Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | EXCIMER LASER MODIFICATION | authKW | 891992 | 3% | 100% | 3 |
| 2 | AL ANODIZING | authKW | 297331 | 1% | 100% | 1 |
| 3 | AMBIENT GAS SENSITIVITY | authKW | 297331 | 1% | 100% | 1 |
| 4 | AMORPHOUS AL2O3 FILMS | authKW | 297331 | 1% | 100% | 1 |
| 5 | CENT PHOTOPROC JORDAN MALINOWKSI | address | 297331 | 1% | 100% | 1 |
| 6 | CHAMBER TO CHAMBER MATCHING | authKW | 297331 | 1% | 100% | 1 |
| 7 | CHROMIUM MOLYBDENUM ALLOY | authKW | 297331 | 1% | 100% | 1 |
| 8 | DOPED NANO SIZED MAGNETITE | authKW | 297331 | 1% | 100% | 1 |
| 9 | EMBEDDED ATTENUATED PHASE SHIFT MASKS | authKW | 297331 | 1% | 100% | 1 |
| 10 | GALINOBISUITITE BI2S3PBS THIN FILM | authKW | 297331 | 1% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Imaging Science & Photographic Technology | 1175 | 15% | 0% | 16 |
| 2 | Physics, Applied | 992 | 61% | 0% | 65 |
| 3 | Materials Science, Coatings & Films | 865 | 21% | 0% | 22 |
| 4 | Materials Science, Multidisciplinary | 240 | 35% | 0% | 37 |
| 5 | Nanoscience & Nanotechnology | 185 | 15% | 0% | 16 |
| 6 | Optics | 119 | 15% | 0% | 16 |
| 7 | Engineering, Electrical & Electronic | 98 | 20% | 0% | 21 |
| 8 | Physics, Condensed Matter | 69 | 15% | 0% | 16 |
| 9 | Electrochemistry | 37 | 6% | 0% | 6 |
| 10 | Chemistry, Physical | 9 | 9% | 0% | 10 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | CENT PHOTOPROC JORDAN MALINOWKSI | 297331 | 1% | 100% | 1 |
| 2 | JORDAN MLAINOWSKI | 297331 | 1% | 100% | 1 |
| 3 | PHYS PROPERTIES MAT SUR ES STRUCT | 297331 | 1% | 100% | 1 |
| 4 | SCANNING MICROSCOPY STEREOL | 297331 | 1% | 100% | 1 |
| 5 | CENT PHOTOPROC JORDAN MALINOWSKI | 297327 | 3% | 33% | 3 |
| 6 | J MALINOWSKI | 250378 | 4% | 21% | 4 |
| 7 | ELECT ENGN SEONGBUK KU | 148664 | 1% | 50% | 1 |
| 8 | POLYMER DYNAM | 148664 | 1% | 50% | 1 |
| 9 | CENT PHOTOG PROC | 148662 | 2% | 25% | 2 |
| 10 | CENT PHOTOPROC | 118917 | 8% | 5% | 8 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | JOURNAL FUR SIGNALAUFZEICHNUNGSMATERIALIEN | 78119 | 6% | 4% | 6 |
| 2 | JOURNAL OF PHOTOGRAPHIC SCIENCE | 13240 | 5% | 1% | 5 |
| 3 | JOURNAL OF IMAGING TECHNOLOGY | 4952 | 2% | 1% | 2 |
| 4 | JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS | 4890 | 2% | 1% | 2 |
| 5 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 4020 | 4% | 0% | 4 |
| 6 | JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2009 | 6% | 0% | 6 |
| 7 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1426 | 8% | 0% | 9 |
| 8 | MICROELECTRONIC ENGINEERING | 1400 | 7% | 0% | 7 |
| 9 | VACUUM | 1093 | 6% | 0% | 6 |
| 10 | JOURNAL OF IMAGING SCIENCE | 896 | 1% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |