Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 51 | 3 | SURFACE SCIENCE//PHYSICS, CONDENSED MATTER//SCANNING TUNNELING MICROSCOPY | 97901 |
| 767 | 2 | MOLECULAR ELECTRONICS//MOLECULAR JUNCTIONS//SINGLE MOLECULE JUNCTION | 12723 |
| 3057 | 1 | LOCAL TUNNELING BARRIER HEIGHT//I S CHARACTERISTICS//LOCAL TUNNELING BARRIER HEIGHT LBH | 2105 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | LOCAL TUNNELING BARRIER HEIGHT | authKW | 76990 | 0% | 86% | 6 |
| 2 | I S CHARACTERISTICS | authKW | 74853 | 0% | 100% | 5 |
| 3 | LOCAL TUNNELING BARRIER HEIGHT LBH | authKW | 74853 | 0% | 100% | 5 |
| 4 | LOCAL WORK FUNCTION | authKW | 68430 | 0% | 57% | 8 |
| 5 | REVIEW OF SCIENTIFIC INSTRUMENTS | journal | 56287 | 16% | 1% | 340 |
| 6 | ATOMIC CORRUGATION | authKW | 44912 | 0% | 100% | 3 |
| 7 | STM | authKW | 41751 | 4% | 4% | 75 |
| 8 | SCANNING TUNNELING MICROSCOPE | authKW | 41644 | 1% | 9% | 31 |
| 9 | SCANNING TUNNELING MICROSCOPY | authKW | 39943 | 5% | 2% | 111 |
| 10 | SCANNING TUNNELLING MICROSCOPE | authKW | 39104 | 0% | 29% | 9 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Microscopy | 11364 | 8% | 0% | 168 |
| 2 | Physics, Applied | 9561 | 44% | 0% | 922 |
| 3 | Instruments & Instrumentation | 8686 | 21% | 0% | 435 |
| 4 | Physics, Condensed Matter | 3253 | 22% | 0% | 462 |
| 5 | Materials Science, Coatings & Films | 3112 | 9% | 0% | 192 |
| 6 | Nanoscience & Nanotechnology | 723 | 7% | 0% | 154 |
| 7 | Chemistry, Physical | 564 | 14% | 0% | 291 |
| 8 | Physics, Multidisciplinary | 463 | 8% | 0% | 177 |
| 9 | Engineering, General | 274 | 3% | 0% | 69 |
| 10 | Materials Science, Multidisciplinary | 114 | 9% | 0% | 188 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | KNOWLEDGE INTELLIGENCE SCI SUMIDA KU | 29941 | 0% | 100% | 2 |
| 2 | SEDE CSIC B | 29941 | 0% | 100% | 2 |
| 3 | GRP MAT NANOESTRUCT | 19959 | 0% | 67% | 2 |
| 4 | 151 AMUNDSON HALL | 14971 | 0% | 100% | 1 |
| 5 | ABTL FESTKORPERPHYS | 14971 | 0% | 100% | 1 |
| 6 | AIST 2 | 14971 | 0% | 100% | 1 |
| 7 | AMPEL 344 | 14971 | 0% | 100% | 1 |
| 8 | ANAL VLSI DEV S IC GRP | 14971 | 0% | 100% | 1 |
| 9 | BAJAS TEMP FIS MAT CONDENSADA CIENC | 14971 | 0% | 100% | 1 |
| 10 | CMS LHC | 14971 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | REVIEW OF SCIENTIFIC INSTRUMENTS | 56287 | 16% | 1% | 340 |
| 2 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 13505 | 5% | 1% | 114 |
| 3 | ULTRAMICROSCOPY | 13147 | 3% | 1% | 71 |
| 4 | SURFACE SCIENCE | 10693 | 7% | 1% | 140 |
| 5 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 10065 | 5% | 1% | 107 |
| 6 | JOURNAL OF MICROSCOPY | 7935 | 2% | 1% | 39 |
| 7 | JOURNAL OF MICROSCOPY-OXFORD | 3104 | 1% | 1% | 22 |
| 8 | IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 2976 | 1% | 1% | 20 |
| 9 | INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 2419 | 1% | 1% | 26 |
| 10 | MEASUREMENT SCIENCE AND TECHNOLOGY | 1790 | 2% | 0% | 34 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |