Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
375 | 3 | MICROSCOPY//ULTRAMICROSCOPY//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 34629 |
824 | 2 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY | 12082 |
25073 | 1 | EMCD//ALCHEMI//ELECTRON CHANNELING | 315 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | EMCD | authKW | 544729 | 2% | 78% | 7 |
2 | ALCHEMI | authKW | 435001 | 3% | 43% | 10 |
3 | ELECTRON CHANNELING | authKW | 227377 | 3% | 23% | 10 |
4 | ELECTRON MAGNETIC CIRCULAR DICHROISM | authKW | 225117 | 1% | 75% | 3 |
5 | ELE ON NANOSCOPY SECTCHIKUSA KU | address | 200106 | 1% | 100% | 2 |
6 | SITE SPECIFIC EELS | authKW | 200106 | 1% | 100% | 2 |
7 | DYNAMIC FORM FACTOR | authKW | 133402 | 1% | 67% | 2 |
8 | INTERSECTING KIKUCHI LINE METHOD | authKW | 133402 | 1% | 67% | 2 |
9 | ELECTRON ENERGY LOSS SPECTROMETRY | authKW | 133394 | 2% | 22% | 6 |
10 | ADV MEASUREMENT TECHNOL | address | 123136 | 1% | 31% | 4 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Microscopy | 43720 | 40% | 0% | 126 |
2 | Metallurgy & Metallurgical Engineering | 624 | 16% | 0% | 49 |
3 | Physics, Condensed Matter | 584 | 24% | 0% | 75 |
4 | Materials Science, Multidisciplinary | 300 | 24% | 0% | 76 |
5 | Physics, Applied | 248 | 20% | 0% | 64 |
6 | Physics, Multidisciplinary | 180 | 12% | 0% | 39 |
7 | Crystallography | 146 | 6% | 0% | 20 |
8 | Mineralogy | 87 | 3% | 0% | 8 |
9 | Materials Science, Characterization, Testing | 62 | 2% | 0% | 6 |
10 | Instruments & Instrumentation | 12 | 3% | 0% | 9 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | ELE ON NANOSCOPY SECTCHIKUSA KU | 200106 | 1% | 100% | 2 |
2 | ADV MEASUREMENT TECHNOL | 123136 | 1% | 31% | 4 |
3 | UNIV SERV ELE ON MICROSCOPY | 112556 | 1% | 38% | 3 |
4 | ADV MEASUREMENT TECHNOL CHIKUSA KU | 100053 | 0% | 100% | 1 |
5 | CIME SB | 100053 | 0% | 100% | 1 |
6 | ELE ON NANOSCOPY SECT | 100053 | 0% | 100% | 1 |
7 | MICROSCOPI AVANZADAS LMA | 100053 | 0% | 100% | 1 |
8 | SB CIME STN | 100053 | 0% | 100% | 1 |
9 | UNIV SERV EINRICHTUNG ELEKTRONENMIKROSKOPIE | 100053 | 0% | 100% | 1 |
10 | VEDECOM | 100051 | 1% | 50% | 2 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | ULTRAMICROSCOPY | 72024 | 20% | 1% | 64 |
2 | PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 9934 | 6% | 1% | 19 |
3 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 8607 | 9% | 0% | 29 |
4 | JOURNAL OF METALS | 4005 | 2% | 1% | 5 |
5 | MICROSCOPY | 3379 | 1% | 1% | 3 |
6 | JOURNAL OF ELECTRON MICROSCOPY | 2633 | 2% | 0% | 7 |
7 | JOURNAL OF MICROSCOPY | 2237 | 3% | 0% | 8 |
8 | MICRON | 1899 | 2% | 0% | 7 |
9 | PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1521 | 2% | 0% | 7 |
10 | ACTA CRYSTALLOGRAPHICA SECTION A | 1171 | 2% | 0% | 5 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |