Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
375 | 3 | MICROSCOPY//ULTRAMICROSCOPY//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 34629 |
3398 | 2 | SURFACE EMISSION RATE//MEAN PENETRATION DEPTH//ORDINARY BREMSSTRAHLUNG | 1726 |
12091 | 1 | ELECTRON PROBE MICROANALYSIS//ATOMIC TARGETS//CHUDAKOV EFFECT | 960 |
22167 | 1 | SURFACE EMISSION RATE//MEAN PENETRATION DEPTH//LARGE AREA REFERENCE SOURCES | 414 |
23939 | 1 | ORDINARY BREMSSTRAHLUNG//TOTAL BREMSSTRAHLUNG//SCI COUNCIL SPECT | 352 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | SURFACE EMISSION RATE | authKW | 127808 | 0% | 100% | 7 |
2 | MEAN PENETRATION DEPTH | authKW | 109550 | 0% | 100% | 6 |
3 | ORDINARY BREMSSTRAHLUNG | authKW | 109550 | 0% | 100% | 6 |
4 | LARGE AREA REFERENCE SOURCES | authKW | 91291 | 0% | 100% | 5 |
5 | TOTAL BREMSSTRAHLUNG | authKW | 91291 | 0% | 100% | 5 |
6 | SCI COUNCIL SPECT | address | 89461 | 0% | 70% | 7 |
7 | ELECTRON PROBE MICROANALYSIS | authKW | 85391 | 2% | 11% | 43 |
8 | FIS ECM | address | 79102 | 1% | 33% | 13 |
9 | X-RAY SPECTROMETRY | journal | 78813 | 6% | 5% | 95 |
10 | POLARIZATIONAL BREMSSTRAHLUNG | authKW | 76075 | 0% | 83% | 5 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Microscopy | 11529 | 9% | 0% | 153 |
2 | Nuclear Science & Technology | 8185 | 20% | 0% | 353 |
3 | Physics, Atomic, Molecular & Chemical | 5020 | 22% | 0% | 378 |
4 | Spectroscopy | 3850 | 13% | 0% | 230 |
5 | Instruments & Instrumentation | 3358 | 14% | 0% | 250 |
6 | Physics, Nuclear | 2553 | 12% | 0% | 203 |
7 | Physics, Multidisciplinary | 1270 | 14% | 0% | 238 |
8 | Optics | 864 | 11% | 0% | 183 |
9 | Chemistry, Analytical | 625 | 10% | 0% | 165 |
10 | Physics, Applied | 429 | 13% | 0% | 224 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SCI COUNCIL SPECT | 89461 | 0% | 70% | 7 |
2 | FIS ECM | 79102 | 1% | 33% | 13 |
3 | FU 160 | 73033 | 0% | 100% | 4 |
4 | OPEN RADIAT PHYS TECHNOL | 65205 | 0% | 71% | 5 |
5 | RADIAT PHYS TECHNOL | 55830 | 2% | 7% | 41 |
6 | SGCSLMAC | 50713 | 0% | 56% | 5 |
7 | MAT SYST ELECT | 30424 | 0% | 33% | 5 |
8 | CMR RUMENTAT | 27384 | 0% | 50% | 3 |
9 | MAT ELECT SYST LMSE | 27384 | 0% | 50% | 3 |
10 | FIS ECM ICC | 26552 | 0% | 36% | 4 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | X-RAY SPECTROMETRY | 78813 | 6% | 5% | 95 |
2 | MIKROCHIMICA ACTA | 37865 | 5% | 3% | 78 |
3 | MICROSCOPY AND MICROANALYSIS | 19001 | 3% | 2% | 44 |
4 | SCANNING | 17911 | 2% | 2% | 41 |
5 | JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 11438 | 1% | 4% | 17 |
6 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 9361 | 7% | 0% | 129 |
7 | APPLIED RADIATION AND ISOTOPES | 7116 | 3% | 1% | 60 |
8 | RADIATION PHYSICS AND CHEMISTRY | 6006 | 3% | 1% | 57 |
9 | JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 4918 | 4% | 0% | 67 |
10 | SURFACE AND INTERFACE ANALYSIS | 2527 | 2% | 0% | 31 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 2 |