Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
215 | 3 | JOURNAL OF CRYSTAL GROWTH//HGCDTE//SOVIET PHYSICS SEMICONDUCTORS-USSR | 51359 |
2525 | 2 | SOVIET PHYSICS SEMICONDUCTORS-USSR//PHYS MICROSTRUCT//CURRENT DENSITY FILAMENT | 4045 |
29308 | 1 | CHRONOLOGY OF DEVELOPMENT AND DISCOVERIES//DOPING AND STRAIN EFFECTS//INSB VANDERPAUW METHOD | 206 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | CHRONOLOGY OF DEVELOPMENT AND DISCOVERIES | authKW | 152994 | 0% | 100% | 1 |
2 | DOPING AND STRAIN EFFECTS | authKW | 152994 | 0% | 100% | 1 |
3 | INSB VANDERPAUW METHOD | authKW | 152994 | 0% | 100% | 1 |
4 | INTRINSIC RANGE | authKW | 152994 | 0% | 100% | 1 |
5 | IONIZED IMPURITY SCREENING | authKW | 152994 | 0% | 100% | 1 |
6 | LOW FIELD ELECTRON MOBILITY | authKW | 152994 | 0% | 100% | 1 |
7 | MOMENTUM RELAXATION CROSS SECTION | authKW | 152994 | 0% | 100% | 1 |
8 | THOMAS FERMI ATOMIC MODEL | authKW | 152994 | 0% | 100% | 1 |
9 | VALENCE PLASMONS | authKW | 152994 | 0% | 100% | 1 |
10 | VARIATIONAL STATISTICAL METHOD | authKW | 152994 | 0% | 100% | 1 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Condensed Matter | 2841 | 61% | 0% | 125 |
2 | Physics, Applied | 104 | 17% | 0% | 35 |
3 | Physics, Multidisciplinary | 92 | 11% | 0% | 23 |
4 | Mathematics, Interdisciplinary Applications | 15 | 2% | 0% | 5 |
5 | Crystallography | 15 | 3% | 0% | 6 |
6 | Physics, Mathematical | 13 | 3% | 0% | 6 |
7 | Physics, Atomic, Molecular & Chemical | 9 | 4% | 0% | 8 |
8 | Social Sciences, Interdisciplinary | 4 | 1% | 0% | 2 |
9 | Engineering, Electrical & Electronic | 2 | 5% | 0% | 10 |
10 | Education, Scientific Disciplines | 1 | 0% | 0% | 1 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SCI TECHNOL RUMENTAT ENGN | 50997 | 0% | 33% | 1 |
2 | UMS 3318 | 50997 | 0% | 33% | 1 |
3 | CNRT MAT | 38247 | 0% | 25% | 1 |
4 | RADIOPHYS COMP TECHNOL | 38247 | 0% | 25% | 1 |
5 | DEVICE MODELLING GRP | 5560 | 1% | 2% | 2 |
6 | FESTKORPERELEKTRON | 3324 | 0% | 2% | 1 |
7 | INDUS SYNCHROTRON UTILIZAT | 2940 | 0% | 2% | 1 |
8 | EEA | 1935 | 0% | 1% | 1 |
9 | ELE ENGN | 744 | 0% | 0% | 1 |
10 | UFR SCI | 394 | 1% | 0% | 2 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | PHYSICAL REVIEW B | 4464 | 34% | 0% | 70 |
2 | JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1965 | 4% | 0% | 8 |
3 | PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 1288 | 6% | 0% | 13 |
4 | SOLID STATE COMMUNICATIONS | 582 | 5% | 0% | 10 |
5 | PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 563 | 0% | 0% | 1 |
6 | CURRENT CONTENTS/PHYSICAL CHEMICAL & EARTH SCIENCES | 511 | 0% | 0% | 1 |
7 | SOVIET MICROELECTRONICS | 510 | 0% | 0% | 1 |
8 | CURRENT CONTENTS/ENGINEERING TECHNOLOGY & APPLIED SCIENCES | 506 | 0% | 0% | 1 |
9 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 432 | 2% | 0% | 4 |
10 | CRYSTAL RESEARCH AND TECHNOLOGY | 366 | 2% | 0% | 4 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |