Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | IMMERSION LITHOGRAPHY | authKW | 2311547 | 13% | 56% | 59 |
2 | LITHOGRAPHY SIMULATION | authKW | 817122 | 7% | 38% | 31 |
3 | DOUBLE PATTERNING | authKW | 658372 | 5% | 39% | 24 |
4 | PATTERN COLLAPSE | authKW | 594984 | 4% | 53% | 16 |
5 | VUV LITHOG | address | 427073 | 2% | 88% | 7 |
6 | JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY | journal | 402215 | 24% | 5% | 108 |
7 | RESIST PATTERN COLLAPSE | authKW | 278906 | 1% | 100% | 4 |
8 | RESIST REFLOW | authKW | 217892 | 1% | 63% | 5 |
9 | LITHO ETCH LITHO ETCH | authKW | 209179 | 1% | 100% | 3 |
10 | POSITIVE TONE DEVELOPMENT | authKW | 209179 | 1% | 100% | 3 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Nanoscience & Nanotechnology | 2016 | 23% | 0% | 106 |
2 | Polymer Science | 1943 | 25% | 0% | 114 |
3 | Physics, Applied | 1750 | 41% | 0% | 184 |
4 | Optics | 938 | 20% | 0% | 90 |
5 | Engineering, Electrical & Electronic | 820 | 27% | 0% | 120 |
6 | Physics, Multidisciplinary | 170 | 10% | 0% | 47 |
7 | Materials Science, Multidisciplinary | 48 | 11% | 0% | 49 |
8 | Materials Science, Coatings & Films | 6 | 1% | 0% | 6 |
9 | Instruments & Instrumentation | 2 | 2% | 0% | 7 |
10 | Physics, Condensed Matter | 1 | 3% | 0% | 14 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | VUV LITHOG | 427073 | 2% | 88% | 7 |
2 | CLEAN TRACK BU | 139453 | 0% | 100% | 2 |
3 | INFORMAT COMMUN ELECT ENGN | 88232 | 2% | 14% | 9 |
4 | ADV LITHPG DEV ALBANY | 69726 | 0% | 100% | 1 |
5 | AVD MAT DEV 1 | 69726 | 0% | 100% | 1 |
6 | BUSINESS UNIT ELE ON MAT | 69726 | 0% | 100% | 1 |
7 | CLEAN TRACK BUSINESS UNIT | 69726 | 0% | 100% | 1 |
8 | DEP C T | 69726 | 0% | 100% | 1 |
9 | DEV TECHNOL OPERAT | 69726 | 0% | 100% | 1 |
10 | DUPONT KK | 69726 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY | 402215 | 24% | 5% | 108 |
2 | JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS | 151750 | 5% | 9% | 23 |
3 | MICROLITHOGRAPHY WORLD | 65692 | 2% | 13% | 7 |
4 | JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS | 33503 | 5% | 2% | 22 |
5 | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 8603 | 10% | 0% | 44 |
6 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 7291 | 9% | 0% | 42 |
7 | MICROELECTRONIC ENGINEERING | 4879 | 6% | 0% | 27 |
8 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 3916 | 9% | 0% | 42 |
9 | JAPANESE JOURNAL OF APPLIED PHYSICS | 2020 | 5% | 0% | 22 |
10 | SOLID STATE TECHNOLOGY | 928 | 1% | 0% | 5 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |