 6593 | 2% | 1% | 83 |
10 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 6509 | 4% | 1% | 170 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | HFO2 | 832447 | 7% | 40% | 287 | Search HFO2 | Search HFO2 |
2 | HIGH K DIELECTRICS | 555593 | 5% | 33% | 231 | Search HIGH+K+DIELECTRICS | Search HIGH+K+DIELECTRICS |
3 | HIGH K | 520062 | 5% | 31% | 233 | Search HIGH+K | Search HIGH+K |
4 | HIGH K GATE DIELECTRICS | 461074 | 3% | 52% | 124 | Search HIGH+K+GATE+DIELECTRICS | Search HIGH+K+GATE+DIELECTRICS |
5 | METAL GATE | 398482 | 3% | 39% | 141 | Search METAL+GATE | Search METAL+GATE |
6 | HAFNIUM OXIDE | 304460 | 3% | 36% | 116 | Search HAFNIUM+OXIDE | Search HAFNIUM+OXIDE |
7 | HAFNIUM COMPOUNDS | 245974 | 2% | 37% | 93 | Search HAFNIUM+COMPOUNDS | Search HAFNIUM+COMPOUNDS |
8 | HAFNIUM SILICATE | 185920 | 1% | 70% | 37 | Search HAFNIUM+SILICATE | Search HAFNIUM+SILICATE |
9 | GATE DIELECTRIC | 160666 | 2% | 24% | 95 | Search GATE+DIELECTRIC | Search GATE+DIELECTRIC |
10 | HAFNIUM DIOXIDE | 157117 | 1% | 53% | 41 | Search HAFNIUM+DIOXIDE | Search HAFNIUM+DIOXIDE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |