Class information for:
Level 1: LAMACOP//SECONDARY ELECTRON EMISSION//DOPANT CONTRAST

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
375 3       MICROSCOPY//ULTRAMICROSCOPY//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 34629
2570 2             SCANNING//SCANDATE CATHODE//MICROSCOPY 3949
10511 1                   LAMACOP//SECONDARY ELECTRON EMISSION//DOPANT CONTRAST 1086

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 LAMACOP address 464295 2% 67% 24
2 SECONDARY ELECTRON EMISSION authKW 399981 7% 19% 72
3 DOPANT CONTRAST authKW 263811 1% 91% 10
4 SECONDARY ELECTRONS authKW 220210 4% 16% 47
5 CATHODE LENS authKW 206542 1% 65% 11
6 SECONDARY ELECTRON YIELD authKW 192372 2% 30% 22
7 SCANNING LOW ENERGY ELECTRON MICROSCOPY authKW 149241 1% 86% 6
8 BACKSCATTERED ELECTRONS authKW 123777 2% 18% 24
9 PROJECTION ELECTRON MICROSCOPE authKW 116078 0% 100% 4
10 VERY LOW ENERGY STEM authKW 116078 0% 100% 4

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Microscopy 39150 20% 1% 222
2 Physics, Applied 4520 42% 0% 457
3 Instruments & Instrumentation 1595 13% 0% 138
4 Nanoscience & Nanotechnology 1432 13% 0% 144
5 Engineering, Electrical & Electronic 653 17% 0% 180
6 Materials Science, Coatings & Films 468 5% 0% 56
7 Physics, Condensed Matter 362 12% 0% 125
8 Materials Science, Multidisciplinary 275 14% 0% 157
9 Spectroscopy 264 5% 0% 53
10 Physics, Multidisciplinary 211 8% 0% 87

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 LAMACOP 464295 2% 67% 24
2 DTI UMR 6107 87058 0% 100% 3
3 ELE ON EMISS SOURCE 83636 1% 41% 7
4 G PI MAT FONCT 66327 0% 57% 4
5 MAU 65292 0% 75% 3
6 ADV MASK 58039 0% 100% 2
7 LPIO EA 3254 58039 0% 100% 2
8 QUAL MANAGEMENT FAILURE ANAL 58039 0% 100% 2
9 LASSI 54976 1% 32% 6
10 SCI RUMENTS 54898 3% 6% 33

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 SCANNING 59099 5% 3% 59
2 JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS 9311 2% 2% 18
3 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 8387 6% 0% 70
4 MICROSCOPY AND MICROANALYSIS 8244 2% 1% 23
5 ULTRAMICROSCOPY 6921 3% 1% 37
6 JOURNAL OF ELECTRON MICROSCOPY 4495 2% 1% 17
7 PHILIPS JOURNAL OF RESEARCH 4244 1% 2% 7
8 INSTITUTE OF PHYSICS CONFERENCE SERIES 3189 3% 0% 33
9 MICROSCOPY 2718 0% 2% 5
10 JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 2315 2% 0% 22

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 SECONDARY ELECTRON EMISSION 399981 7% 19% 72 Search SECONDARY+ELECTRON+EMISSION Search SECONDARY+ELECTRON+EMISSION
2 DOPANT CONTRAST 263811 1% 91% 10 Search DOPANT+CONTRAST Search DOPANT+CONTRAST
3 SECONDARY ELECTRONS 220210 4% 16% 47 Search SECONDARY+ELECTRONS Search SECONDARY+ELECTRONS
4 CATHODE LENS 206542 1% 65% 11 Search CATHODE+LENS Search CATHODE+LENS
5 SECONDARY ELECTRON YIELD 192372 2% 30% 22 Search SECONDARY+ELECTRON+YIELD Search SECONDARY+ELECTRON+YIELD
6 SCANNING LOW ENERGY ELECTRON MICROSCOPY 149241 1% 86% 6 Search SCANNING+LOW+ENERGY+ELECTRON+MICROSCOPY Search SCANNING+LOW+ENERGY+ELECTRON+MICROSCOPY
7 BACKSCATTERED ELECTRONS 123777 2% 18% 24 Search BACKSCATTERED+ELECTRONS Search BACKSCATTERED+ELECTRONS
8 PROJECTION ELECTRON MICROSCOPE 116078 0% 100% 4 Search PROJECTION+ELECTRON+MICROSCOPE Search PROJECTION+ELECTRON+MICROSCOPE
9 VERY LOW ENERGY STEM 116078 0% 100% 4 Search VERY+LOW+ENERGY+STEM Search VERY+LOW+ENERGY+STEM
10 X RAY INDUCED SECONDARY ELECTRON EMISSION 116078 0% 100% 4 Search X+RAY+INDUCED+SECONDARY+ELECTRON+EMISSION Search X+RAY+INDUCED+SECONDARY+ELECTRON+EMISSION

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 15450 SCANNING//SECONDARY EMISSION NOISE//INTEGRATED CIRCUIT ADV PROC TECHNOL
2 22547 E BEAM INSPECTION//ELECTRON BEAM TESTING//NONVISUAL DEFECTS
3 21486 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE//ESEM//ENVIRONMENTAL SEM
4 17645 MULTIPACTOR//AURORA SOFTWARE TESTING SL//ELECTRON CLOUD
5 27261 DIFFERENTIAL CHARGING//CHARGE REFERENCING//DEGRADATION OF ORGANOSILANE MONOLAYER
6 14584 SPACECRAFT CHARGING//SPACECRAFT ENVIRONM INTERACT ENGN//SPACE ENVIRONMENT EFFECTS
7 12091 ELECTRON PROBE MICROANALYSIS//ATOMIC TARGETS//CHUDAKOV EFFECT
8 11199 SURFACE FLASHOVER//IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION//NON STANDARD LIGHTNING IMPULSE WAVEFORM
9 22167 SURFACE EMISSION RATE//MEAN PENETRATION DEPTH//LARGE AREA REFERENCE SOURCES
10 5372 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B//PROXIMITY EFFECT CORRECTION//ELECTRON BEAM LITHOGRAPHY

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