Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
64 | 3 | SEMICONDUCTOR LASERS//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 89567 |
26 | 2 | SUPERLATTICES AND MICROSTRUCTURES//QUANTUM WELLS//PHYSICS, CONDENSED MATTER | 34827 |
1517 | 1 | RESONANT TUNNELING DIODE//RESONANT TUNNELING//RESONANT TUNNELING DEVICES | 2635 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | RESONANT TUNNELING DIODE | authKW | 794280 | 5% | 53% | 126 |
2 | RESONANT TUNNELING | authKW | 226294 | 3% | 22% | 88 |
3 | RESONANT TUNNELING DEVICES | authKW | 205198 | 1% | 55% | 31 |
4 | RESONANT TUNNELING DIODE RTD | authKW | 189502 | 1% | 59% | 27 |
5 | RESONANT TUNNELING DIODES RTDS | authKW | 153069 | 1% | 80% | 16 |
6 | TUNNEL DIODES | authKW | 137601 | 2% | 29% | 40 |
7 | RESONANT TUNNELLING DIODES | authKW | 84211 | 1% | 39% | 18 |
8 | DOUBLE BARRIER STRUCTURE | authKW | 78266 | 0% | 55% | 12 |
9 | TERAHERTZ OSCILLATOR | authKW | 74508 | 0% | 69% | 9 |
10 | TRIPLE BARRIER RESONANT TUNNELING DIODES | authKW | 73247 | 0% | 88% | 7 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Condensed Matter | 11533 | 35% | 0% | 929 |
2 | Physics, Applied | 11101 | 42% | 0% | 1115 |
3 | Engineering, Electrical & Electronic | 7499 | 32% | 0% | 856 |
4 | Physics, Multidisciplinary | 853 | 10% | 0% | 258 |
5 | Nanoscience & Nanotechnology | 323 | 5% | 0% | 127 |
6 | Optics | 80 | 4% | 0% | 101 |
7 | Materials Science, Multidisciplinary | 57 | 7% | 0% | 189 |
8 | Materials Science, Characterization, Testing | 34 | 1% | 0% | 16 |
9 | Crystallography | 15 | 1% | 0% | 35 |
10 | Telecommunications | 9 | 1% | 0% | 31 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | PHYS MEASUREMENT SCI | 47836 | 0% | 100% | 4 |
2 | ADFCUP | 23918 | 0% | 100% | 2 |
3 | FUNDAMENTAL DEV | 17936 | 0% | 50% | 3 |
4 | HIGH FREQUENCY MICROELECT | 17936 | 0% | 50% | 3 |
5 | MICROELECT SEVILLA IMSE CNM CSIC | 15944 | 0% | 67% | 2 |
6 | SYST ELECT S | 14613 | 1% | 7% | 17 |
7 | CENT IL 3 5 MAT | 11959 | 0% | 100% | 1 |
8 | CENT SORA KU | 11959 | 0% | 100% | 1 |
9 | CHALMERS UNIV PHYS PHYS ELECT PHOTON | 11959 | 0% | 100% | 1 |
10 | COBRAINTERUNIV | 11959 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SUPERLATTICES AND MICROSTRUCTURES | 33824 | 5% | 2% | 137 |
2 | SOLID-STATE ELECTRONICS | 9791 | 3% | 1% | 91 |
3 | APPLIED PHYSICS LETTERS | 8036 | 11% | 0% | 279 |
4 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 7492 | 3% | 1% | 72 |
5 | IEEE ELECTRON DEVICE LETTERS | 6562 | 3% | 1% | 72 |
6 | JOURNAL OF APPLIED PHYSICS | 6077 | 9% | 0% | 239 |
7 | ELECTRONICS LETTERS | 5379 | 5% | 0% | 136 |
8 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 5075 | 2% | 1% | 65 |
9 | PHYSICAL REVIEW B | 4422 | 10% | 0% | 259 |
10 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 3616 | 3% | 0% | 70 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |