Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | LIQUID METAL ION SOURCE | authKW | 504701 | 2% | 71% | 30 |
2 | ION BEAMS MAT | address | 117768 | 0% | 100% | 5 |
3 | ALLOY LIQUID METAL ION SOURCES | authKW | 94214 | 0% | 100% | 4 |
4 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | journal | 93492 | 19% | 2% | 258 |
5 | FOCUSED ION BEAM | authKW | 74793 | 5% | 5% | 61 |
6 | NERIME PROCESS | authKW | 70661 | 0% | 100% | 3 |
7 | SECT PL PHYS | address | 56065 | 1% | 24% | 10 |
8 | FEEP | authKW | 53833 | 0% | 57% | 4 |
9 | BOOSTER PRINCIPLE | authKW | 47107 | 0% | 100% | 2 |
10 | LIQUID METAL CONE | authKW | 47107 | 0% | 100% | 2 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 14806 | 66% | 0% | 888 |
2 | Nanoscience & Nanotechnology | 7324 | 26% | 0% | 346 |
3 | Engineering, Electrical & Electronic | 3097 | 30% | 0% | 396 |
4 | Instruments & Instrumentation | 1793 | 12% | 0% | 163 |
5 | Microscopy | 1532 | 4% | 0% | 50 |
6 | Nuclear Science & Technology | 903 | 8% | 0% | 110 |
7 | Materials Science, Coatings & Films | 615 | 5% | 0% | 71 |
8 | Physics, Nuclear | 592 | 7% | 0% | 91 |
9 | Optics | 413 | 9% | 0% | 116 |
10 | Physics, Atomic, Molecular & Chemical | 245 | 7% | 0% | 88 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | ION BEAMS MAT | 117768 | 0% | 100% | 5 |
2 | SECT PL PHYS | 56065 | 1% | 24% | 10 |
3 | MICROENGN NANOTECHNOL GRP | 26494 | 0% | 38% | 3 |
4 | CINAM UNITE PROPRE RECH 3118 | 23554 | 0% | 100% | 1 |
5 | DAVE 104 | 23554 | 0% | 100% | 1 |
6 | ELECT ENGN RADIO | 23554 | 0% | 100% | 1 |
7 | ENGN MAT PHYS EMP | 23554 | 0% | 100% | 1 |
8 | INTEGRATED DEVICES CIRCUITS IDC | 23554 | 0% | 100% | 1 |
9 | IONENSTRAHLPHYS MAT FORSH | 23554 | 0% | 100% | 1 |
10 | LEHRSTUHL ANGEW FESTKORPHYS | 23554 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 93492 | 19% | 2% | 258 |
2 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 9610 | 2% | 2% | 22 |
3 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 6925 | 4% | 0% | 60 |
4 | MICROELECTRONIC ENGINEERING | 6806 | 4% | 1% | 55 |
5 | JOURNAL DE PHYSIQUE | 5410 | 4% | 0% | 47 |
6 | VACUUM | 4835 | 3% | 0% | 45 |
7 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 4267 | 6% | 0% | 77 |
8 | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 3384 | 2% | 1% | 28 |
9 | ULTRAMICROSCOPY | 2969 | 2% | 0% | 27 |
10 | JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2770 | 4% | 0% | 51 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |