Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | PROTON BEAM WRITING | authKW | 4379617 | 16% | 89% | 89 |
2 | ION BEAM PLICAT | address | 1680614 | 15% | 35% | 87 |
3 | PROBE FORMING SYSTEM | authKW | 832623 | 3% | 94% | 16 |
4 | LOUISIANA ACCELERATOR | address | 688270 | 3% | 66% | 19 |
5 | QUADRUPOLE LENS | authKW | 614574 | 3% | 65% | 17 |
6 | MEV ION BEAM LITHOGRAPHY | authKW | 608206 | 2% | 100% | 11 |
7 | CIBA | address | 531308 | 5% | 31% | 31 |
8 | PROTON BEAM WRITING PBW | authKW | 387040 | 1% | 100% | 7 |
9 | PROTON BEAM MICROMACHINING | authKW | 353862 | 1% | 80% | 8 |
10 | MAGNETIC QUADRUPOLE LENS | authKW | 331749 | 1% | 100% | 6 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Nuclear Science & Technology | 26180 | 62% | 0% | 353 |
2 | Physics, Nuclear | 25663 | 61% | 0% | 349 |
3 | Instruments & Instrumentation | 25154 | 65% | 0% | 373 |
4 | Physics, Atomic, Molecular & Chemical | 12856 | 58% | 0% | 333 |
5 | Physics, Applied | 603 | 23% | 0% | 131 |
6 | Nanoscience & Nanotechnology | 503 | 11% | 0% | 63 |
7 | Optics | 110 | 7% | 0% | 41 |
8 | Engineering, Electrical & Electronic | 105 | 11% | 0% | 60 |
9 | Materials Science, Coatings & Films | 70 | 3% | 0% | 17 |
10 | Physics, Particles & Fields | 63 | 4% | 0% | 25 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | ION BEAM PLICAT | 1680614 | 15% | 35% | 87 |
2 | LOUISIANA ACCELERATOR | 688270 | 3% | 66% | 19 |
3 | CIBA | 531308 | 5% | 31% | 31 |
4 | RCNM | 176931 | 1% | 80% | 4 |
5 | HAUTE ECOLE ARC INGN | 142585 | 1% | 37% | 7 |
6 | NUCL MICROSCOPY | 141559 | 2% | 20% | 13 |
7 | TAKASAKI ADV RADIAT | 139241 | 4% | 11% | 23 |
8 | MICROTECHNOL PL ARC | 82934 | 1% | 50% | 3 |
9 | ANGEW PHYS MESSTECH LRT2 | 71080 | 1% | 21% | 6 |
10 | 2 52 | 55291 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 191066 | 58% | 1% | 331 |
2 | MICROELECTRONIC ENGINEERING | 2107 | 4% | 0% | 20 |
3 | MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 1774 | 2% | 0% | 11 |
4 | PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY | 1631 | 1% | 0% | 7 |
5 | TECHNICAL PHYSICS | 1352 | 2% | 0% | 12 |
6 | JOURNAL OF MICROMECHANICS AND MICROENGINEERING | 954 | 2% | 0% | 10 |
7 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 379 | 2% | 0% | 11 |
8 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 312 | 3% | 0% | 16 |
9 | JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS | 216 | 0% | 0% | 2 |
10 | ELECTROCHEMICAL AND SOLID STATE LETTERS | 200 | 1% | 0% | 4 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |