Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | journal | 1155454 | 22% | 16% | 2741 |
2 | CHEMICALLY AMPLIFIED RESIST | authKW | 360240 | 1% | 82% | 171 |
3 | JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY | journal | 261940 | 4% | 22% | 454 |
4 | RESIST | authKW | 261910 | 2% | 53% | 193 |
5 | MICROELECTRONIC ENGINEERING | journal | 259718 | 8% | 10% | 1023 |
6 | LITHOGRAPHY | authKW | 230723 | 3% | 23% | 388 |
7 | ELECTRON BEAM LITHOGRAPHY | authKW | 221945 | 3% | 28% | 311 |
8 | LINE EDGE ROUGHNESS | authKW | 220856 | 1% | 68% | 127 |
9 | FOCUSED ION BEAM | authKW | 170909 | 2% | 24% | 279 |
10 | PHOTORESIST | authKW | 170906 | 2% | 29% | 227 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Nanoscience & Nanotechnology | 152609 | 38% | 1% | 4705 |
2 | Physics, Applied | 111107 | 60% | 1% | 7395 |
3 | Engineering, Electrical & Electronic | 59526 | 42% | 1% | 5081 |
4 | Optics | 17172 | 17% | 0% | 2038 |
5 | Microscopy | 6680 | 3% | 1% | 320 |
6 | Polymer Science | 4797 | 9% | 0% | 1045 |
7 | Materials Science, Coatings & Films | 2837 | 4% | 0% | 479 |
8 | Materials Science, Multidisciplinary | 2220 | 13% | 0% | 1575 |
9 | Instruments & Instrumentation | 2064 | 5% | 0% | 603 |
10 | Physics, Condensed Matter | 637 | 6% | 0% | 738 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | XRAY LITHOG | 45400 | 0% | 77% | 23 |
2 | ADV MAT DEV 1 | 41345 | 0% | 94% | 17 |
3 | SUPER FINE SR LITHOG | 36054 | 0% | 100% | 14 |
4 | HIGH VOLTAGE ELE ON MICROSCOPY STN | 33407 | 0% | 38% | 34 |
5 | LASTI | 29091 | 0% | 26% | 44 |
6 | PHOTOMASK | 25753 | 0% | 100% | 10 |
7 | NEW TECHNOL DEV SECT | 23177 | 0% | 100% | 9 |
8 | EUV PROC TECHNOL | 22898 | 0% | 68% | 13 |
9 | SCI IND | 22583 | 2% | 4% | 212 |
10 | PROC MFG ENGN | 20237 | 0% | 25% | 32 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1155454 | 22% | 16% | 2741 |
2 | JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY | 261940 | 4% | 22% | 454 |
3 | MICROELECTRONIC ENGINEERING | 259718 | 8% | 10% | 1023 |
4 | JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS | 158342 | 2% | 25% | 249 |
5 | JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS | 66034 | 1% | 33% | 79 |
6 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 60701 | 7% | 3% | 863 |
7 | SOLID STATE TECHNOLOGY | 55609 | 2% | 11% | 201 |
8 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 23850 | 1% | 9% | 105 |
9 | MICROLITHOGRAPHY WORLD | 21815 | 0% | 40% | 21 |
10 | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 18425 | 2% | 4% | 198 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | CHEMICALLY AMPLIFIED RESIST | 360240 | 1% | 82% | 171 | Search CHEMICALLY+AMPLIFIED+RESIST | Search CHEMICALLY+AMPLIFIED+RESIST |
2 | RESIST | 261910 | 2% | 53% | 193 | Search RESIST | Search RESIST |
3 | LITHOGRAPHY | 230723 | 3% | 23% | 388 | Search LITHOGRAPHY | Search LITHOGRAPHY |
4 | ELECTRON BEAM LITHOGRAPHY | 221945 | 3% | 28% | 311 | Search ELECTRON+BEAM+LITHOGRAPHY | Search ELECTRON+BEAM+LITHOGRAPHY |
5 | LINE EDGE ROUGHNESS | 220856 | 1% | 68% | 127 | Search LINE+EDGE+ROUGHNESS | Search LINE+EDGE+ROUGHNESS |
6 | FOCUSED ION BEAM | 170909 | 2% | 24% | 279 | Search FOCUSED+ION+BEAM | Search FOCUSED+ION+BEAM |
7 | PHOTORESIST | 170906 | 2% | 29% | 227 | Search PHOTORESIST | Search PHOTORESIST |
8 | ELECTRON BEAM INDUCED DEPOSITION | 161043 | 1% | 72% | 87 | Search ELECTRON+BEAM+INDUCED+DEPOSITION | Search ELECTRON+BEAM+INDUCED+DEPOSITION |
9 | X RAY MASK | 157718 | 1% | 84% | 73 | Search X+RAY+MASK | Search X+RAY+MASK |
10 | IMMERSION LITHOGRAPHY | 156930 | 1% | 76% | 80 | Search IMMERSION+LITHOGRAPHY | Search IMMERSION+LITHOGRAPHY |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 2 |