Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 375 | 3 | MICROSCOPY//ULTRAMICROSCOPY//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 34629 |
| 2570 | 2 | SCANNING//SCANDATE CATHODE//MICROSCOPY | 3949 |
| 15450 | 1 | SCANNING//SECONDARY EMISSION NOISE//INTEGRATED CIRCUIT ADV PROC TECHNOL | 739 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | SCANNING | journal | 569704 | 20% | 9% | 151 |
| 2 | SECONDARY EMISSION NOISE | authKW | 213233 | 1% | 100% | 5 |
| 3 | INTEGRATED CIRCUIT ADV PROC TECHNOL | address | 170586 | 1% | 100% | 4 |
| 4 | RELIEF ELEMENTS | authKW | 170586 | 1% | 100% | 4 |
| 5 | BACKSCATTERED ELECTRONS | authKW | 167073 | 3% | 17% | 23 |
| 6 | SCANNING ELECTRON MICROSCOPE | authKW | 162878 | 10% | 5% | 76 |
| 7 | MICROSCOPY | WoSSC | 159144 | 50% | 1% | 368 |
| 8 | 3D SEM SURFACE RECONSTRUCTION | authKW | 127940 | 0% | 100% | 3 |
| 9 | ALTERNATING APERTURE PHASE SHIFTING MASKS | authKW | 127940 | 0% | 100% | 3 |
| 10 | BEASTLI | authKW | 127940 | 0% | 100% | 3 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Microscopy | 159144 | 50% | 1% | 368 |
| 2 | Instruments & Instrumentation | 8690 | 34% | 0% | 253 |
| 3 | Engineering, General | 914 | 9% | 0% | 66 |
| 4 | Physics, Applied | 247 | 14% | 0% | 107 |
| 5 | Nanoscience & Nanotechnology | 130 | 6% | 0% | 41 |
| 6 | Physics, Multidisciplinary | 101 | 7% | 0% | 52 |
| 7 | Engineering, Electrical & Electronic | 73 | 9% | 0% | 63 |
| 8 | Optics | 45 | 5% | 0% | 35 |
| 9 | Biology | 23 | 2% | 0% | 17 |
| 10 | Spectroscopy | 22 | 2% | 0% | 16 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | INTEGRATED CIRCUIT ADV PROC TECHNOL | 170586 | 1% | 100% | 4 |
| 2 | SECT 5 11 | 85293 | 0% | 100% | 2 |
| 3 | AREA METROL MAT | 42647 | 0% | 100% | 1 |
| 4 | ARMINESUMR 7633 | 42647 | 0% | 100% | 1 |
| 5 | AS2MFEMTO ST | 42647 | 0% | 100% | 1 |
| 6 | AUTOMAT CONTROL MICRO MECHATRON SYST AS2M | 42647 | 0% | 100% | 1 |
| 7 | AV PROKHOROV GEN PHYS | 42647 | 0% | 100% | 1 |
| 8 | CATEDRA OPERATORIA 2 A | 42647 | 0% | 100% | 1 |
| 9 | ETUDES MAT MICROSCOPIE AVANCEE | 42647 | 0% | 100% | 1 |
| 10 | ISOGO KO | 42647 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | SCANNING | 569704 | 20% | 9% | 151 |
| 2 | MICRON AND MICROSCOPICA ACTA | 32588 | 2% | 6% | 13 |
| 3 | JOURNAL OF ELECTRON MICROSCOPY | 22068 | 4% | 2% | 31 |
| 4 | SCANNING MICROSCOPY | 16404 | 3% | 2% | 22 |
| 5 | MEASUREMENT TECHNIQUES | 12877 | 3% | 1% | 25 |
| 6 | JOURNAL OF MICROSCOPY | 11709 | 4% | 1% | 28 |
| 7 | MEASUREMENT TECHNIQUES USSR | 10345 | 2% | 2% | 13 |
| 8 | JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 9875 | 2% | 2% | 13 |
| 9 | MICRON | 9537 | 3% | 1% | 24 |
| 10 | JOURNAL OF MICROSCOPY-OXFORD | 8923 | 3% | 1% | 22 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |