Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
596 | 3 | RESISTIVE SWITCHING//MEMRISTOR//RRAM | 14780 |
2016 | 2 | FIELD EMISSION//ATOM PROBE TOMOGRAPHY//ATOM PROBE | 5881 |
1494 | 1 | FIELD EMISSION//VACUUM MICROELECTRONICS//FIELD EMITTER ARRAY | 2643 |
6788 | 1 | ATOM PROBE TOMOGRAPHY//ATOM PROBE//FIELD EVAPORATION | 1468 |
18815 | 1 | SINGLE ATOM TIP//SUR E MODIFICAT//FACETING | 558 |
20406 | 1 | FIELD ELECTRON SPECTROSCOPY//IEEE TRANSACTIONS ON ELECTRICAL INSULATION//ANALYT RMENT | 484 |
22550 | 1 | HYPERTHERMAL SURFACE IONIZATION//SURFACE IONIZATION//SUPERSONIC GC MS | 399 |
29836 | 1 | FIELD EMISSION AND FIELD IONIZATION//MOSKOVSKOE SH 34//QUIMCEQUINOR QUIM INORGAN | 195 |
33729 | 1 | AUGER TRANSISTOR//SELF CONSISTENT QUANTUM WELLS//AL SIO2 N SI | 134 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | FIELD EMISSION | authKW | 457022 | 8% | 19% | 452 |
2 | ATOM PROBE TOMOGRAPHY | authKW | 322274 | 4% | 28% | 217 |
3 | ATOM PROBE | authKW | 231923 | 2% | 37% | 117 |
4 | VACUUM MICROELECTRONICS | authKW | 198664 | 1% | 59% | 63 |
5 | FIELD EVAPORATION | authKW | 197057 | 1% | 55% | 67 |
6 | FIELD EMITTER ARRAY | authKW | 176880 | 1% | 55% | 60 |
7 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | journal | 174474 | 13% | 4% | 740 |
8 | FIELD ION MICROSCOPY | authKW | 125662 | 1% | 36% | 65 |
9 | ELECTRON FIELD EMISSION | authKW | 124111 | 1% | 29% | 80 |
10 | FIELD EMITTER | authKW | 99885 | 1% | 37% | 50 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 35020 | 50% | 0% | 2919 |
2 | Microscopy | 29016 | 8% | 1% | 449 |
3 | Nanoscience & Nanotechnology | 12024 | 16% | 0% | 955 |
4 | Materials Science, Coatings & Films | 7585 | 9% | 0% | 503 |
5 | Physics, Condensed Matter | 6067 | 18% | 0% | 1081 |
6 | Engineering, Electrical & Electronic | 5842 | 20% | 0% | 1202 |
7 | Materials Science, Multidisciplinary | 2283 | 17% | 0% | 994 |
8 | Physics, Multidisciplinary | 1800 | 10% | 0% | 563 |
9 | Chemistry, Physical | 1635 | 14% | 0% | 824 |
10 | Instruments & Instrumentation | 308 | 3% | 0% | 186 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | UMR 6634 | 98254 | 2% | 20% | 90 |
2 | GRP PHYS MAT | 63511 | 1% | 16% | 74 |
3 | AUSTRALIAN MICROSCOPY MICROANAL | 54958 | 1% | 17% | 62 |
4 | EMISS ELECT | 47642 | 0% | 68% | 13 |
5 | GPM | 44223 | 1% | 21% | 39 |
6 | FLAT PANEL DISPLAY | 41542 | 0% | 48% | 16 |
7 | SUR E MODIFICAT | 38594 | 1% | 15% | 47 |
8 | UMR CNRS 6634 | 27769 | 0% | 19% | 28 |
9 | ORION ELECT CO | 26786 | 0% | 100% | 5 |
10 | CENT MICROSTRUCT IL | 23428 | 0% | 24% | 18 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 174474 | 13% | 4% | 740 |
2 | ULTRAMICROSCOPY | 90053 | 5% | 5% | 310 |
3 | DIAMOND AND RELATED MATERIALS | 40455 | 4% | 3% | 237 |
4 | JOURNAL DE PHYSIQUE | 27997 | 4% | 2% | 224 |
5 | SURFACE SCIENCE | 13337 | 4% | 1% | 263 |
6 | MICROSCOPY AND MICROANALYSIS | 13245 | 1% | 4% | 68 |
7 | NEW DIAMOND AND FRONTIER CARBON TECHNOLOGY | 11999 | 0% | 9% | 25 |
8 | APPLIED SURFACE SCIENCE | 11676 | 5% | 1% | 287 |
9 | DIAMOND FILMS AND TECHNOLOGY | 8243 | 0% | 11% | 14 |
10 | IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 6183 | 1% | 3% | 41 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | FIELD EMISSION | 457022 | 8% | 19% | 452 | Search FIELD+EMISSION | Search FIELD+EMISSION |
2 | ATOM PROBE TOMOGRAPHY | 322274 | 4% | 28% | 217 | Search ATOM+PROBE+TOMOGRAPHY | Search ATOM+PROBE+TOMOGRAPHY |
3 | ATOM PROBE | 231923 | 2% | 37% | 117 | Search ATOM+PROBE | Search ATOM+PROBE |
4 | VACUUM MICROELECTRONICS | 198664 | 1% | 59% | 63 | Search VACUUM+MICROELECTRONICS | Search VACUUM+MICROELECTRONICS |
5 | FIELD EVAPORATION | 197057 | 1% | 55% | 67 | Search FIELD+EVAPORATION | Search FIELD+EVAPORATION |
6 | FIELD EMITTER ARRAY | 176880 | 1% | 55% | 60 | Search FIELD+EMITTER+ARRAY | Search FIELD+EMITTER+ARRAY |
7 | FIELD ION MICROSCOPY | 125662 | 1% | 36% | 65 | Search FIELD+ION+MICROSCOPY | Search FIELD+ION+MICROSCOPY |
8 | ELECTRON FIELD EMISSION | 124111 | 1% | 29% | 80 | Search ELECTRON+FIELD+EMISSION | Search ELECTRON+FIELD+EMISSION |
9 | FIELD EMITTER | 99885 | 1% | 37% | 50 | Search FIELD+EMITTER | Search FIELD+EMITTER |
10 | FIELD ELECTRON EMISSION | 71534 | 1% | 32% | 42 | Search FIELD+ELECTRON+EMISSION | Search FIELD+ELECTRON+EMISSION |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 2 |