Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 375 | 3 | MICROSCOPY//ULTRAMICROSCOPY//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 34629 |
| 824 | 2 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY | 12082 |
| 25470 | 1 | CADMIUM YELLOW//QUANTITATIVE X RAY MAPPING//ABSORPTION CORRECTION | 304 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | CADMIUM YELLOW | authKW | 311020 | 1% | 100% | 3 |
| 2 | QUANTITATIVE X RAY MAPPING | authKW | 207346 | 1% | 100% | 2 |
| 3 | ABSORPTION CORRECTION | authKW | 155501 | 2% | 25% | 6 |
| 4 | ANALYTICAL ELECTRON MICROSCOPY | authKW | 105289 | 5% | 6% | 16 |
| 5 | ATMOSPHERIC THIN WINDOW | authKW | 103673 | 0% | 100% | 1 |
| 6 | ATOMIC LEVEL DETECTION | authKW | 103673 | 0% | 100% | 1 |
| 7 | AUTOMATED ELECTRON PROBE MICROANALYZER PARTICLE ANALYSIS | authKW | 103673 | 0% | 100% | 1 |
| 8 | BACKSCATTERING COEFFICIENT OF THIN FILMS | authKW | 103673 | 0% | 100% | 1 |
| 9 | BICMOS TRANSISTOR | authKW | 103673 | 0% | 100% | 1 |
| 10 | BREMSSTRAHLUNG HOLE COUNTS | authKW | 103673 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Microscopy | 69530 | 51% | 0% | 156 |
| 2 | Metallurgy & Metallurgical Engineering | 354 | 12% | 0% | 37 |
| 3 | Physics, Multidisciplinary | 212 | 13% | 0% | 41 |
| 4 | Materials Science, Multidisciplinary | 184 | 20% | 0% | 61 |
| 5 | Spectroscopy | 164 | 7% | 0% | 21 |
| 6 | Chemistry, Analytical | 61 | 8% | 0% | 23 |
| 7 | Physics, Condensed Matter | 18 | 6% | 0% | 19 |
| 8 | Instruments & Instrumentation | 13 | 3% | 0% | 9 |
| 9 | Materials Science, Ceramics | 13 | 2% | 0% | 5 |
| 10 | Crystallography | 4 | 2% | 0% | 5 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | ENEL DSR CRTN | 103673 | 0% | 100% | 1 |
| 2 | LEHRSTUHL ANALYT MINERAL | 103673 | 0% | 100% | 1 |
| 3 | MAT PERFORMANCE HARWELL | 103673 | 0% | 100% | 1 |
| 4 | MKT PLICAT GRP | 103673 | 0% | 100% | 1 |
| 5 | SEKT EXPT VITEORETINALE CHIRURG | 103673 | 0% | 100% | 1 |
| 6 | WHITAKER 5 | 69113 | 1% | 33% | 2 |
| 7 | HIGH VOLTAGE ELE ON MICROSCOPY | 66636 | 2% | 11% | 6 |
| 8 | ENGN 36 | 51834 | 1% | 25% | 2 |
| 9 | MECAN PHYS INTER ES | 25917 | 0% | 25% | 1 |
| 10 | CNRSURA 1884 | 17277 | 0% | 17% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | ULTRAMICROSCOPY | 43727 | 16% | 1% | 49 |
| 2 | JOURNAL OF MICROSCOPY-OXFORD | 30393 | 9% | 1% | 26 |
| 3 | MICROSCOPY AND MICROANALYSIS | 14299 | 5% | 1% | 16 |
| 4 | JOURNAL OF MICROSCOPY | 13131 | 6% | 1% | 19 |
| 5 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 8921 | 10% | 0% | 29 |
| 6 | JOURNAL OF ELECTRON MICROSCOPY | 5578 | 3% | 1% | 10 |
| 7 | MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 4392 | 1% | 1% | 4 |
| 8 | JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 3598 | 1% | 1% | 4 |
| 9 | MIKROCHIMICA ACTA | 3528 | 3% | 0% | 10 |
| 10 | X-RAY SPECTROMETRY | 3165 | 3% | 0% | 8 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |