Class information for:
Level 1: FUNCT TERMINAL CIRCUITS GRP//DATA NETWORK EXPLORATORY DEV//INFRARED FILM THICKNESS MONITOR

Basic class information

Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes

The table includes all classes above and classes immediately below the current class.



Cluster id Level Cluster label #P
13 4 PHYSICS, PARTICLES & FIELDS//PHYSICS, NUCLEAR//OPTICS 1062565
422 3       NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT//JOURNAL OF INSTRUMENTATION//NUCLEAR SCIENCE & TECHNOLOGY 30134
4271 2             AT&T TECHNICAL JOURNAL//OPTOCOUPLER//ACTIVATION ENERGY OF RECOVERY 505
37911 1                   FUNCT TERMINAL CIRCUITS GRP//DATA NETWORK EXPLORATORY DEV//INFRARED FILM THICKNESS MONITOR 74

Terms with highest relevance score



rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 FUNCT TERMINAL CIRCUITS GRP address 851814 3% 100% 2
2 DATA NETWORK EXPLORATORY DEV address 425907 1% 100% 1
3 INFRARED FILM THICKNESS MONITOR authKW 425907 1% 100% 1
4 LOOP MAINTENANCE OPER PLANNING GRP address 425907 1% 100% 1
5 MAINTENANCE SYST ENGN address 425907 1% 100% 1
6 QUARTERWAVE authKW 425907 1% 100% 1
7 TELECOM SERVICE PROCESS authKW 425907 1% 100% 1
8 TESTING REQUIREMENTS GRP address 425907 1% 100% 1
9 AT&T TECHNICAL JOURNAL journal 364161 30% 4% 22
10 AD HOC WORKFLOW authKW 212953 1% 50% 1

Web of Science journal categories



chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Computer Science, Hardware & Architecture 2246 31% 0% 23
2 Telecommunications 1926 43% 0% 32
3 Engineering, Electrical & Electronic 272 36% 0% 27
4 Linguistics 268 9% 0% 7
5 Education & Educational Research 109 9% 0% 7
6 Materials Science, Coatings & Films 58 7% 0% 5
7 Nuclear Science & Technology 48 8% 0% 6
8 Engineering, Manufacturing 35 4% 0% 3
9 Information Science & Library Science 19 3% 0% 2
10 Computer Science, Information Systems 13 4% 0% 3

Address terms



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 FUNCT TERMINAL CIRCUITS GRP 851814 3% 100% 2
2 DATA NETWORK EXPLORATORY DEV 425907 1% 100% 1
3 LOOP MAINTENANCE OPER PLANNING GRP 425907 1% 100% 1
4 MAINTENANCE SYST ENGN 425907 1% 100% 1
5 TESTING REQUIREMENTS GRP 425907 1% 100% 1
6 COMP SCI ELECT ENGN 155 1% 0% 1
7 ELECT MAT 127 1% 0% 1
8 ELECT 13 1% 0% 1

Journals



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 AT&T TECHNICAL JOURNAL 364161 30% 4% 22
2 AT&T BELL LABORATORIES TECHNICAL JOURNAL 118298 7% 6% 5
3 BELL SYSTEM TECHNICAL JOURNAL 65195 11% 2% 8
4 FOREIGN LANGUAGE ANNALS 15760 9% 1% 7
5 BELL LABORATORIES RECORD 15209 1% 4% 1
6 DATA MANAGEMENT 4894 1% 1% 1
7 IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY 2963 4% 0% 3
8 JOURNAL OF NETWORK AND SYSTEMS MANAGEMENT 1452 1% 0% 1
9 IEEE TRANSACTIONS ON NUCLEAR SCIENCE 902 8% 0% 6
10 SEMICONDUCTORS AND SEMIMETALS 805 1% 0% 1

Author Key Words



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 INFRARED FILM THICKNESS MONITOR 425907 1% 100% 1 Search INFRARED+FILM+THICKNESS+MONITOR Search INFRARED+FILM+THICKNESS+MONITOR
2 QUARTERWAVE 425907 1% 100% 1 Search QUARTERWAVE Search QUARTERWAVE
3 TELECOM SERVICE PROCESS 425907 1% 100% 1 Search TELECOM+SERVICE+PROCESS Search TELECOM+SERVICE+PROCESS
4 AD HOC WORKFLOW 212953 1% 50% 1 Search AD+HOC+WORKFLOW Search AD+HOC+WORKFLOW
5 OPTICAL THICKNESS MONITORING 212953 1% 50% 1 Search OPTICAL+THICKNESS+MONITORING Search OPTICAL+THICKNESS+MONITORING
6 COMPLEMENTARY METAL OXIDE SEMICONDUCTOR CMOS DEVICES 141968 1% 33% 1 Search COMPLEMENTARY+METAL+OXIDE+SEMICONDUCTOR+CMOS+DEVICES Search COMPLEMENTARY+METAL+OXIDE+SEMICONDUCTOR+CMOS+DEVICES
7 OPERATIONS SUPPORT SYSTEMS 106475 1% 25% 1 Search OPERATIONS+SUPPORT+SYSTEMS Search OPERATIONS+SUPPORT+SYSTEMS
8 MULTILAYER STACK 70983 1% 17% 1 Search MULTILAYER+STACK Search MULTILAYER+STACK
9 ECA RULES 14685 1% 3% 1 Search ECA+RULES Search ECA+RULES
10 MICROELECTRONICS PACKAGING 12525 1% 3% 1 Search MICROELECTRONICS+PACKAGING Search MICROELECTRONICS+PACKAGING

Core articles

The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1



rank cluster_id2 link
1 36004 AT&T TECHNICAL JOURNAL//AND INCREMENTAL DATA REPLICATIONS//COMMUNICATION ERROR RECOVERY
2 29379 FRAME SYNCHRONIZATION//BLIND RECOGNITION//BLIND FRAME SYNCHRONIZATION
3 32415 ADAPTIVE QUANTIZER//BIT PHASE SYNCHRONIZATION CIRCUIT//BIT REDUCTION
4 27230 AT&T TECHNICAL JOURNAL//BELL SYSTEM TECHNICAL JOURNAL//ACTIVITY INFORMATION
5 29557 72 BIT KEY//ABNORMAL MALICIOUS CODE//ABNORMAL NETWORK CONNECTION
6 29849 COMPLIANT INTERCONNECTS//DIE SHIFT//OFF CHIP
7 38875 CONDUCTING MOLECULE//CONJUGATED AROMATIC COMPOUND//ATOMIC RELAY
8 32735 KERAM KOMPONENTEN MA INENBAU//FLEX CRACK//MLCC SPECIALTY RD
9 24695 OPTOCOUPLER//ACTIVATION ENERGY OF RECOVERY//CMS OPTICAL LINKS
10 9815 JOURNAL OF CRYSTAL GROWTH//LOW EPD//VERTICAL GRADIENT FREEZE

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