Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 596 | 3 | RESISTIVE SWITCHING//MEMRISTOR//RRAM | 14780 |
| 2016 | 2 | FIELD EMISSION//ATOM PROBE TOMOGRAPHY//ATOM PROBE | 5881 |
| 18815 | 1 | SINGLE ATOM TIP//SUR E MODIFICAT//FACETING | 558 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | SINGLE ATOM TIP | authKW | 580940 | 2% | 86% | 12 |
| 2 | SUR E MODIFICAT | address | 407651 | 8% | 15% | 47 |
| 3 | FACETING | authKW | 341133 | 8% | 14% | 42 |
| 4 | GAS FIELD ION SOURCE | authKW | 254160 | 1% | 75% | 6 |
| 5 | EMISS ELECT | address | 190241 | 1% | 42% | 8 |
| 6 | NANOTIPS | authKW | 189650 | 3% | 22% | 15 |
| 7 | FRESNEL PROJECTION MICROSCOPE | authKW | 169442 | 1% | 100% | 3 |
| 8 | ULTRASHARP FIELD EMITTERS | authKW | 169442 | 1% | 100% | 3 |
| 9 | FIELD EMISSION SPECTROSCOPY | authKW | 169436 | 1% | 50% | 6 |
| 10 | FIELD ION MICROSCOPY | authKW | 151831 | 4% | 12% | 22 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Microscopy | 7522 | 13% | 0% | 70 |
| 2 | Physics, Condensed Matter | 1713 | 30% | 0% | 167 |
| 3 | Physics, Applied | 1338 | 33% | 0% | 183 |
| 4 | Chemistry, Physical | 803 | 27% | 0% | 151 |
| 5 | Nanoscience & Nanotechnology | 413 | 10% | 0% | 57 |
| 6 | Physics, Multidisciplinary | 375 | 13% | 0% | 74 |
| 7 | Materials Science, Coatings & Films | 370 | 6% | 0% | 35 |
| 8 | Physics, Atomic, Molecular & Chemical | 60 | 5% | 0% | 30 |
| 9 | Instruments & Instrumentation | 60 | 4% | 0% | 23 |
| 10 | Materials Science, Multidisciplinary | 28 | 9% | 0% | 49 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | SUR E MODIFICAT | 407651 | 8% | 15% | 47 |
| 2 | EMISS ELECT | 190241 | 1% | 42% | 8 |
| 3 | ULTIMATE TECHNOL NANOELECT CUTE | 112961 | 0% | 100% | 2 |
| 4 | ADV TECHNOL DEVELOPEMENT | 56481 | 0% | 100% | 1 |
| 5 | CIENCIAS C3 | 56481 | 0% | 100% | 1 |
| 6 | CNRS URA 5586 | 56481 | 0% | 100% | 1 |
| 7 | CRYOSYST MICROSYST | 56481 | 0% | 100% | 1 |
| 8 | DPM UMR | 56481 | 0% | 100% | 1 |
| 9 | EMMISS ELECT | 56481 | 0% | 100% | 1 |
| 10 | IUVSTA | 56481 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | ULTRAMICROSCOPY | 23778 | 9% | 1% | 49 |
| 2 | SURFACE SCIENCE | 8255 | 11% | 0% | 63 |
| 3 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2988 | 5% | 0% | 30 |
| 4 | PROGRESS IN SURFACE SCIENCE | 1263 | 1% | 1% | 4 |
| 5 | APPLIED SURFACE SCIENCE | 1089 | 5% | 0% | 27 |
| 6 | MICRON | 1066 | 1% | 0% | 7 |
| 7 | SURFACE REVIEW AND LETTERS | 1004 | 1% | 0% | 7 |
| 8 | MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 595 | 0% | 1% | 2 |
| 9 | APPLIED PHYSICS LETTERS | 570 | 6% | 0% | 35 |
| 10 | ACTA PHYSICA AUSTRIACA | 485 | 0% | 1% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |