Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
| 389 | 2 | MICROCRYSTALLINE SILICON//JOURNAL OF NON-CRYSTALLINE SOLIDS//AMORPHOUS SILICON | 17376 |
| 30090 | 1 | ABSOLUTE REFLECTANCE NORMAL INCIDENCE//CONDENSED SPECT OPTOELECT PHYS//CONDUCTION BAND TAIL BREADTH | 190 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | ABSOLUTE REFLECTANCE NORMAL INCIDENCE | authKW | 165878 | 1% | 100% | 1 |
| 2 | CONDENSED SPECT OPTOELECT PHYS | address | 165878 | 1% | 100% | 1 |
| 3 | CONDUCTION BAND TAIL BREADTH | authKW | 165878 | 1% | 100% | 1 |
| 4 | FE100 SURFACE | authKW | 165878 | 1% | 100% | 1 |
| 5 | RELATIVE REFLECTANCE OBLIQUE INCIDENCE | authKW | 165878 | 1% | 100% | 1 |
| 6 | SE RICH GE SE ALLOYS | authKW | 165878 | 1% | 100% | 1 |
| 7 | SPECTROPHOTOMETRIC METROLOGY | authKW | 165878 | 1% | 100% | 1 |
| 8 | SPECULAR REFLECTANCE STANDARDS | authKW | 165878 | 1% | 100% | 1 |
| 9 | INDIRECT SEMICONDUCTORS | authKW | 82938 | 1% | 50% | 1 |
| 10 | OPTICAL TRANSITION MATRIX ELEMENT | authKW | 82938 | 1% | 50% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 1348 | 44% | 0% | 84 |
| 2 | Materials Science, Ceramics | 410 | 9% | 0% | 18 |
| 3 | Physics, Applied | 388 | 31% | 0% | 58 |
| 4 | Physics, Multidisciplinary | 163 | 15% | 0% | 28 |
| 5 | Materials Science, Multidisciplinary | 86 | 18% | 0% | 34 |
| 6 | Optics | 16 | 5% | 0% | 10 |
| 7 | Mechanics | 7 | 3% | 0% | 6 |
| 8 | Instruments & Instrumentation | 1 | 2% | 0% | 3 |
| 9 | Nanoscience & Nanotechnology | 0 | 2% | 0% | 3 |
| 10 | Computer Science, Hardware & Architecture | 0 | 1% | 0% | 1 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | CONDENSED SPECT OPTOELECT PHYS | 165878 | 1% | 100% | 1 |
| 2 | FR 0067 CNRS | 55291 | 1% | 33% | 1 |
| 3 | OPT PL SCI TECH INGN | 55291 | 1% | 33% | 1 |
| 4 | K KARABEKIR EDUC | 27645 | 1% | 17% | 1 |
| 5 | MAT REACT | 9085 | 1% | 3% | 2 |
| 6 | DIEES | 4839 | 1% | 1% | 2 |
| 7 | MAT REACTIVOS | 4481 | 1% | 3% | 1 |
| 8 | COMPUTAT ANAL | 3768 | 1% | 2% | 1 |
| 9 | GRP FIS MAT 1 | 3251 | 1% | 2% | 1 |
| 10 | IND SYNCHROTRON UTILIZAT | 3188 | 1% | 2% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | JOURNAL OF NON-CRYSTALLINE SOLIDS | 2313 | 9% | 0% | 18 |
| 2 | SOLID STATE COMMUNICATIONS | 2078 | 9% | 0% | 18 |
| 3 | PHYSICAL REVIEW B | 1472 | 21% | 0% | 39 |
| 4 | PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1288 | 3% | 0% | 5 |
| 5 | PROGRESS IN QUANTUM ELECTRONICS | 726 | 1% | 0% | 1 |
| 6 | JOURNAL OF APPLIED PHYSICS | 536 | 10% | 0% | 19 |
| 7 | PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 524 | 4% | 0% | 8 |
| 8 | HELVETICA PHYSICA ACTA | 439 | 1% | 0% | 2 |
| 9 | PROGRESS IN SURFACE SCIENCE | 231 | 1% | 0% | 1 |
| 10 | APL MATERIALS | 218 | 1% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |