Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 588 | 3 | X RAY OPTICS//X RAY MICROSCOPY//JOURNAL OF SYNCHROTRON RADIATION | 15045 |
| 1435 | 2 | X RAY MICROSCOPY//X RAY OPTICS//MULTILAYER MIRROR | 8135 |
| 11501 | 1 | SPECTROMICROSCOPY//PHOTOEMISSION MICROSCOPY//PEEM | 1004 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | SPECTROMICROSCOPY | authKW | 362712 | 3% | 33% | 35 |
| 2 | PHOTOEMISSION MICROSCOPY | authKW | 338994 | 2% | 60% | 18 |
| 3 | PEEM | authKW | 279459 | 3% | 28% | 32 |
| 4 | XPEEM | authKW | 246319 | 2% | 41% | 19 |
| 5 | EMISSION ELECTRON MICROSCOPE EEM | authKW | 188338 | 1% | 100% | 6 |
| 6 | ELECTRON MIRROR | authKW | 182627 | 1% | 73% | 8 |
| 7 | LEEM | authKW | 169645 | 2% | 27% | 20 |
| 8 | IST NEUROBIOL | address | 166615 | 2% | 28% | 19 |
| 9 | PHOTOELECTRON EMISSION MICROSCOPY | authKW | 145796 | 1% | 39% | 12 |
| 10 | EXPEEM | authKW | 125559 | 0% | 100% | 4 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Microscopy | 16753 | 14% | 0% | 140 |
| 2 | Physics, Applied | 2402 | 33% | 0% | 329 |
| 3 | Instruments & Instrumentation | 2331 | 16% | 0% | 158 |
| 4 | Spectroscopy | 2006 | 13% | 0% | 127 |
| 5 | Physics, Condensed Matter | 1068 | 19% | 0% | 187 |
| 6 | Nanoscience & Nanotechnology | 525 | 9% | 0% | 88 |
| 7 | Optics | 487 | 10% | 0% | 105 |
| 8 | Chemistry, Physical | 468 | 17% | 0% | 171 |
| 9 | Nuclear Science & Technology | 329 | 6% | 0% | 60 |
| 10 | Physics, Nuclear | 293 | 6% | 0% | 57 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | IST NEUROBIOL | 166615 | 2% | 28% | 19 |
| 2 | IRAMIS SPCSI LENSIS | 41852 | 0% | 67% | 2 |
| 3 | AG NANOSYNC | 31390 | 0% | 100% | 1 |
| 4 | BEAM TECHNOL GRP | 31390 | 0% | 100% | 1 |
| 5 | ELECT PROPERTIES IFF 6 | 31390 | 0% | 100% | 1 |
| 6 | FAK PHYS FMF | 31390 | 0% | 100% | 1 |
| 7 | FAKULTAT F PHYS NANOINTEGRAT CENIDE | 31390 | 0% | 100% | 1 |
| 8 | FB BIO CHEMIEINGN | 31390 | 0% | 100% | 1 |
| 9 | FB PHYS NANOINTEGRAT DUISBURG ESSEN CENIDE | 31390 | 0% | 100% | 1 |
| 10 | FESTKORPERFOR IFF 6 | 31390 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | ULTRAMICROSCOPY | 39761 | 8% | 1% | 85 |
| 2 | JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 24956 | 7% | 1% | 69 |
| 3 | SURFACE REVIEW AND LETTERS | 7166 | 2% | 1% | 25 |
| 4 | REVIEW OF SCIENTIFIC INSTRUMENTS | 5663 | 7% | 0% | 75 |
| 5 | ADVANCES IN IMAGING AND ELECTRON PHYSICS | 4055 | 1% | 2% | 7 |
| 6 | OPTIK | 2792 | 3% | 0% | 32 |
| 7 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2032 | 5% | 0% | 53 |
| 8 | SURFACE SCIENCE | 1799 | 4% | 0% | 40 |
| 9 | SURFACE AND INTERFACE ANALYSIS | 1634 | 2% | 0% | 19 |
| 10 | JOURNAL OF MICROSCOPY | 1085 | 1% | 0% | 10 |
Author Key Words |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | SPECTROMICROSCOPY | 362712 | 3% | 33% | 35 | Search SPECTROMICROSCOPY | Search SPECTROMICROSCOPY |
| 2 | PHOTOEMISSION MICROSCOPY | 338994 | 2% | 60% | 18 | Search PHOTOEMISSION+MICROSCOPY | Search PHOTOEMISSION+MICROSCOPY |
| 3 | PEEM | 279459 | 3% | 28% | 32 | Search PEEM | Search PEEM |
| 4 | XPEEM | 246319 | 2% | 41% | 19 | Search XPEEM | Search XPEEM |
| 5 | EMISSION ELECTRON MICROSCOPE EEM | 188338 | 1% | 100% | 6 | Search EMISSION+ELECTRON+MICROSCOPE+EEM | Search EMISSION+ELECTRON+MICROSCOPE+EEM |
| 6 | ELECTRON MIRROR | 182627 | 1% | 73% | 8 | Search ELECTRON+MIRROR | Search ELECTRON+MIRROR |
| 7 | LEEM | 169645 | 2% | 27% | 20 | Search LEEM | Search LEEM |
| 8 | PHOTOELECTRON EMISSION MICROSCOPY | 145796 | 1% | 39% | 12 | Search PHOTOELECTRON+EMISSION+MICROSCOPY | Search PHOTOELECTRON+EMISSION+MICROSCOPY |
| 9 | EXPEEM | 125559 | 0% | 100% | 4 | Search EXPEEM | Search EXPEEM |
| 10 | PHOTOEMISSION ELECTRON MICROSCOPY | 120929 | 2% | 23% | 17 | Search PHOTOEMISSION+ELECTRON+MICROSCOPY | Search PHOTOEMISSION+ELECTRON+MICROSCOPY |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |