Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
375 | 3 | MICROSCOPY//ULTRAMICROSCOPY//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 34629 |
3398 | 2 | SURFACE EMISSION RATE//MEAN PENETRATION DEPTH//ORDINARY BREMSSTRAHLUNG | 1726 |
12091 | 1 | ELECTRON PROBE MICROANALYSIS//ATOMIC TARGETS//CHUDAKOV EFFECT | 960 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | ELECTRON PROBE MICROANALYSIS | authKW | 153594 | 4% | 11% | 43 |
2 | ATOMIC TARGETS | authKW | 131314 | 0% | 100% | 4 |
3 | CHUDAKOV EFFECT | authKW | 131314 | 0% | 100% | 4 |
4 | FU 160 | address | 131314 | 0% | 100% | 4 |
5 | OPEN RADIAT PHYS TECHNOL | address | 117242 | 1% | 71% | 5 |
6 | X-RAY SPECTROMETRY | journal | 113541 | 9% | 4% | 85 |
7 | EPMA | authKW | 106592 | 5% | 7% | 48 |
8 | ATOMIC INNER SHELL IONIZATION | authKW | 105050 | 0% | 80% | 4 |
9 | QUANTITATIVE ELECTRON PROBE MICROANALYSIS | authKW | 102585 | 1% | 63% | 5 |
10 | ELECTRON IMPACT K SHELL IONIZATION | authKW | 98485 | 0% | 100% | 3 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Microscopy | 19345 | 15% | 0% | 147 |
2 | Spectroscopy | 3653 | 17% | 0% | 165 |
3 | Physics, Atomic, Molecular & Chemical | 1788 | 18% | 0% | 171 |
4 | Instruments & Instrumentation | 1217 | 12% | 0% | 114 |
5 | Chemistry, Analytical | 1141 | 16% | 0% | 153 |
6 | Nuclear Science & Technology | 886 | 9% | 0% | 91 |
7 | Physics, Multidisciplinary | 466 | 12% | 0% | 111 |
8 | Physics, Nuclear | 421 | 7% | 0% | 65 |
9 | Optics | 294 | 9% | 0% | 83 |
10 | Physics, Applied | 195 | 12% | 0% | 116 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | FU 160 | 131314 | 0% | 100% | 4 |
2 | OPEN RADIAT PHYS TECHNOL | 117242 | 1% | 71% | 5 |
3 | SGCSLMAC | 91186 | 1% | 56% | 5 |
4 | RADIAT PHYS TECHNOL | 90879 | 4% | 7% | 39 |
5 | FIS ECM | 84161 | 1% | 26% | 10 |
6 | FIS ECM ICC | 47745 | 0% | 36% | 4 |
7 | FR 2035 | 43770 | 0% | 67% | 2 |
8 | FIS SOLIDO | 36211 | 1% | 14% | 8 |
9 | MATEMAT ASTRON FIS | 34247 | 4% | 3% | 34 |
10 | CANMET PHYS MET | 32828 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | X-RAY SPECTROMETRY | 113541 | 9% | 4% | 85 |
2 | MIKROCHIMICA ACTA | 66462 | 8% | 3% | 77 |
3 | MICROSCOPY AND MICROANALYSIS | 34232 | 5% | 2% | 44 |
4 | SCANNING | 30711 | 4% | 2% | 40 |
5 | JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 20592 | 2% | 4% | 17 |
6 | MICROCHIMICA ACTA | 3891 | 2% | 1% | 20 |
7 | RADIATION PHYSICS AND CHEMISTRY | 2599 | 3% | 0% | 28 |
8 | MICROBEAM ANALYSIS | 2523 | 0% | 8% | 1 |
9 | SURFACE AND INTERFACE ANALYSIS | 2300 | 2% | 0% | 22 |
10 | JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2271 | 4% | 0% | 34 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |