Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 64 | 3 | SEMICONDUCTOR LASERS//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 89567 |
| 26 | 2 | SUPERLATTICES AND MICROSTRUCTURES//QUANTUM WELLS//PHYSICS, CONDENSED MATTER | 34827 |
| 35802 | 1 | SURFACE AND INTERFACE PHENOMENA//CRYSTAL MORPHOLOGIES//DEFECT FREE NUCLEATION | 107 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | SURFACE AND INTERFACE PHENOMENA | authKW | 392735 | 2% | 67% | 2 |
| 2 | CRYSTAL MORPHOLOGIES | authKW | 294552 | 1% | 100% | 1 |
| 3 | DEFECT FREE NUCLEATION | authKW | 294552 | 1% | 100% | 1 |
| 4 | FOCAL PLANE ALLEY | authKW | 294552 | 1% | 100% | 1 |
| 5 | HIGHLY BI DOPED PBTE | authKW | 294552 | 1% | 100% | 1 |
| 6 | IV VI COMPOUNDS MATERIALS | authKW | 294552 | 1% | 100% | 1 |
| 7 | KINK STEP STRUCTURE | authKW | 294552 | 1% | 100% | 1 |
| 8 | MID INFRARED LASER DIODES | authKW | 294552 | 1% | 100% | 1 |
| 9 | OPTIMUM VAPOR PRESSURE FOR STOICHIOMETRY | authKW | 294552 | 1% | 100% | 1 |
| 10 | MID INFRARED DETECTOR | authKW | 235639 | 2% | 40% | 2 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 965 | 50% | 0% | 53 |
| 2 | Physics, Applied | 535 | 46% | 0% | 49 |
| 3 | Physics, Multidisciplinary | 140 | 18% | 0% | 19 |
| 4 | Materials Science, Multidisciplinary | 104 | 24% | 0% | 26 |
| 5 | Materials Science, Coatings & Films | 55 | 6% | 0% | 6 |
| 6 | Crystallography | 53 | 7% | 0% | 7 |
| 7 | Engineering, Electrical & Electronic | 29 | 12% | 0% | 13 |
| 8 | Instruments & Instrumentation | 1 | 2% | 0% | 2 |
| 9 | Chemistry, Physical | 1 | 6% | 0% | 6 |
| 10 | Telecommunications | 0 | 1% | 0% | 1 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | TSURUOKA | 147275 | 1% | 50% | 1 |
| 2 | CONTROL INFORMAT SYST ENGN | 124015 | 4% | 11% | 4 |
| 3 | MATH SCI ELECT ELECT COMP ENGN | 58909 | 1% | 20% | 1 |
| 4 | TELECOMMUN ADVANCEMENT ORG | 29453 | 1% | 10% | 1 |
| 5 | CREAT ENGN | 22654 | 2% | 4% | 2 |
| 6 | SEMICOND | 8467 | 14% | 0% | 15 |
| 7 | SENDAI | 4330 | 1% | 1% | 1 |
| 8 | DEPENDABLE SERV COMP CYBER PHYS SOC | 1246 | 1% | 0% | 1 |
| 9 | MSE | 1131 | 1% | 0% | 1 |
| 10 | ADV MICROSTRUCT DEVICES | 967 | 1% | 0% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | JOURNAL OF THE INSTITUTION OF ELECTRONIC AND RADIO ENGINEERS | 1783 | 1% | 1% | 1 |
| 2 | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | 1330 | 4% | 0% | 4 |
| 3 | PHYSICA B & C | 1190 | 4% | 0% | 4 |
| 4 | MATERIALS SCIENCE & ENGINEERING R-REPORTS | 913 | 1% | 0% | 1 |
| 5 | PHYSICAL REVIEW B | 756 | 20% | 0% | 21 |
| 6 | RESULTS IN PHYSICS | 729 | 1% | 0% | 1 |
| 7 | INFRARED PHYSICS & TECHNOLOGY | 490 | 2% | 0% | 2 |
| 8 | JOURNAL OF CRYSTAL GROWTH | 450 | 7% | 0% | 7 |
| 9 | SUPERLATTICES AND MICROSTRUCTURES | 397 | 3% | 0% | 3 |
| 10 | JOURNAL OF ELECTRONIC MATERIALS | 253 | 3% | 0% | 3 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |