Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
8 | 4 | POLYMER SCIENCE//CHEMISTRY, PHYSICAL//MATERIALS SCIENCE, MULTIDISCIPLINARY | 1554940 |
397 | 3 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B//MICROELECTRONIC ENGINEERING//NANOSCIENCE & NANOTECHNOLOGY | 32153 |
806 | 2 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B//CHEMICALLY AMPLIFIED RESIST//JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY | 12229 |
29393 | 1 | NANOSYST MFG//ION PROJECTION//NANOELECT PROC IL | 204 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | NANOSYST MFG | address | 926967 | 3% | 100% | 6 |
2 | ION PROJECTION | authKW | 429147 | 2% | 56% | 5 |
3 | NANOELECT PROC IL | address | 231739 | 1% | 50% | 3 |
4 | MASKLESS IMPLANTATION | authKW | 205991 | 1% | 67% | 2 |
5 | ION PROJECTION LITHOGRAPHY | authKW | 173803 | 1% | 38% | 3 |
6 | CYCLOTRON SLOVAK REPUBL | address | 154494 | 0% | 100% | 1 |
7 | DEEP PATTERN TRANSFER | authKW | 154494 | 0% | 100% | 1 |
8 | E BEAM LITHOGRAPHY EEL | authKW | 154494 | 0% | 100% | 1 |
9 | GE SB TE PHASE CHANGE ALLOYS | authKW | 154494 | 0% | 100% | 1 |
10 | HALL EFFECT ANOMALOUS | authKW | 154494 | 0% | 100% | 1 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Nanoscience & Nanotechnology | 5769 | 57% | 0% | 117 |
2 | Physics, Applied | 2609 | 71% | 0% | 145 |
3 | Engineering, Electrical & Electronic | 2506 | 64% | 0% | 131 |
4 | Instruments & Instrumentation | 569 | 17% | 0% | 35 |
5 | Optics | 529 | 22% | 0% | 45 |
6 | Nuclear Science & Technology | 357 | 13% | 0% | 26 |
7 | Physics, Nuclear | 108 | 7% | 0% | 15 |
8 | Physics, Atomic, Molecular & Chemical | 34 | 6% | 0% | 13 |
9 | Telecommunications | 22 | 3% | 0% | 7 |
10 | Spectroscopy | 9 | 2% | 0% | 5 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | NANOSYST MFG | 926967 | 3% | 100% | 6 |
2 | NANOELECT PROC IL | 231739 | 1% | 50% | 3 |
3 | CYCLOTRON SLOVAK REPUBL | 154494 | 0% | 100% | 1 |
4 | HL LITHO | 154494 | 0% | 100% | 1 |
5 | IONEN MIKROFABRIKAT SYST GMBH | 154494 | 0% | 100% | 1 |
6 | NANOMAGENT SYST | 154494 | 0% | 100% | 1 |
7 | UNIT B4 | 154494 | 0% | 100% | 1 |
8 | PHYS MIT IONENSTRAHLEN | 51497 | 0% | 33% | 1 |
9 | PHYS IONENSTRAHLEN | 47674 | 2% | 6% | 5 |
10 | INTEGRATED NANO SYST | 38622 | 0% | 25% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 43963 | 34% | 0% | 69 |
2 | MICROELECTRONIC ENGINEERING | 22728 | 19% | 0% | 39 |
3 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 2070 | 3% | 0% | 6 |
4 | RADIOTEKHNIKA I ELEKTRONIKA | 1725 | 3% | 0% | 7 |
5 | KVANTOVAYA ELEKTRONIKA | 1147 | 3% | 0% | 7 |
6 | NUCLEAR INSTRUMENTS & METHODS | 1057 | 1% | 0% | 3 |
7 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 680 | 6% | 0% | 12 |
8 | AEU-ARCHIV FUR ELEKTRONIK UND UBERTRAGUNGSTECHNIK-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS | 426 | 0% | 0% | 1 |
9 | TECHNICAL PHYSICS | 234 | 1% | 0% | 3 |
10 | IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA | 183 | 1% | 0% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |