Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
375 | 3 | MICROSCOPY//ULTRAMICROSCOPY//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 34629 |
2570 | 2 | SCANNING//SCANDATE CATHODE//MICROSCOPY | 3949 |
10511 | 1 | LAMACOP//SECONDARY ELECTRON EMISSION//DOPANT CONTRAST | 1086 |
15450 | 1 | SCANNING//SECONDARY EMISSION NOISE//INTEGRATED CIRCUIT ADV PROC TECHNOL | 739 |
16692 | 1 | SCANDATE CATHODE//DISPENSER CATHODE//IMPREGNATED CATHODES | 666 |
20489 | 1 | PROD DESIGN TECHNOL//MAGNETIC LENS//ELECTRON GUN | 481 |
21486 | 1 | ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE//ESEM//ENVIRONMENTAL SEM | 441 |
22547 | 1 | E BEAM INSPECTION//ELECTRON BEAM TESTING//NONVISUAL DEFECTS | 399 |
33508 | 1 | PROCEEDINGS OF THE SID//BEAM SPOT DISTORTION//CCTV RECORDING SYSTEMS | 137 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | SCANNING | journal | 434583 | 8% | 18% | 305 |
2 | SCANDATE CATHODE | authKW | 239620 | 1% | 97% | 31 |
3 | MICROSCOPY | WoSSC | 194580 | 24% | 3% | 943 |
4 | BACKSCATTERED ELECTRONS | authKW | 147698 | 1% | 37% | 50 |
5 | SECONDARY ELECTRON EMISSION | authKW | 142561 | 2% | 22% | 82 |
6 | SECONDARY ELECTRONS | authKW | 142034 | 2% | 25% | 72 |
7 | DISPENSER CATHODE | authKW | 136147 | 1% | 74% | 23 |
8 | ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE | authKW | 133859 | 1% | 48% | 35 |
9 | IMPREGNATED CATHODES | authKW | 129257 | 0% | 90% | 18 |
10 | LAMACOP | address | 127649 | 1% | 67% | 24 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Microscopy | 194580 | 24% | 3% | 943 |
2 | Instruments & Instrumentation | 11447 | 17% | 0% | 690 |
3 | Physics, Applied | 10269 | 34% | 0% | 1343 |
4 | Materials Science, Coatings & Films | 3464 | 7% | 0% | 282 |
5 | Engineering, Electrical & Electronic | 2298 | 16% | 0% | 646 |
6 | Nanoscience & Nanotechnology | 2063 | 9% | 0% | 346 |
7 | COMPUTER APPLICATIONS & CYBERNETICS | 1430 | 1% | 1% | 22 |
8 | Physics, Condensed Matter | 866 | 10% | 0% | 387 |
9 | Physics, Multidisciplinary | 683 | 8% | 0% | 303 |
10 | Spectroscopy | 636 | 4% | 0% | 162 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | LAMACOP | 127649 | 1% | 67% | 24 |
2 | POLYMERS OIDS GRP | 89727 | 1% | 38% | 30 |
3 | SCI RUMENTS | 40367 | 1% | 9% | 54 |
4 | PROD DESIGN TECHNOL | 32575 | 0% | 58% | 7 |
5 | INTEGRATED CIRCUIT ADV PROC TECHNOL | 31916 | 0% | 100% | 4 |
6 | DTI UMR 6107 | 23937 | 0% | 100% | 3 |
7 | WESTERN AUSTRALIAN MICROSCOPY | 23937 | 0% | 100% | 3 |
8 | ELE ON EMISS SOURCE | 22990 | 0% | 41% | 7 |
9 | RD MICROWAVE DEVICE TECHNOL | 21275 | 0% | 67% | 4 |
10 | G PI MAT FONCT | 18234 | 0% | 57% | 4 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SCANNING | 434583 | 8% | 18% | 305 |
2 | APPLICATIONS OF SURFACE SCIENCE | 30399 | 1% | 8% | 48 |
3 | JOURNAL OF ELECTRON MICROSCOPY | 29522 | 2% | 4% | 83 |
4 | SCANNING ELECTRON MICROSCOPY | 19067 | 1% | 5% | 50 |
5 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 16009 | 5% | 1% | 185 |
6 | JOURNAL OF MICROSCOPY | 13232 | 2% | 2% | 69 |
7 | SCANNING MICROSCOPY | 12788 | 1% | 4% | 45 |
8 | PROCEEDINGS OF THE SID | 12483 | 1% | 7% | 21 |
9 | MICROSCOPY AND MICROANALYSIS | 12459 | 1% | 3% | 54 |
10 | MICRON AND MICROSCOPICA ACTA | 10403 | 0% | 8% | 17 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 2 |